USB Test
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Ultra Portable SuperSpeed USB Analyzer
Advisor T3
Teledyne LeCroy’s Advisor T3 is an ultra portable SuperSpeed USB analyzer that delivers market leading accuracy at an extraordinary price. Designed to put precision USB protocol test tools in the hands of every engineer, the Advisor includes all the essential features for SuperSpeed USB debug.
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MIL-STD-1553 USB & LAN Test & Simulation Module
UXI-1553
Avionics Interface Technologies
Dual redundant, single, dual, or quad stream configurationsConcurrent BC, 31 RTs, and BM operations - Physical Bus ReplayFull error injection/detection capabilities - Programmable trigger and capture - Programmable Bus Coupling and Output Voltage Levels - Onboard IRIG-B time code encoder/decoder for Synchronization - Time Synchronization to IEEE 1588 via Ethernet LAN port - 10 Discrete I/O Interfaces (5 Outputs / 5 Inputs) - Operates from a single USB or Ethernet LAN connection - Supports SAE AS4112/4114 protocol testing requirements- Flight Simulyzer™ GUI Analyzer software
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EBIRST Slave Mode Connection Cable
93-970-301
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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USB Power Delivery and Type-C™ Tester & Analyzer
GRL-USB-PD-C2 (GRL-C2)
GRL-USB-PD-C2 (GRL-C2) is the only solution available that supports all compliance test specifications for USB Power Delivery 3.0 and USB Type-C Alternate Mode designs, and enables product developers to quickly run full compliance and validation test suites at the push of a button. GRL-C2 provides an automated, efficient, and fully-integrated way perform all required USB Power Delivery version 3.0 and 2.0 and related tests over the USB Type-C connector, as well as PHY test automation for USB Type-C Alternate Modes. GRL-C2 automates all required USB PD compliance tests for power providers (chargers), consumers, dual-role ports, and cable and adapter E-Markers; and is the only solution available that integrates Qualcomm Quick Charge 4+ and Intel Thunderbolt-specific test items. GRL-C2 also incorporates analyzer capability to sniff PD traffic. GRL-C2 integrates all required USB PD tests into a single 2-port tester, including all tests supported on GRL’s USB-IF approved first generation solution introduced in 2015. Each port can be configured independently as a PD Provider or Consumer. All other PD Protocol and Power tests are fully integrated, removing the need for external electronic loads.
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Battery Starting & Charging System Analyze
12-2415
*Shown with optional 12-2416 barcode scanner*Graphical Hand-Held Tester with Thermal Printer and USB Port*Tests 12V Flooded, AGM, Gel Cell, & EFB Batteries from 100 to 2000CCA*Graphical/Symbol Based LCD display*Tests 12/24V charging and electrical systems*Stores last 70 test series with or without power*Carrying case, printing software and USB cables included*Built-in thermal printer with thermal paper (611305)*Field-Replaceable Cables (900165)
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EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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EBIRST 96-pin SCSI Termination Fixture
93-016-103
93-016-103 eBIRST Termination Fixture is part of a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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EBIRST 23 X SMB Verification Fixture
93-011-101
The 93-011-101 23 x SMB Verification Fixture is an accessory for the eBIRST range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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ARINC 429 USB & LAN Test & Simulation Module
UXI-429
Avionics Interface Technologies
8 Channel (4Tx/4Rx) & 16 Channel (8 Tx/8 Rx) models available - Programmable Tx channel output amplitude - Programmable high/low speed operation - Concurrent operation of all Tx/Rx channels at high speed rates - Full error injection & detection - Rate-oriented label transmission - Label selective trigger for capture/filtering - Real-time recording & post analysis of multiple channels - Physical Bus Replay - Onboard IRIG-B time code encoder/decoder for Synchronization - Time Synchronization to IEEE 1588 via Ethernet LAN port - 10 Discrete I/O Interfaces (5 Outputs / 5 Inputs)
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Catena 1910 HSIC Tester
Catena 1910
The MCCI Catena 1910 HSIC USB Tester enables testing of HSIC Host or HSIC Device products. It can be used to exercise your product by operating as an active host or active device, while simultaneously capturing USB traffic for analysis. For test and validation of a final system, Passive Capture mode lets you debug and verify communication between your HSIC Host and HSIC Device,
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EBIRST 78-pin D-type Test Tool
93-006-001
The 93-006-001 eBIRST 78-pin D-type test tool is part of a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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EBIRST 50-pin D-type Test Tool
93-005-001
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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EBIRST 68-pin Male SCSI Termination Fixture
93-015-103
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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EBIRST 78-pin D-type Verification Fixture
93-006-101
The 93-006-101 78-pin D-type Verification Fixture is an accessory for the eBIRST range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces switching solutions. The tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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NI HIL and Real-Time Test Software Suite
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Explosive Test Site Range Instrumentation
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Infotainment Test for Automotive Applications
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Imperial Test Executive
ITE
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Scienlab Battery Test System — Cell Level
SL1002A
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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EVSE Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
