Particle Impact Noise Detection
vibration, shock, and acoustics testing conducted to find particulate contamination.
See Also: Particle Impact Noise Detectors, PIND
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Product
Particle Impact Noise Detection (PIND) Test
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This test detects the presence of free moving particulate contaminants within sealed cavity devices. This test is specifically directed toward relays and other devices where internal mechanism noise makes rejection exclusively by threshold level impractical. This test method also may be used prior to final sealing in the manufacturing sequence as a means of eliminating loose particles from the interior of the device.
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Product
Particle Impact Noise Detection
BW-LPD-DAQ4000
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Computer based controller with predefined MIL-STD test sequences stored (New)Create unlimited custom tests with multiple vibration frequencies and acceleration and other parameters to meet unique requirements (New)
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Product
Noise Source, 10 MHz to 18 GHz, nominal ENR 6 dB
346A
Noise Source
The Keysight 346A noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The very small change in reflection coefficient (<0.01) from ON to OFF is designed especially for accurate characterization of input-impedance-sensitive devices (like GaAsFETs and many UHF amplifiers).
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Product
Noise Source, 1 GHz up to 40 GHz
346CK40
Noise Source
The Keysight 346CK40 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 40 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source greatly reduces measurement uncertainty, which are commonly reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 14 dB at 1 GHz, decreasing to 5 dB at 40 GHz (typical).
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Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 6 dB)
N4000A
Noise Source
The SNS series N4000A noise source is designed for accurately measuring devices with low noise figure, with a frequency range of 10 MHz to 18 GHz and nominal ENR 6 dB.
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Product
Noise Figure Analyzer, Multi-touch, 10 MHz to 7 GHz
N8974B
Low-Frequency Noise Analyzer
The N8974B high performance noise figure analyzer is designed to make fast, accurate and repeatable noise figure measurements. When paired with an SNS Series noise source and U7227 Series USB preamplifier the ENR data from the SNS and USB preamplifier data automatically downloads into the N8974B.
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Product
Noise Figure Analyzer, Multi-touch, 10 MHz to 3.6 GHz
N8973B
Low-Frequency Noise Analyzer
The N8973B high performance noise figure analyzer is designed to make fast, accurate and repeatable noise figure measurements. When paired with an SNS Series noise source and U7227 Series USB preamplifier the ENR data from the SNS and USB preamplifier data automatically downloads into the N8973B.
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Product
Noise Figure Analyzer, Multi-touch, 10 MHz to 26.5 GHz
N8975B
Low-Frequency Noise Analyzer
The N8975B high performance noise figure analyzer is designed to make fast, accurate and repeatable noise figure measurements. When paired with an SNS Series noise source and U7227 Series USB preamplifier the ENR data from the SNS and USB preamplifier data automatically downloads into the N8975B.
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Product
SNS Series Noise Source 10 MHz to 26.5 GHz (ENR 15 dB)
N4002A
Noise Source
The SNS series N4002A noise source was designed to measure DUT noise figures reliably and accurately up to 30 dB from 10 MHz to 26.5 GHz.
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Product
Advanced Low-Frequency Noise Analyzer
E4727B
Low-Frequency Noise Analyzer
Get a deeper, closer look at low frequency noise with the A-LFNA integrated with WaferPro Express, featuring data analysis, wafer prober control and test suite automation.
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Product
Phase Noise Analyzer and VCO Tester
FSPN
Phase Noise Analyzer
The R&S®FSPN phase noise analyzer and VCO tester is designed to provide both very high sensitivity and measurement speed for production and design engineers working in these fields characterizing sources such as synthesizers, VCOs, OCXOs, and DROs. It is the ideal instrument for demanding development and production phase noise and VCO analysis.
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Product
Millimeter-Wave Noise Source, R-band, 26.5 to 40 GHz
R347B
Noise Source
The Keysight R347B noise source covers a 26.5 to 40 GHz frequency range. This waveguide noise source allows you to make accurate and convenient noise figure measurements on millimeter-wave devices. The R347B provides highly precise broadband noise at the input of the system or component under test. The noise figure meter then processes the ON/OFF ratio of noise power present in the system IF, and provides an accurate reading of noise figure and gain. The R347B noise source has remarkable ENR stability over time, which allows longer recalibration cycles and more accurate noise figure measurements.
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Product
Noise Figure Analyzer, Multi-touch, 10 MHz to 40 GHz
N8976B
Low-Frequency Noise Analyzer
The N8976B high performance noise figure analyzer is designed to make fast, accurate and repeatable noise figure measurements. When paired with an SNS Series noise source and U7227 Series USB preamplifier the ENR data from the SNS and USB preamplifier data automatically downloads into the N8976B.
