Static Analysis
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Product
Battery Analysis Software
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Battery characteristics vary over time and depend very much on maintenance and the environmental conditions of the specific application. Each installation tends to have its own 'fingerprint'. Capturing and managing this critical operational data has always presented a challenge to facilities managers. Recording and analysing data using traditional pencil and paper methods is both time consuming and prone to error.
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Product
Optical Communication Analysis
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In lab and manufacturing environments, R&D engineers require scalable and optimized test solutions to enable them to properly characterize new advanced modulation scheme signals for next-generation, ultra-high-speed telecom networks. Through EXFO’s optical communication analyzers, R&D engineers and manufacturing operations involved in the development or production of transmitters or systems based on new high-speed technology will find the right tools for their advanced technology needs.
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Product
Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Product
Testability Analysis
TurboCheck
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TurboScan is an advanced full-scan and partial-scan test suite. It includes a Scan Synthesizer and an Automatic Test Pattern Generator (ATPG). TurboScan automatically repairs testability violations to make your design highly testable.
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Product
Software for Configuration, Logging and Analysis
LMG-CONTROL
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ZES ZIMMER Electronic Systems GmbH
Real-time display of configuration and measuring valuesTransfer of up to 3000 measuring values per secondTimestamps with a resolution of 1 millisecondVersatile analysis of sampling valuesExport of measuring values to other applications
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Product
Data Analysis Software
QUICK LOG
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Adopt the leading interactive interface in industry· Fast parameter set and graphic operation interface· Automatically recognize connected instrument, more vivid· Unique auto mode provides immediate report once connected· Support high and low limit alarms statistics· Upport unchangeable report file in PDF format
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Product
Portable Static Grounding Kit
Grounding Kit
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The portable grounding kit combines multiple shortened grounding rods with surface wire grounding techniques to provide acceptably low resistance for static grounding requirements in field operations.
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Product
Failure and Technology Analysis
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Failure analyses in order to clarify the failure cause soonest possible.From single device to the whole system - and from highly complex IC up to printed circuit board (PCB), mounting & interconnection technology and printed board assembly (PBA).
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Product
Material Analysis Laboratory
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Trialon’s world class Material Analysis Laboratory consists of state-of-the-art equipment and experienced staff. Our specialty is to determine failure analysis of design, material, process and root cause in both current and future products across multiple industries.
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Product
Surface Analysis
Dimension AFP
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The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Product
Failure Analysis
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Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.
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Product
Pitot Static Test & RVSM Air Data Accs Kits
ADA320-723
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Kit Model ADA320-723 (Bar type) contains the equipment required to connect the Air Data Tester to the pitot and static ports, for the performance of a complete test of the main and alternate Air Data System of the Airbus Industries A-319, A-320, A-321 aircraft. The equipment is approved by Airbus Industries.
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Product
Advanced Antenna Acquisition & Analysis
SW-A4
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Introducing Advanced Antenna Acquisition and Analysis (A4), the newest antenna measurement software from NSI-MI, expertly engineered for data collection, analysis, automation, and plotting. A4 builds upon the decades of experience and optimization built into NSI-MI’s legacy software platforms, NSI2000 and MI-3000, while adding modern features and capabilities that meet the challenges of today. A4 seamlessly blends the user-friendly interface of NSI2000 with the performance and versatility of MI-3000. Its intuitive design and powerful Application Programming Interface (API) deliver the adaptability needed to handle even the most challenging measurement tasks. A4 offers multicore, multithreaded support to greatly improve processing time while adding the ability to parallelize analysis and transformation tasks. Choose the perfect solution with NSI-MI's four software tiers, each packed with tailored features to match your specific requirements. Let NSI-MI help you choose the ideal package to fully unlock the potential of your antenna measurement range.
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Product
Static Meters
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ETS static meters are offer accurate detection and measurement of static electricity found in the manufacture and handling of electronic, paper, plastic, textile, food, chemical, biomedical, and pharmaceutical products. In addition, these meters are invaluable for use in computer rooms, cleanrooms, hazardous environments, hospitals, and other locations that require the measurement of electrostatic fields. Chopper-stabilized models enable measurements in ionized environments.
