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Product
Electrical Test System TY-CHECKER
Type E Series
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High-speed, high-precision testers offered with a broad lineup, matching a range of test point numbers. Can be used alone and on our press systems.
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Product
CAM/TRAC Test Kits
Series 43
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The GR Series 43 CAM/TRAC®1 kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 43 provides interface compatibility by using a 12 position, GR2270 style I/O block interface. This interface accepts the industry standard I/O, power, and coax blocks.
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Product
Cable and Harness Tester
CHT
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The Cable and Harness Tester (CHT) provides multiple testing capabilities for up to 300 connector/harness test points. Test capabilities include DC Insulation Resistance (IR), DC and AC Dielectric Withstanding Voltage (DWV), and 2-Wire and 4-Wire Continuity.
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Product
4x IDC to 192 Pin Quadrapaddle
YAV90Q04
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The interface YAV90Q04 permits to connect two YAV90096 boards to one 192-Signal contacts Quadrapaddle module. As the Mini-D 50 connectors let 2 free pins (1 and 26), these pins are interconnected to a test point, with the possibility of be grounded. Cable P/N J6200540: Mini-D-50 to Mini-D-50 IDC connectors with 400 mm flat cable.
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Product
SWB-2833, 4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-33
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4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2833 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Test Sets For Transformer Industries
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Contemporary Test Sets For Transformer Industries are developed to recognize the potentially disastrous current transformer errors. They prevent the primary current from overpowering insulation and short circuits. They are used for developing a testing and maintenance plan for addressing the errors before any failure to save money and time. With these powerful test sets, they are sure to perform saturation testing to test the knee point of a signal by comparing primary and secondary windings.
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Product
SWB-2816, 8x46, 0.3 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-16
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8x46, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2816 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Phasing Meters
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A unique tool in that it may be used as a conventional phasing meter, or the meter probe may be used as a stand-alone voltage detector on primary or secondary voltages or capacitive test points.
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Product
Testability analysis
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Using TestWay, ASTER provides advanced Testability report, Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test. Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
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Product
Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
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Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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Product
Other Passive Probes
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Probes connect the input of the oscilloscope to test points on the device under test (DUT). There are many types, including: high impedance passive, low capacitance, single-ended active, differential active, high voltage, and current probes. This is the first in a series of three articles on probe selection and application, and will focus on passive probes. Part 2 and part 3 will address active probes and current probes, respectively.
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Product
Hipot Wire Harness Testers
NX Hipot
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* 50 to 1500VDC Hipot Testing* 50 to 1000VAC (optional) * 5Mohm to 1Gohm Insulation Resistance * Simple 4-button user interface * Tests for continuity and shorts * Tests a variety of components * Precision resistance measurements * Continuous high speed scanning for real time complete status information of harness assembly progress * Keyed security access and control * Built for rough industrial environments * 2 serial ports for connection to printers and scanners * Standalone operation * Uses a high capacity memory card * Available from 64 to 1024 test points * Networkable
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Product
Tensile Strength Machine
UI-1100
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Tensile Strength Machine, also known as Tensile Strength Tester, Universal Testing Machine (UTM), is used to do tensile, peel, shear, bend, and other tests of materials. Universal Testing Machine can do plenty tests like sole/upper bond test ISO 20344, velcro strength test (peel and shear strength) ISO 22776,zipper strength test ASTM D2061, rubber tensile test, 3 point bending test and etc.
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Product
Touch Screen 1550nm Single Mode Mini OTDR
TR1500S
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Shenzhen Sharingtek Communication Co., LTD
The TR1500S mini OTDR is compact and easy to carry. It adopts a 3.5 inches high-definition touch screen, supports multi-touch and smooth operation, integrates OTDR, event map, optical power meter, light source, visual fault locator and flashlight in one unit, to meet various test needs in different occasions. The OTDR function adopts 1550nm wavelength and is built in high-efficiency wavelength isolator. It can perform optical live test on 1490 and 1577nm optical links, which supports up to about ±10dB optical live test. Its maximum measurement range is 80km.The TR1500S is used to measure optical fiber’s length, loss, connection quality and other parameters. It can easily test the breaking point, bend and loss point of the optical fiber links. It is suitable for maintenance personnel to have optical line maintenance and emergency repair testing.
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Product
H+W (Pylon) 1280 Point Test System
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H+W (Pylon) 1280 Point Test SystemUp to eight positions for 160 Point Wiring Blocks.
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Product
Automotive Test Solutions
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The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
Imperial Test Executive
ITE
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The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
TestStand
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TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
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Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
EMI Test System
TS9975
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The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Product
Antenna Test System
ATS1000
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Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Product
NI's Electrical Functional Test Solution
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PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Product
Functional Test Fixtures
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Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
Automated Compliance and Device Characterization Tests
N5990A
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The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Product
Bluetooth RF Test System
FRVS
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FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Mixed Signal Battery Test System
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The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
Radio Frequency, Communications, & Navigation Test Systems
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Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
NI HIL and Real-Time Test Software Suite
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Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality





