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Product
Low-Noise Filter, 210 V / 3 A
N1298C
Noise Filter
The N1298 Series power source accessories are a collection of low noise filters for the Keysight B2960 Series precision source / measure units (SMUs).
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Product
6.5-Digit Low Noise Power Source, 32 W, 210 V, 3 A, 2-Channel
B2962B
Low Noise Power Source
The Keysight B2961B Series 6.5-digit low noise source power supplies provide a power supply and source solution that meets the difficult measurement challenges researchers, designers, and developers face working on advanced components, circuits, and materials.
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Product
Alpha Particle Counting System
UltraLo-1800
Particle Counting System
The UltraLo-1800 is a best-in-class alpha particle counting system. Our patented design reduces background rates by 50x compared to conventional systems.
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Product
Noise Source, 1 GHz up to 50 GHz
346CK01
Noise Source
The Keysight 346CK01 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 50 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty, which are reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 20 dB at 1 GHz, decreasing to typically 7 dB at 50 GHz.
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Product
Phase Noise Test System
N5511A
Phase Noise Analyzer
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
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Product
Ultra-Low Noise Filter, 42 V / 105 MA, 50 Ω
N1298B
Noise Filter
The N1298 Series is a collection of low noise filters for the Keysight B2960 Series 6.5-digit low noise source.
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Product
Particle Impact Noise Detector
BW-LPD-D4000
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FREQUENCY: SINE WAVE 27Hz TO 265HzACCELERATION: 0 TO 20G PEAKSHAKER: 100 FORCE LBS 3/4" IN STROKE 75 IN PER/SEC VELOCITYAMPLIFIER: 250 WATTS MINIMUMD.U.T. WEIGHT: 300 GRAMS PRACTICAL LIMIT @ 20G
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Product
Phase Noise Analyzer and VCO Tester
FSWP
Phase Noise Analyzer
The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.
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Impact Tools
D814™ Series
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Make effortless, uniform connections with Fluke Networks’ D814™, all-in-one, telecom punchdown tool. Its adjustable impact wheel has high and low settings for any type of termination. Automatic spring mechanism provides right impact to seat and/or terminate wires. Compartment at the end of the tool stores an extra blade.
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Product
Impact Testing
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Educated Design & Development, Inc.
ED&D is the only company in the world currently supplying safety products that actually meet or exceed the specified Rockwell hardness’s that are called for in the standards. Manufacturing to these specifications is an extremely difficult process. In addition, we rely on external laboratories that specialize in Rockwell hardness to verify and certify our results. These are corners our competitors’ often cut, but are vital toward providing equipment that meets or exceeds the requirements! If you’ve purchased product safety test equipment that specified a Rockwell hardness requirement, and you didn’t purchase it from us, chances are you’re using a piece of test equipment that DOES NOT meet the requirements.
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Hammer Impact Testing
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EDM Modal Hammer Impact Testing provides the necessary features for a single-operator experimental modal test. The Hammer Impact GUI features an intuitive step-by-step process, allowing a user to easily go through the setup and then the testing.
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Impact Testing
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When you need to evaluate how your product & materials react to shock loading, Trialon is here to help. By utilizing our laser-aiming test stand to create consistent positioning and ball impact, you can trust that Trialon has the equipment and personnel to conduct your test accurately and timely.
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Submicron Particle Imaging
FlowCam Nano
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Yokogawa Fluid Imaging Technologies, Inc.
FlowCam Nano is the next-generation dynamic image analysis instrument for submicron particle imaging and sizing in real-time. FlowCam Nano extends subvisible particle analysis to detect objects between 300 nanometers and 2 micrometers - the smallest visible with light microscopy.
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Particle Analyzers
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Teilch Particle Analyzers have proven significant advantages when compared to competitors’ solutions. Innovations in light source, flow control, analog and digital signal processing, components integration and software allow Teilch to provide a state of the art system for precision particle analysis.
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Particle Size Analyzers
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Particle analyzers are used to determine the size and distribution of particles making up a material. Particle size analyzers are used in numerous fields for research and development, manufacturing and for quality control and product testing.
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Biological Detection
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Collaborating with government agencies in the USA and UK in the field of biological threat detection, Kromek is working towards the common goal of improving the early detection of biological threats anytime and anywhere, making the world safer and healthier.
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Card Impact Tester
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Tests corner impact and card bending resistance, Designed to test for MasterCard CQM and ANSI N322 requirements, Easy to use, Repeatable results, Small footprint design for benchtop use, Adjustable jaws allow use with various card thicknesses, Super heavy duty custom CNC design