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Product
The DC System Analysis Module
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Save time with intuitive scenario manager interface.• Communicate designs effectively with graphical and text base results.• Improve decisions by quickly comparing resulting curves from different scenarios.• Increase productivity by modeling both DC and AC systems in a single project.• Reduce mistakes by evaluating all loading conditions and duty cycle loads.
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Product
Enhanced Time Domain Analysis With TDR
S93011B
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S93011B enhanced time domain with TDR is available on all PNA models (N52xxB) and provides a one-box solution for high-speed interconnect analysis, including impedance, S-parameters, and eye-diagrams
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Product
Benchmark, Competitive and Failure Analysis
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Helping you determine the root cause of product failures and evaluate products against industry competition and standards.We provide third-party verification and support for claims related to performance versus competition, root product failure cause, and benchmark industry performance. As an independent laboratory with over 60 years of product testing experience, our expertise helps you evaluate products for a variety of performance related characteristics. Additionally, we can provide expert witness legal testimony for insurance claims, CPSC filings, and civil/criminal court cases through our testing results and data.
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Product
Sensor Scene Modeling and Analysis Software
INSSITE
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INSSITE is a sensor scene modeling and analysis environment. Different sensor types and modalities, spanning radar (synthetic aperture radar [SAR], ground moving target indicator [GMTI], detection and ranging, radio frequency [RF] communications), visible/infrared (passive electro-optical/infrared [EO/IR], laser radar [ladar], thermal IR), can be evaluated against high fidelity scenarios constructed by the user.
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Product
Mainframe Performance Monitoring & Analysis
Strobe
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Compuware Strobe is the industry-leading application performance monitoring and analysis solution for mainframe applications. With Strobe, IT departments can pinpoint application inefficiencies that cause excessive CPU consumption and reduce hardware and software costs while increasing customer satisfaction.
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Spectrum Analysis For P50xxB Up To 44 GHz
S970907B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
X-ray Diffraction and Elemental Analysis
N8 HORIZON
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The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
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Enhanced Time Domain Analysis With TDR
S97011B
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This application enables the analyzer to perform enhanced time domain analysis for high-speed data applications.
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Product
Packet Analysis Probe for PCI Express
N4220A/B
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When purchased with a logic analyzer, the application software you order is installed on the instrument hard drive. If you need to add application support after your initial logic analyzer purchase or are controlling a logic analyzer from a host PC, you must install the appropriate software before you can make measurements.
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Product
Static Measurement
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Fraser Anti-Static Techniques Ltd
Accurate and versatile static measurement tools to investigate, monitor and maintain safety and productivity.
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Analog Waveform Development and Analysis Software
WaveEasy
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WaveEasy is an interactive analog waveform editor software tool for creating and editing analog waveforms. To view or edit existing waveforms, you can open or save files using various file formats including WaveEasy, ASCII or text (txt, csv, prn), or the NI-HWS (hws) format which is used by many instrument drivers.
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Product
Complete Power Quality Analysis System
PK4564-PRO
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This system contains the all recommended equipment for almost any power quality study in the world. Other tiers in the PK4564 class include the base PK4564 and PK4564-PRO+ systems.
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Electronics Failure Analysis System
Sentris
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Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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Time-Frequency Analysis, Time-Series Analysis and Wavelets
LabVIEW Advanced Signal Processing Toolkit
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Includes the LabVIEW Digital Filter Design Toolkit (also available separately)Time-series analysis -- statistical analysis for description, explanation, prediction, and controlTime-frequency analysis -- analytical, graphical tools for signals with evolving frequency contentWavelet and filter-bank design for short-duration signal characterization, noise reduction, and detrendingIncluded in all NI Software Suites
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Embedded Analysis Software for the 2000 X-Series
D2000GENB
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Test and debug I²C, SPI, RS232/422/485/UART designs with triggering, decoding, and pass / fail mask limit testing.
