Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Heating Microscope
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Heating microscopy is a non-contact technique that, based upon an advanced image analysis of a specimen subjected to a thermal treatment reproducing industrial firing conditions, identifies several characteristic shapes and related temperatures key to the optimization of manufacturing processes in ceramics, metals, and alloys.
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3D Scanning Software
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Software is a comprehensive component to any advanced metrology system. Combined with laptops and portable equipment, 3D scanning and measurement is now possible virtually anywhere. 3D scanner software plays a critical role in every stage from the creation of a concept design to the manufacturing and inspection of prototypes. Below is a look at some of the Laser Scanner Software and 3D Scanner Software providers and platforms we represent and handle.
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Product
Multifunctional Immunity Test System For Automotive Electronics
EMS-ISO7637
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EMS-ISO7637 automotive multifunctional immunity test system meet newest ISO7637-2 requirement of
. This standard was issued by international organization for standardization, and this system included all of ISO-7637 required test waveform and meet most of automotive manufacturer’s requirement for automotive electronic immunity test. -
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Indicators - Electronic
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An electronic device used to read an input value from a measuring device and show a displayed value.
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Inverted Microscopes
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ACCU-SCOPE inverted microscopes deliver excellent ergonomics, top quality optics, crisp images and configurability to meet your needs. The “workhorse of the tissue culture lab,” the inverted microscope is found in practically all tissue culture rooms and is used to observe cells in culture for their health and growing condition. Living cell cultures are essential to the discovery of cellular processes, providing scientists insight into mechanisms of disease that can be used for identifying new therapeutics. ACCU-SCOPE inverted microscopes are commonly equipped with phase contrast components for the observation of living cells in culture without the need for staining. Other available contrast methods may include brightfield, fluorescence, emboss, differential interference (“DIC”) and modulation.
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DC Electronic Load
M9822/M9822B
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M9822/M9822B is newly designed circuit adopts rapid AD and DA technology to achieve rapid measurements with high accuracy. And the resolution of 0.1mV/0.1mA can effectively display the minor change of voltage and current, so the instrument has a wider application field and achieves better test results. Meanwhile your operation becomes much more comfortable and easy by equipping the high-light VFD, the simple menu and displayed contents and the operation state indicators on all keys. Otherwise the complete and humanized test functions will greatly improve your productivity.
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DC Electronic Load
EE30180A
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The EE30180A DC Electronic Load / Works @ 0.0 Volts Input & real time I/O control. attach the electronic load block to a heat- sink and your up and running.
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Scanning Probes
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Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
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Electronic Air Throttle Tester
DTA-1
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Throttle is usually associated with petrol engines. However, throttle valves are also found in modern diesel engines. They are used under different names, often general and not linking to intake system.
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3-CMOS & 3-CCD prism-based RGB Area Scan Cameras
Apex Series
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JAI’s prism-based R-G-B cameras separate the incoming light into red, green and blue wavelengths, which are directed to three separate image sensors. The cameras deliver exceptionally accurate R-G-B raw image data ideal for demanding color machine vision applications across a range of industries including pharmaceutical, electronics, printing/packaging and imaging in microscopy and medical diagnostics equipment.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Power Electronics Test Bench
OP1300
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The multi-purpose and ready-to-use Power Electronics Test Bench combines a state-of-the-art Hardware-in-the-Loop (HIL) simulator from OPAL-RT with Imperix’s Rapid Control Prototyping (RCP) system and real power hardware. It enables rapid development of power electronics, drives and smart-grid applications across industry and academia.
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Electronics Manufacturing Services
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In many cases variability of production and test platforms available restricts production flexibility and may cause bottlenecks in factories. Therefore, standardization of existing test equipment and reusability of fixtures/needle beds in off-line and in-line platforms are essential aspects.
