USB Test
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Product
USB Isolators
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USB isolators protect the communication interface between the host, such as a PC, and its peripheral. Utilizing iCoupler® digital isolation technology, Analog Devices offers USB 2.0 compliant SOIC components with data rates up to 12 Mbps that provide EMC protection and safety isolation, reduce design size and time, and lower system cost. Galvanically isolated USB μModule® (micromodule) transceivers integrate the USB interface with an isolated dc-to-dc converter for up to 2.5 W of isolated power and provide ±15 kV ESD. Whether for host, hub, bus splitter, or peripheral device, these transparent USB digital isolators are easy to use—they just work—all while meeting the demanding standards required for medical and industrial applications.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
USB Sensor Hub
E1736A
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Small and light weight, the Keysight E1736A USB Sensor Hub gives users the ability to connect up to four sensors to a PC. Connection from the sensors to the sensor hub is made using interchangeable cables available in 5m, 10m, 15m, and 25m lengths. Connection is made via an easy to snap in connection.
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Product
Scienlab Battery Test System – Module Level
SL1001A Series
Test System
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
USB Audio/Video Codec
2253
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Simultaneous encode/decode in a robust, compact unit Uncompressed + compressed outputs from one video input Low preview latency H.264 HP@L3, MPEG-4 ASP, MJPEG video compression AAC, G.711 audio compression, uncompressed PCM Text overlay Two general-purpose digital I/Os Industrial temperature range version available Transport Stream
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Product
Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
USB Adapters
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DekTec's classic and iconic portable adapters for USB bus are well known tools in the industry. Some of them can be considered essential tools for every DTV engineer! DekTec is proud that it has won prestigious awards at NAB and IBC for several of its USB adapters.
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Product
USB JTAG controller
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The small, lightweight design means the XJLink2 can easily be moved to the Unit Under Test (UUT). Advanced features, like their programmable JTAG signal pin position, switchable power supply and auto signal skew, make it easy to connect to a wide range of circuit boards. Simple to install and use due to the USB plug-and-play ability.
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Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Industrial USB 3.0 Tester
M5615B
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International Microsystems Inc.
The M5615 tester is a 16 Socket Bench top Production and Engineering Tester that supports USB 3.0 Super Speed and USB 2.0 High Speed devices. The tester comes with a built-in PC running a full Linux operating system that tests and copies any USB storage device including USB Hard Drives at super speeds.
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Product
USB Interface
PK-232/USB
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The PK-232/USB brickwall filters have tighter bandwidth and steeper skirts for improved noise and QRM rejection. New PK-232 firmware (Ver. 7.2) allows a wider selection of filters than the original PK-232, so the filter can match the mode. The correct DSP filter is automatically selected when you choose an internal mode. In RTTY, Timewave’s proven Twin Peak Filters pluck the mark and space tones from the noise and QRM for great copy. In PACTOR, the filter bandwidth automatically changes when the baud rate shifts in response to the error rate of the link. In Morse (CW), the operator can preset either 100 Hz or 200 Hz bandwidth. The PK-232/USB is compatible with all Windows W2K,XP,Vista/Win7 software terminal programs for the PK-232.
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Product
USB Communications
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Campbell Scientific offers complete USB connectivity solutions for your data acquisition needs. Data loggers are available with integrated USB. We also provide various USB-to-serial converters to meet your needs.
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Product
Handheld, Modular, and USB Oscilloscopes
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Some tests require professional-level measurements in a more portable, stackable form factor. However, you shouldn’t have to compromise quality for size. Keysight’s USB Streamline Series — handheld and modular oscilloscopes — make high-end technology available wherever you need it, so you can always measure with confidence.
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Product
USB Picoammeter
9103
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Rugged, portable, affordable, and ASCII programmable, RBD's 9103 USB Picoammeter (ピコアンメータ) measures dual-polarity DC current from picoamps to milliamps. It can be biased with an optional built-in fixed +90V DC bias, or your own low-noise DC power supply.
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Product
USB Spectrum Analyzer
RSA306B
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The RSA306B USB spectrum analyzer might be small but it packs a big punch. It’s loaded with features you’d expect from spectrum analyzers twice the size and twice the price. Perfect for everyday tasks.
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Product
USB 32-Bit Whacker
PIC32MX795 Development Board
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The new version of the UBW32 now uses the PIC32MX795 IC. Based on the work of Brian Schmalz, the UBW32 is a small development board for the new PIC32MX795 32-bit CPU from Microchip. The UBW32 is breadboard friendly and includes all of the external circuitry needed to get the PIC32 up and running. Power can be provided over USB or from an external source. It has three push buttons (Reset, and two user-defined buttons) and five LEDs (Power, USB, and three user defined LEDs). All of the 78(!) of the PIC32's I/O pins are broken out. The board comes pre-loaded with a USB bootloader and special UBW firmware that accepts simple serial commands to control the various I/O functions.
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Product
USB 2.0 SmartCable For MIL-STD-1553 Test And Simulation
ASC1553
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The ASC1553 (AIM SmartCable) USB module offers full function test, simulation, monitoring and recording for MIL-STD-1553B applications implemented in an ultra compact form factor.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
