Image Analysis
The extraction and analysis of data from images.
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Laboratory And Analysis Systems
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High performance UV-VIS-IR spectrophotometer with superb optical performance for the determination of spectral absorption coefficient and spectral effective scattering coefficients
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Analysis Software
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Analysis software that can streamline how you collect, analyse and report your bat call data.
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Impurity Analysis In Bulk Gas
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High-purity gas is necessary in industries such as chemical, medical, and foods. Precisely controlled GC enables identification and quantitation of a trace amount of impurities in bulk gas. If the gas resources in a factory consist of multiple lines, a sample line selector SLS-2020 can be utilized to switch sample lines automatically, allowing a single GC to analyze all samples.
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Battery Analysis Software
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Battery characteristics vary over time and depend very much on maintenance and the environmental conditions of the specific application. Each installation tends to have its own 'fingerprint'. Capturing and managing this critical operational data has always presented a challenge to facilities managers. Recording and analysing data using traditional pencil and paper methods is both time consuming and prone to error.
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Cloud-Based RF Signal Analysis Software
Cloud4Testing
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Our next-generation software as a service (SaaS) platform is an ideal choice for your test and measurement needs. With the R&S®Cloud4Testing, you can enjoy a quick and easy access to Rohde & Schwarz testing essentials without having to make a big investment. Simply measure, analyze and process your individual RF data, on demand and on the go.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Raman Imaging & High Resolution Spectrometer
LabRAM Odyssey
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Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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The DC System Analysis Module
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Save time with intuitive scenario manager interface.• Communicate designs effectively with graphical and text base results.• Improve decisions by quickly comparing resulting curves from different scenarios.• Increase productivity by modeling both DC and AC systems in a single project.• Reduce mistakes by evaluating all loading conditions and duty cycle loads.
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Software For Data Analysis
Imc FAMOS
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Data source managementVisualization of measurement data at your fingertipsFull range of analysis functionsReport generation with direct PDF outputQuickly analyze large data sets with 64 bitMulti-layer macro creationProject managementLink data with dynamic maps or video
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Component Test and Analysis Laboratories
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The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Solid-State Battery Test Cell For X-Ray & CT Analysis
SBT1
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Solid-state battery test cell designed for X-ray imaging, CT analysis, and electrochemical testing, featuring an X-ray-transparent structure for advanced battery materials characterization.
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Terahertz imaging cameras
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The detectors are fabricated with a GaAs high-mobility heterostructure in the standard semiconductor cycle using conventional optical lithography. The imaging sensor is manufactured on a single wafer. That process ensures high homogeneity and reproducibility of the plasmonic detector parameters (pixel-to-pixel deviation responsivity is within a 20- percent range). Each detector unit has a room-temperature responsivity up to 50 kV/W with read-out circuitry and noise-equivalent power of 1 nW/\sqrt{\rm{Hz}} in the frequency range 10 GHz — 1 THz. The detection mechanism is based on excitation of plasma oscillations in a two-dimensional electron system with subsequent rectification. The rectification takes place on special defects made in the electron system.
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Spectrally Controlled Interferometry For Measurement And Analysis
SCI
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Directly measure all surfaces and angles in one setup, for an ROI of < 1 year.
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Low-overhead Coverage Analysis For Critical Software
RapiCover
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* Collect coverage for Ada, C & C++ (inc. MC/DC) on-host & target* Reduce test builds needed for analysis on constrained targets* Save time with efficient merge and mark verification workflow* Simplify verification by integrating with your CI tool* Produce evidence for DO-178 and ISO 26262 certification
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Sound Analysis Software NoiseImage
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Our sound analysis software NoiseImage is a general-purpose platform software providing all tools required for the whole measurement and analysis process. You can use the core package on its own or expand its functionality with any combination of add-on modules for different acoustic measurement types or analysis methods. The add-on modules connect seamlessly via one integrated software environment. You can combine as many expansion modules as you need.
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2D Far-Field Analysis of Infrared Emitters
VTC 2400
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Instrument Systems Optische Messtechnik GmbH
The VTC 2400 is a high-resolution infrared-camera that was developed specially for 2D-far-field analysis of the radiant intensity distribution of VCSELs and IR emitters. The measurement system consists of a light-permeable screen and a monochrome camera specialized for measurements in the near infrared range.
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Trace Viewer (Software Application For Trace Analysis)
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TraceViewer application provides you with a full range of options when analyzing traces (information on the condition of a fiber at any given point of its length, received from the optical time-domain reflectometer) - receiving, viewing, editing and labeling.
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PC Analysis Software
TekScope
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Get the analysis capability of an award-winning oscilloscope on your PC. Analyze waveforms anywhere, anytime. The basic license lets you view and analyze waveforms, perform many types of measurements and decode the most common serial buses - all while remotely accessing your oscilloscope. Advanced license options add capabilities such as multi-scope analysis, more serial bus decoding options, jitter analysis and power measurements.
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1600x1200 Pixel Sapphire CMOS Image Sensor
Sapphire 2M
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This 1,600 x 1,200 pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 50/60 fps in full resolution. Novel industrial machine vision application features such as multi ROI, histogram outputs and 3D range gating are embedded on-chip.
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Raman Spectroscopy Analysis Laboratory
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Rocky Mountain Laboratories, Inc.
Raman is used to analyze organic and inorganic materials. Bulk and small particle materials can be analyzed. Raman microscopy allows for the identification of particle as small as 1 µm.
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Spectrum Analysis For P50xxB Up To 26.5 GHz
S970905B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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PCIE GEN5 Analysis System
KODIAK
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PCIe Analysis Platform with Embedded Hardware, Calibration-Free SI-Fi™ Probing and Automatic Equalization, Internal SSD Storage, Touchscreen LCD, and Standard PCIe Cabling.
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Water Silica Analysis
Navigator AW641
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ABB's Navigator 600 Silica analyzer substantially cuts the costs and maintenance associated with silica monitoring in power generation and other large-scale steam and water dependent applications.
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Signal Analysis Synthetic Instrument
SASI
Synthetic Instrument
Textron Systems’ SASI 240 is a Signal Analysis Synthetic Instrument that combines the capabilities of six distinct measurement systems into a single device. Our dual-channel architecture enables two independent radio frequency (RF) measurements to be run simultaneously. Whether used as a benchtop device or an integrated automated test equipment (ATE) RF subsystem, our SASI’s simple and intuitive graphical user interface (GUI) ensures easy, out-of-the box functionality.
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Dynamics & Transients Analysis Software
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Dynamics & Transient analysis software enables engineers to simulate sequence of events including power system disturbances and evaluate system stability by utilizing an accurate power system dynamic model.
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High-Speed Image Processing Technology
STC-OFS701N
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Shanghai Stone Communication tech Co., Ltd
STC-OFS701N adopt high-speed image processing technology and special precision- positioning technology, automatically finish the whole process of fiber fusion in 8 seconds typically, TFT LCD monitor displays all steps of fiber fusion clear at a glance. Widely used for SM and MM Quartz Fiber with diameter 80-150m, coating layer diameter 0.1-1.0mm and bare fiber length 16mm more or less.Ideal tools for construction and maintenance of fiber and cable in both field and laboratory applications.
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Complete Power Analysis System
PK3564-PRO+
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PK3564-PRO+ complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, CASW Weather-Resistant Carrying/Operating Case, and 2-year deluxe warranty.