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Electronic Ballast Tester
WT5000
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WT5000 is the updated version of WT3000 with a super LCD for displaying waveforms and parameters directly, and it includes all the functions and technical parameters of WT3000. Reports can be printed if printer is connected. It also meets the latest requirements for electronic ballasts in international standards IEC 60929, IEC 60969, IEC 61000-3-2, GB/T15144-2005, GB/T17263-1998 and so on.
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Single-in-Line Reed Relays from Pickering Electronics
SIL / SIP
Reed Relay
The SIL / SIP reed relay is the industry standard when high reliability and consistent performance are desired in a compact package. Pickering Electronics Series 100 - 119 SIL / SIP reed relays feature the highest quality instrumentation grade reed switches making them suitable for the most demanding applications. Features include:
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High Resolution Microscope for Multi-fiber Connector
D SCOPE MT
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The new D SCOPE MT microscope for MTP/MPO connectors is the fastest on the market. In the same measurement cycle, D Scope MT checks every optical fiber surface condition, and allows the operator to control the cleanliness of the connector endface and guideholes.
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Stroke-to-Raster Scan Conversion
VSC/900
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The Model VSC/900 provides scan conversion and mixing for any video input signals. The unit's capabilities include conversion of any input to any output format up to 2K x 2K. In addition to operating with VESA, HD and SD signals, the unit provides conversion and mixing of stroke (vector) video signals.
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DC Electronic Loads
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Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
NGI DC Electronic Loads
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HID Electronic Ballast
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Shanghai Yiya Electronic Instrument Co., Ltd.
Applicable to illumination of marketplace, office illumination, home illumination, architectural illumination.
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Electronic Differential Pressure
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An innovative software and hardware concept makes it possible to combine any two pressure transmitters of the VEGABAR 80 series into an electronic differential pressure system. Electronic differential pressure measurement is often used for filters, pumps and pipelines.
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1800~3000W DC Electronic Loads
JT633 series
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Nanjing Jartul Electronic Co., Ltd
JT633 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT633 series load very suitable for testing power supply when produced in large quantity. Besides, JT633 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT633 series load satisfing most of R&D requirements.
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Pin Electronics (PE)/ Pin Drivers ATE
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Analog Devices integrated pin electronics (PE) support speeds up to 2.5Gbps at high accuracy and low power, all manufactured on ADI's proprietary fab processes, providing unmatched test solutions needed for cost-sensitive, test applications.
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Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Digital Electronic Tyre Pressure Gauge
6515
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Peaceful Thriving Enterprise Co Ltd
To measure tyre pressure, measuring range: 5-150 PSI.
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Radar Electronic Support Receiver
RR024
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The RR024 is designed for Radar Electronic Support (RES) and Radar Warning Receiver (RWR) applications where high performance and small size are of prime importance, with filtering, amplification, detection and pulse parameter measurement being combined into one multi-function unit. Four amplitude measurement channels allow direction finding by amplitude comparison between adjacent antennas. An IFM, fed from one of the amplitude channels via an SPDT switch, performs 14 bits of frequency measurement on the selected input. Frequency resolution is nominally 1 MHz over a 2 to 18 GHz band.
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Stereo Microscopes
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Here are a few examples from our 40 years of microscopy experience in the development of special stereo microscope solutions and accessories for and with Leica , Zeiss , Nikon and Olympus .
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VS Tool Suite for Virtual Scan Synthesis and ATPG
VirtualScan
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VirtualScan is SynTest's solution to combat increase in test data volume and test cycle volume. With VirtualScan (VS) an extremely large number of short scan chains within the SOC can be virtually accessed from outside the chip with a limited number of pins assigned as scan pins.
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Electronics Cooling Simulation Software
FloTHERM
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Perform thermal analysis, create virtual models, and test design modifications of electronic equipment before physical prototyping. FloTHERM uses advanced CFD techniques to predict airflow, temperature, and heat transfer in components, boards, and complete systems, including racks and data centers. It''s also the industry''s best solution for integration with MCAD and EDA software.
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