Surface Profiling
See Also: Surface Profile, Surface Profilers
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Portable Surface Roughness Tester Profilometer
SRG-2000
The PHASE II SRG-2000 surface roughness tester profilometer is a pocket-sized economically priced instrument for measuring surface roughness texture conforming to traceable standards. It can be used on the shop floor in any position, horizontal, vertical or anywhere in between.
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Non-contact Surface Texture And Contour Measuring Instruments
From sub-nano level surface roughness to milli level profile with 3D.Tokyo Seimitsu provides non-contact type surface roughness and contour measuring instruments with the confidence born out of many years cultivating know-how of surface roughness measurements.
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Battery Emulator And Profiler
E36731A
The Keysight E36731A battery emulator and profiler is an integrated electronic load and power supply developed to use with Keysight PathWave BenchVue battery emulation software. An emulated battery gives you a known good reference for testing at any charge level. Quickly assess the effect of design or software changes on battery life by emulating any battery charge state. Leverage emulation and precise current drain analysis to achieve longer battery life or to reduce the size of your device.
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Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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Portable Surface Roughness Tester Profilometer
SRG-4000
The latest in state-of-the-art surface roughness testers profilometer, the SRG-4000 is designed with the shop environment in mind. These surface roughness testers profilometer are distinguished by a high level of accuracy, multiple parameters and simplicity of operation. Extremely sensitive and highly accurate readings from this Phase II surface roughness tester are offered via multiple surface roughness profilometer parameters, Ra, Rq(Rms), Rt and Rz.
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Semiconductor Technology, Micro Scriber + Meters For Contact Angle And Surface Tension
SURFTENS WH 300
Optik Elektronik Gerätetechnik GmbH
The leading equipment for professional use in 200 and 300 mm wafer processing in semiconductor technology. SURFTENS WH 300 is equipped with a 3 axis wafer robot, wafer scanner, loadport for 200 and/or 300 mm wafers, fan filter unit, notching system. Suitable for any cleanroom class it features the automatic mapping of contact angles on wafers for up to 25 wafers.New: with SECS/GEM Interface!
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24" Drawer with Writing Surface, Unshielded, 8.75"H x 30"D
DR-082430-S
Unshielded drawers with writing surface are constructed of 20 ga. CRS and are furnished with ball bearing chassis slides to provide smooth operation. Available for 19" and 24" rackmount in 20", 24" and 30" depths, with or without a keylock
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Surface & Volume Resistivity Meter for Nonconductive Materials
Hiresta UX
The new Hiresta-UX is a high performance meter for measuring the surface and volume resistivity of a wide variety of nonconductive materials. With an extended measurement range of 103 ~ 1014Ω, this meter is ideal for Production, Engineering, R&D and Quality Control. The new Hiresta-UX features powerful new algorithms that automatically choose the right voltage, which optimizes the surface and volume resistivity testing. This versatile, high performance resistivity meter includes a built-in switch box that can be mated with a J-Box (meets JIS K 6911 for surface & volume resistivity and is compatible with ASTM D 257) as an option. The Hiresta-UX can store up to 2,000 measurement results, which can be easily exported to a USB memory device.
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Laser Surface Velocimeter
LSV-1000
The LSV-1000 represents Polytec?s new, compact velocimeter generation for non-contact length and speed measurement of continuous goods. The sensor provides length and velocity data fast, laser-precise and reliably for control and cut-to-length applications.
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CAT5-5E Ethernet cable, thin profile 2m
151733-02
8-Pin Male Ethernet to 8-Pin Male Ethernet, CAT-5E Ethernet Cable - The 8M-8M Ethernet Cable connects devices to network hubs or switches. The cable has straight-through wiring and is available in different lengths and thin profile options.
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K Thermocouple Surface Probe
TP745
Surface thermocouple Type “K” probe. Tolerance according to IEC 60584-2 standard.
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6U OpenVPX 16-Slot Profile BKP6-CEN16-11.2.2-3
1OVX616GX6-1X01R
VPX Dual Star central switches with expansion and control planes, channel Gbaud rate up to 6.25.
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Surface Resistivity Meter
STME-SRM
Statclean Technology (S) Pte Ltd
Effective for a quick measurement of Surface Resistivity on most surfaces.
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Laser Doppler Surface Velocity Meter
LV-7000 series
The LV-7000 series detects speed, uneven speed, distance, length of moving object or rotating object without contact. By contacting with 2 sensors, it enables to calculate difference in velocity/length between the two points in real time and output with 3,000 ppm of accuracy. The frequency response can be expanded up to 20 kHz, which achieves to understand phenomena and evaluate mechanical systems at high speed, efficiently, and accurately. It is useful for evaluation of motor control and behavior measurement, improving parts quality, and reducing loss of material.
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LC/MS/MS MRM Library For Phospholipid Profiling
This MRM library includes two methods: one for phospholipid classification by comprehensive analysis of the main phospholipids in biological samples, and one for fatty acid composition determination created using analytical results obtained with the classification method. The library targets phospholipids containing C14 to C22 fatty acids, and includes MRM transitions for up to 867 components. This library enables performing phospholipid profiling by conducting an initial analysis with a phospholipid classification method. This is followed by creating a method for fatty acid composition determination based on the phospholipid peak detected in the first analysis, and subsequently using this method to perform a second analysis to determine fatty acid composition.
