Flash Device
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Flash Storage Device
Axiomtek provides various industrial-grade flash storage device for customers to simplify and shorten the system design time.
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Universal Automated Programming System
4900
The 4900 is powered by the newest BPM 9th generation technology, which delivers the fastest programming speeds in the industry for MCU’s, eMMC HS400, NAND, NOR and Serial Flash devices. BPM 9th generation technology produces 200 MHz signals, allowing each byte of data to transfer in up to 2.5 ns. Up to 9 times faster than competing programmers. 3D Vision option inspects BGA, CSP, QFP, TSOP, SOIC and J-Lead devices for coplanarity, bent lead, pitch, width, diameter, standoff and XY errors.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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High Speed Pick and Place Handler
Commander 2000
At throughput rates in excess of 2000 Units per Hour the HT Commander 2000 system provides unparalleled performance for the production handling and programming of flash memory devices or modules.
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PLD ISP Feature, GTE 10.00p
K8220A
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Flash ISP Feature, GTE 10.00p
K8219A
The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
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Debug probe for ARM Cortex processors
USB Multilink ACP
P&E’s USB Multilink ACP is a debug probe which allows a PC/laptop access to JTAG/SWD on ARM Cortex devices from several manufacturers (see complete list below). It connects between a USB port on a Windows machine and the standard debug connector on the target. The product photos to the left of this page show how the headers can be accessed by simply flipping open the plastic case. Ribbon cables suitable for a variety of architectures are included. By using the USB Multilink ACP, the user can take advantage of the debug mode to halt normal processor execution and use a PC to control the processor. The user can then directly control the target’s execution, read/write registers and memory values, debug code on the processor, and program internal or external FLASH memory devices.
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FPGA-Based Ultra-Fast Flash Programmer
XJFlash
XJFlash is an FPGA-based advanced and innovative method that uses JTAG for high-speed in-system programming (ISP) of flash memories – all serial and parallel flash devices are supported. The most common use of XJFlash is programming the SPI/QSPI NOR flash used to configure an FPGA.
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Location Devices
Flash Pinger is a small battery powered acoustic transmitter as well as an optical flashing recovery device. Multiple settings allow for selection of flashing, timing, and frequency options for use in a variety of different applications.
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Flash ISP Feature, GTE 10.00p
K8219B
The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
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JTAG USB Controller
NetUSB-1149.1/E
The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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PLD ISP Feature, GTE 10.00p
K8220B
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Flash In Card
FIC Series
Axiomtek's FIC (Flash in Card) series complies with CompactFlash™ specification and provides complete PCMCIA-ATA functionality and compatibility. This CF card is available in memory capacities ranging from 128MB up to 32GB in standard & industrial temperature to meet the demand of critical application. The operating temperature supports standard temperature grade (0°C ~+70°C) and industrial temperature grade (-40°C ~+85°C). The FIC series is an ideal solution for industrial storage application requiring reliability, high performance, and low power consumption.
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Light/Laser Flash Analyzers
Light or laser flash is a measurement technique used to determine the thermal diffusivity, thermal conductivity, and specific heat capacity of materials. Light flash measurements are essential for characterizing the heat transfer and storage properties of a variety of materials, whether the sample of interest is expected to insulate, conduct, or simply withstand temperature changes.
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Flash Point Tester
Weshine Electric Manufacturing Co., Ltd
Closed flash point tester, when the test sample is used in a closed environment (such as transformer oil), to determine the closed flash point value of petroleum products. Use touch screen instead of keyboard operation, adopt foreign advanced technology, large LCD screen LCD full Chinese display man-machine dialogue interface, full screen touch key prompt input, convenient and fast, open, fuzzy control integrated software, modular structure, in line with national standards, the United States, EU and other standards.
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Flash In Module
FIM Series
Axiomtek's FIM (Flash in Module) series is designed into ATA protocol type with compatible IDE standard interface based on flash memory technology. This flash module is offered with various capacities ranging from 128MB up to 4GB and can operate under industrial temperature range goes from -40°C~85°C in the harsh operating environments. The features of reliability, high performance, cost-effective and easy-to-integrate designs make FIM series a perfect solution over traditional storage devices.
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Flash Meters
SF 100
Flash meters for measurement of illuminance time response of rapid changing light sources (flashes, rotating beacons).
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LED Flash Drivers
Analog Devices LED flash drivers support general LED lighting, building technology, scanning equipment, and a range of other technologies. A range of features, such as automatic phototransistor controls and overtemperature protection, as well as compact size and diverse programmability options, allow these devices to be used in a number of applications including:
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Universal Flash Storage
UFS
Universal Flash Storage (UFS) is a JEDEC standard for high performance mobile storage devices suitable for next generation data storage. The UFS is also adopted by MIPI as a data transfer standard designed for mobile systems. Most UFS applications require large storage capacity for data and boot code. Applications include mobile phones, tablets, DSC, PMP, MP3, and other applications requiring mass storage, boot storage, XiP or external cards. The UFS standard is a simple, but high-performance, serial interface that efficiently moves data between a host processor and mass storage devices. USF transfers follow the SCSI model, but with a subset of SCSI commands.The Arasan UFS IP family consists of Host controller IP, Device controller IP, and MPHY.
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Integration of Flash / Controller Programming
Flash or microcontroller programming can be integrated in a wide variety of ways, depending on the type and scope of the application.
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Arc Flash Analysis
ETAP Arc Flash Analysis allows you to identify and analyze high risk arc flash areas in your electrical system, and it also allows simulation of several different methods used by engineers to mitigate high incident energy.
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Control Devices
National Meter Industries Inc.
4-input impulse centralising equipment. Inputsare optoisolated to read impulses and it has a 32-bit memory to store the valuesmetered.
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Imaging Devices
High quality imaging devices with double or simple telecentric objectives offering exceptional spatial resolution with high FOV. Dedicated to high quality measurements whatever your display size.
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Measuring Device
CAN-Bus Tester 2
The CAN-Bus Tester 2 is a widely used measuring device for control of bus parameters. The success story starts already in year 2002 with the first model. The hardware was completely redesigned in version 2. The corresponding software is still developed and has been enhanced with extensive updates.
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Power Devices
Our power portfolio provides a wide range of low-voltage to high-voltage components featuring our advanced process and packaging technologies. These solutions meet the demands of today's most complex power system designs across the infrastructure, mobile, industrial, automotive and aerospace markets.
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Oscilloscope Device
Oscilloscope Devices are flexible, software‐defined instruments that are versatile enough for both time‐ and frequency‐domain measurements and are offered in industry-standard form factors like PCI and USB. They feature up to eight channels that can sample at speeds up to 2 GS/s. The devices also feature numerous triggering modes, deep onboard memory, and driver software API that includes data streaming and analysis functions.





























