Incircuit
See Also: In-circuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
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Incircuit and Functional Test Systems
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REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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Digital Incircuit Test
PFL780/760
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The PFL780 and 760 use IC clips as a test interface. This makes them ideal for the service and maintenance of legacy systems. If you need to work on high density surface mount PCBs you should consider the GRS500 as a more suitable alternative.
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Analog In-Circuit Tester
406C
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The 406C is an open architecture power up test platform designed to facilitate the implementation of functional testing after the MDA test is completed. Internally dubbed as "Armadillo" the new architecture provides the user almost unlimited flexibility by combining the best of the VME buss and a dedicated ICT buss.
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In-Circuit Test Fixture Design Services
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XJTAG offers consultancy services to design and build production test fixtures that integrate JTAG boundary scan with bed-of-nails testing.
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Fastest In-Circuit Test Platform
TestStation
Test Platform
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Test Handler
ETH
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The ENGMATEC test handler as the "heart" of our inline test solutions impresses with its wide range of applications for in-circuit, functional or final tests. All components of the modular system are coordinated with one another and can be combined with one another and with various production systems. Vision systems, scanners, marking devices and many other functions can be integrated.
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In-Circuit Test System Rentals
Test System
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Product
Active Differential Probe, 100 kHz to 12 GHz
U1818B
High Frequency Probe
The Keysight U1818B 100 kHz to 12 GHz active differential probe makes it easy to perform high frequency in-circuit measurements using network, spectrum and signal source analyzers. With flat frequency response, low noise floor, and direct power from instrument connection, the U1818B allows measurements to be made while taking full advantage of Keysight's RF analyzers dynamic range.
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Power Architecture 5xx/8xx In-Circuit Debugger
ICDPPCZ
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P&E's ICDPPC for Windows is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources. The ICDPPCZ software works with Freescale's MPC5xx/8xx devices.
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2-228X (Small IF) / 230540
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
In-Circuit Programmer/Loader
SKU-018-01
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The In-Circuit Programmer/Loader (“EasyLoader” or “eLoader”) is a standalone device that was designed to provide a flexible and cost-effective solution for electronic device manufacturers, as well as for hardware design companies and their customers. It allows you to upgrade code on any JTAG/SPI/I2C compliant device (like FPGA/CPLD/EEprom/Flash, etc.) or Microcontrollers at any time of development, testing or production.
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New Generation Vacuum Box for the 3070 Test Platform
Vortex Series
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The Vortex Series is a new generation vacuum box for the 3070 test platform that will easily revolutionize in-circuit test. The simplified and streamlined design allows for maximizing the usable testable board size of the Vortex 100 Performance Grade fixture. The rugged all aluminum design maximizes the opening angle of 85° ideal for Cobot usage, while eliminating the top plate and associated hardware and retaining our classic quick plate guided probe technology.
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Digital In-Circuit tester
MTS180/300
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Analog in-circuit inspection and function inspection are realized on this inspection equipment. IC pin float function is standard equipment. The MTS180 is a press type jig, and the MTS300 is a vacuum type jig. In the board mounting process at the production site, electrical inspection is performed on the mounted board after component mounting, and non-defective or defective products are automatically judged. The main inspection contents are short / open inspection, analog inspection of resistors, capacitors, coils, diodes, etc., lead floating voltage measurement of QFP and BGA, Digital IC inspection, frequency measurement.
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In-Circuit Testing
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If you are looking for in-circuit test applications, equipment or advice, our experienced engineers can help you. Whatever your fixturing requirements or special software features, our long history of work in this field means that we have probably seen and done it before.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
TAP Signal Isolation Module
JT 2139
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The JT 2139 is a TAP signal isolation module designed for use in combinational test systems that utilise multiple instrument interfaces. To avoid parasitic capacitance effects and/or unwanted ground loops the JT 2139 can be used to completely galvanically isolate any JTAG Technologies boundary-scan controller from the remainder of the instrumentation system. JT 2139 isolators are a standard component of the JTAG Technologies ‘Symphony’ systems that integrate boundary-scan with In-Circuits Testers etc..
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In-Circuit Testing and Test Engineering
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5184 Test NodesHPUX or Windows60 Mhz ASRU Frequency Counter, Timer10 Mhz Clock, 6 Mhz data ratesVector Test for VLSI, PLCC & ASICSTestjet and VTEP Vectorless TestingAdvanced Boundary ScanSilicon Nails AvailableSeries V upgradeable
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Offline In-Circuit Test Solutions
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TestStation’s offline test systems are designed for a human operator or collaborative robot for product handling. TestStation systems scale to support from 128 to 15,000 test points. Our newest Multi-Site systems double productivity per system, reducing Capex and Opex for manufacturers.
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Product
USB Male A to Male Mini B Cable (length 12″)
SKU-043-07
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12″ inch Male-A to Male-B mini USB cable. Use this cable to connect In-Circuit Programmer/Loader to your host PC.
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Product
Design for Test Service
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Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Turn-Key Functional / Mechanical Fixture
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In addition to In-circuit testing, functional testing is widely used in the industry to verify electronic cards. This is why ReMaTek has always paid a special attention to the specific requirements of functional testing. Our dedicated engineering staff is prepared to handle all of your mechanical, electrical and software requirements. We are aiming particularly the small turn-key test systems where all the elements; the mechanical fixture, the test equipment and the test software, are put together in a complete system.
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Test Fixture Adapters for In-Circuit Test Fixtures
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Circuit Check test fixture adapters are utilized when the target ICT tester is not available or has been replaced with a newer technology tester. The tester adapter will often allow existing test fixtures from one test manufacturer to be utilized on another manufacturer test platform, eliminating the need for replacement fixtures. Contact Circuit Check to discuss your tester and fixture combinations for the best choice of a cost effective solution.
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TestStation Multi-Site Inline
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TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
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Product
68HC(S)12 In-Circuit Debugger
ICD12Z
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P&E's ICD12Z for Windows is a powerful tool for debugging code. It uses the HC(S)12 processor's background debug mode (BDM), via one of P&E's hardware interfaces, to give the user access to all on-chip resources.
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In-Circuit Fixtures
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In-Circuit test fixtures can be configured for dual stage, dual well and opens testing applications. Even the most complex boards can be accommodated using standard methods of actuation.
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Desktop PCB Test System
BOARDWALKER 9627
Test System
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Actuation Methods for In-Circuit Test Fixtures
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Commonly referred to as In-Circuit Test (ICT), loaded board test can be defined as the task of measuring values of components that have been installed on a printed circuit board (PCB). A second basic category of loaded board test measures simple open and shorts on the board to verify manufacturability standards. Circuit Check supports all forms of in-circuit test strategies with its Performance Grade and Value Line test fixtures.
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Product
In-Circuit Debugger for RS08 Family of Microcontrollers
ICDRS08
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P&E's ICDRS08 is a powerful tool for debugging code. It uses the processor's background debug mode Module(BDM), via any of P&E's RS08 compatible interfaces (see product add-ons for more information), to give the user access to all on-chip resources.
