Electron Microscopes
scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale.
See Also: Transmission Electron Microscopes
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Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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End Face Inspection Microscopes
D SCOPE EFI – D SCOPE EFI-C – D SCOPE EFI-C LWD
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The new D Scope EFI for MTP/MPO and multifibers field connectors is a cost effective microscope for inspecting fiber optic patchcords and cassettes.
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NanoFluorescence Microscope
NFM
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The NFM is a specialized optical microscope system custom-designed for imaging individual single-walled carbon nanotubes (SWCNTs) through their intrinsic short-wave infrared fluorescence. It is ideal for SWCNT studies in physics, chemistry, biomedicine, and environmental research. The NFM is the new, more affordable replacement for our pioneering NM1 Fluorescence Microscope.
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Printed Electronics & Printed Sensors
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The first membrane switch was developed and produced in 1978 using printed electronics. Conductive pastes can now also be printed on substrates such as paper, textiles, or metal in addition to polyester. Our functional foils and printed electronics enable compact, and extremely efficient electronic products that are used in every industry. Processing intelligent pastes that have various physical properties enable the production of new and innovative applications in minimized form factors without the use of additional, highly complex electronic components.
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OEM Microscope Components for Integration
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The performance of your microscope optics directly affects the final quality of your products. Olympus OEM components seamlessly integrate into large systems to provide the exceptional optical quality you need to deliver a high-quality final product.
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150~300W DC Electronic Loads
JT631 Series
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Nanjing Jartul Electronic Co., Ltd
JT631 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT631 series load very suitable for testing power supply when produced in large quantity. Besides, JT631 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT631 series load satisfing most of R&D requirements. Moreover, JT631 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
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Test system for Electronic Device
PCB
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The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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ELECTRONIC CIRCUIT TRACER
PPECT3000
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*Locate short and open circuits without having to remove plastic panels, molding and carpet*Traces shorts and open wires with visual navigation and sound indicators*Pinpoint shorts, open circuits, switches and breaks in wires
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Surgical Microscopes
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The surgical microscopes of Leica Microsystems are exactly geared to the requirements of microsurgery. A compact optical unit delivers clear and sharply focused images and the modular system gives the surgeon optimum maneuverability.
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Indicators - Electronic
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An electronic device used to read an input value from a measuring device and show a displayed value.
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Microscope Automation
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Prior Scientific is the world leader in microscope automation, microscope automated precision components and customized sub-assemblies. We offer a wide range of off-the-shelf components such as XY motorized stages, Z focus motors and translation stages, high-resolution microscope stage controllers and robotic slide loaders as well as high-intensity bright field and fluorescence illumination sources.
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PXI Electronic Load Module
Load Module
PXI Electronic Load Module provides the electronic load capabilities of sinking DC power with high-accuracy measurements in a compact form factor optimized for design validation, characterization, and production test.
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Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Power Electronic Boards Tester
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Power electronic boards play a vital role in transforming and delivering power to electronic devices. Every board component’s failure can represent a huge cost, often interrupting essential services such as electricity and telecommunications.While power electronic boards vary in complexity and size, they typically all include power devices such as inverters, power supplies, power drivers, or frequency converters combined with different technologies (digital boards, power boards, displays, …) that are often called to work in tough environments for many years.Testing power electronic boards has become indispensable to ensure the performance of the power components that often dictate the efficiency, safety, and reliability of the entire final product.
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Precision Electronic Test Leads
34133A
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The Keysight 34133A precision electronic test leads are designed specifically for working with small components and dense circuit boards. Each kit includes two test leads (one red and one black).
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Electronic Production Measuring & Testing Instruments
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Wuhan Fanke Transformer Manufacture Co., LTD
Electronic Production Measuring & Testing Instruments
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Electronic Component Testing Services
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New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
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Electronic Crockmeter
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TESTEX Testing Equipment Systems Ltd.
Electronic Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. A pinned acrylic sample holder ensures rapid sample mounting and repeatability of results. Crockmeter Fitted with a pre-determined electronic counter for strokes up to 999,999 times.
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Scanning Electro-chemical Microscope
920D
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The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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DC Electronic Load
3310G Series（75W~400W）
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Each 3310G Series module has its own control and display panel, CC / CR / CV / CP / Dynamic modes, plug in 3302G / 3305G / 3300G mainframe with 150 sets Store / Recall memory which provides load set-up more efficiently, also can be controlled via RS232、Ethernet、USB and GPIB interface.
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Electron Backscatter Diffraction (EBSD) Camera
Velocity™
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high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
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Electronic Loads
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AMETEK Programmable Power, Inc.
Electronic loads have found a variety of applications ranging from power converter testing to current modulation. A large range of power sources can be tested using an electronic load from converters, inverters and UPSs to electrochemical sources such as batteries and fuel cells.
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Simulation Tools for Analog and Power Electronics
SIMetrix
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Complete mixed-mode simulation package providing high performance, ease of use and superior analog convergence.
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Electronic AC Potential Standard
PMT25010
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Power Measurement Technologies Inc.
Provides the electronic equivalent of a standard potential transformer as typically required for instrumentation potential transformer accuracy testing.
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Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Scanning Probe Microscopes
SpectraView 2500
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* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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Multimeter Electronic Test Leads Kit
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VERSATILE KIT includes 2 alligator clips with removable insulation, 2 extended range plunger mini-hooks with pass-through banana plugs, 2 heavy duty test probes, 2 42” lead extensionsUNIVERSALLY COMPATIBLE with either 0.16” banana plugs or shrouded banana plugs on all ends