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Surface Mount Switches
Dow-Key® Microwave offers PCB mounted, miniature electro-mechanical microwave switches. These switches are designed with an overall size of 0.75” x 0.75” x 0.58” and weight of 0.5 ounces for test and aerospace applications where small size, reduced weight, and less power consumption are critical.
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Surface & Volume Low Resistivity Meter for Conductive Materials
Loresta GP
The Loresta GX Meter is an intelligent, multi purpose low resistivity meter equipped with software that calculates resistivity correction factors. A variety of 4 pin probes are available for use with the Loresta GX. The instrument is typically used in Product Engineering, R&D, and Quality Control. Applications include measurement of conductive paint, conductive plastics, conductive rubber, conductive film, silicon wafers, antistatic materials, EMI shield materials, conductive fiber, conductive ceramics, etc.
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USB Power Sensor - 100 MHz to 20 GHz, Average, Peak (Pulse), Pulse Profile
GT-8555B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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Non-Destructive Subsurface Layer Profiling
NMR-Mouse one-sided NMR
The unique, powerful Profile NMR-MOUSE® probe works hand-in-hand with the Kea2 spectrometer. The Profile NMR-MOUSE is a portable, open NMR sensor equipped with a novel permanent magnet geometry that generates a flat sensitive volume parallel to the scanner surface. The system can measure *Proton density as a function of depth *T2 NMR relaxation times *T1 NMR relaxation times *Self-Diffusion coefficient of liquids
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SERS (Surface Enhanced Raman Scattering) Substrate & SERS Reader – Mini Chemistry Analytic Pack
The porous carbon SERS substrate provides not only high signal enhancement due to its strong broadband charge-transfer resonance for large chemical enhancement (as opposed to electromagnetic enhancement in traditional metal-based SERS substrates), but also extraordinarily high reproducibility or substrate-to-substrate, spot-to-spot, sample-to-sample, and time-to-time consistency in SERS spectrum (which is not possible with traditional metal-based SERS) due to the absence of "electromagnetic hot spots" by making the entire surface of the substrate "chemically hot", high durability due to no oxidization, and high compatibility to biomolecules due to its fluorescence quenching capability.
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3U OpenVPX 9 Slot Variant to Profile BKP3-CEN09-15.2.17X-3
1OVX309KY6-1X11R
Hierarchical star, no expansion plane| control plane, 3U, 9 Slots.
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Contour And Surface Measuring Machines
The contour and surface measuring machines from ZEISS offer different, sometimes combinable sensors for roughness measurements, contour measurements or both. The contact-free linear drive makes these machines highly efficient and low-maintenance.
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3U OpenVPX 5 Slot Profile BKP3-DIS05-15.3.2-1
1OVX305DX1-1X11R
Distributed mesh, 3 x optical/RF on expansion plane, no control plane.
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3D Sensor (Shiny Surfaces)
reflectCONTROL
reflectCONTROL is designed specifically to meet the high quality requirements that ensure high quality for shiny surfaces. The system based on deflectometry projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern which are recorded by cameras and evaluated by software.
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Surface Mount-to-DIP JEDEC SOT-25, SOT-23A-6 Adaptor
1110748
Surface Mount to DIP Adapter for SOT-25, SOT-23A-6. Allows for breadboarding or substitution of microgate SOT-23A-6 and SOT-25 IC and transistor packages into .100 [2.54] pitch proto boards or PC boards. Solder masked top-side pads allow user to hand solder devices directly to topside of adapter with fewer problems of solder bridging. Longer male bottom pins are available at special request for easy use of probe clips. Large topside pads allow for soldering test pins, jumpers, etc. to top of adapter.
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19" Drawer with Writing Surface, Unshielded, 10.5"H x 24"D
DR-101924-S
Unshielded drawers with writing surface are constructed of 20 ga. CRS and are furnished with ball bearing chassis slides to provide smooth operation. Available for 19" and 24" rackmount in 20", 24" and 30" depths, with or without a keylock
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Meters for Contact Angle and Surface Tension
SURFTENS UNIVERSAL
Optik Elektronik Gerätetechnik GmbH
Robust measuring device for contact angle, SFE and surface tension with numerous equipment variants such as motorized dosing systems, multiple dosing systems and tilting device.
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Surface Water Absorption Tester
TF167
TESTEX Testing Equipment Systems Ltd.
Specimens are placed at an angle on the base of the apparatus. After water flows down the surface of each specimen, the amount of water retained by each specimen is measured. Six specimens are tested, three on the face of the fabric and three on the back of the fabric. The six observations are averaged to determine the surface water absorption of the fabric.
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Inclined Surface Coefficient Of Friction
DRK138
Shandong Drick Instruments Co., Ltd.
DRK138 Inclined Surface Coefficient Of Friction Tester is applied to testing the COF of film, paper, card board, sheet and so on. By testing the material’s frictional properties, the open performance of packages, packaging speed of packers and other indexes could be controlled to meet the requirements for production
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Elcometer Surface Comparators
125
Using the Elcometer 125 surface comparators as a reference the blasted profile can be compared to the four reference profile grades in each comparator. Profiles are recorded in microns.
