Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Scan Systems
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Allows its user to achieve previously unreachable levels of dynamic performance and precision.
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Electronic Engineering
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By combining our core skills in electronic and electrical engineering we can design and support all aspects of test and measurement equipment.
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Electronic Resistance Store
MEMS2-4L
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The mezzanine serves as an electronic store of resistance to direct current, the value of which is set by software, through two isolated channels.
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Differential Scanning Calorimeter
DSC-L600
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The Differential Scanning Calorimeter (DSC-L600) is a powerful thermal analysis instrument that measures the heat flow of a sample as a function of time or temperature. The DSC-L600 has been designed to be a cost-effective instrument that is well suited for research or QC applications. The instrument communicates with the PC via a RS232/USB connection. The specially designed heat flux plate has demonstrated more than twice the sensitivity than other heat flow type DSC’s on the market. The reproducibility is excellent, and the noise level is virtually unnoticeable due to a precision high gain, low noise differential amplifier
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Monocular Microscopes
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ACCU-SCOPE monocular microscopes use high-quality optics for bright, crisp images. Possibly the iconic and most recognized example of microscopes, monocular microscopes are compound microscopes with the outstanding feature of a single eyetube and eyepiece. Our monocular microscopes are durable and portable, making them favorites across a wide range of laboratories and educational environments including high schools, environmental science, and veterinary settings. ACCU-SCOPE monocular microscopes come with a standard selection of 4x, 10x and 40x DIN objectives (“DIN” is an international standard for type of thread and focal length). Depending on the series, 60x dry or 100x oil immersion objectives are available.
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Electronic Load System
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Electronic loads are required for testing fuel cells such as PEMFC, AFC, PAFC, MCFC, SOFC. These electronic loads are designed either in IGBT technology with power, current and voltage ranges according to specific requirements or in transistor technology. Electronic loads in IGBT technology are designed for high voltage ranges up to 900 V, current ranges up to 1000 A, and power ranges up to 480 kW.
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Area Scan Camera
Genie Nano-5GigE
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Engineered for imaging applications that require high-speed data transfer, the all new Genie Nano 5GigE is an easy replacement for gigabit ethernet cameras built into current vision systems that rely on the existing GigE Vision interface standard. The new Genie Nano 5GigE models feature the brand new 5Gbps (5GBASE-T) link speed.
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Rapid Automated Modular Microscope
RAMM
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Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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Area Scan Camera
Genie Nano-CXP
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Introducing Genie Nano-CXP, a camera designed for full-throttle performance. Genie Nano-CXP builds on Nano's proven, industry leading reputation and leverages a CoaXPress 6Gbps interface to deliver the maximum throughput from leading edge high resolution CMOS image sensors.
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Flash Vs. Scan
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A LiDAR system can observe the complete field of view (FOV) at once, called Flash systems. Flash typically works well for short to mid-range (0-100m), and by capturing the complete scene at once also objects with high relative speeds can be detected properly. Another implementation is to focus on a subset of the FOV, consequentially look at the next subsets, until the complete FOV is covered, called Scanning. Scanning can focus the light on the subset instead of the full FOV, and therefore can do object detection at a longer range compared to Flash.
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Turret Test And Scan Handlers
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Turret platforms for semiconductor test, inspection and packaging.
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Electronic Loads
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high performance electronic load is the successor to the highly respected PLZ-4W series, whilst still retaining the same high specification and build quality. Advances include a high visibility color display, low voltage operation from a minimum of 1 V to a maximum of 150 V. Programmable profiles of voltage/current can be applied (using the new ARB function, as used in LED/solar testing) in addition to the inherited 6 modes of operation: Constant Current, Constant Resistance, Constant Voltage, Constant Power, Constant Current + Constant Voltage, Constant Resistance + Constant Voltage.
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Area Scan Camera
Genie Nano-CL
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Introducing Genie Nano, a CMOS area scan camera that redefines low cost performance. Genie Nano starts with industry leading CMOS sensors and adds proprietary camera technology for breakthrough speed, a robust build quality for wide operating temperature, and an unmatched feature set--all at an incredible price.
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AC Electronic Load
IT8600 Series
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IT8600 is ITECH latest series of AC/DC electronic loads with power range 0~14.4 kVA and adjustable frequency 45 Hz ~ 450 Hz. The unique oscilloscope waveform display function of IT8600's can display input voltage & current as waveform. It is equipped with measurement modes for different parameters such as inrush current, peak value, effective value, PF (power factor).
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Other Power Electronic Capacitors
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AC/DC Power Film Capacitors, DC Pulse Current Capacitors, DC Filter Capacitors, Pulse Grade Capacitors, Motor Run Capacitors, Feed-Thru Capacitors and other Customized Capacitors
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Near-field Scanning Optical Microscope
NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Xineos Scanning
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Teledyne DALSA's leadership in CMOS innovation lets our Xineos scanning products deliver three times more sensitivity and five times more signal-to-noise performance than other standard technologies at equal X-ray dose conditions. CMOS image detectors offer numerous advantages including the ability to record smaller image details with higher resolutions – allowing for the diagnostics of medical anomalies at earlier stages, and significantly increasing the probability of early intervention, patient recovery, and reduced treatment costs.
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Fluorescence Microscopes
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We develop epifluorescence microscopes with a single fluorescence up to 16 fluorescences in a few seconds. Realized with standard cameras or highly sensitive sensors.
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Electronic Design
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We design and build custom racks, special switching systems, RF systems and custom Digital/ Analog sub assemblies. The hardware can be packaged per your requirements, using industry standard modules, rack mounted instruments, or custom made packaging. Extensive LabVIEW, embedded and other programming languages development are available as part of our hardware control support.
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Bench Electronic Loads
EL30000 Series
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The Keysight EL30000 Series Bench electronic load with a built-in data logger provides new levels of test insights for your devices like power supplies, batteries, DC to DC converters, and more. View voltage and current trends to make real-time decisions, rather than waiting hours for a test to complete. At the heart of the EL30000 is a highly accurate measurement system that provides real-time updates to the large display. Keysight’s PathWave BenchVue software allows you to operate the electronic load remotely, execute test sequences, log data, and integrate with other test instruments. Single and dual-channel models are available with up to 600 W for measurements that require more power. Start your test with confidence and finish with results you trust.
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Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Electronic Stud Metal Finder
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Precision Mastech Enterprises Co.
A handheld, battery-operated device that detects hidden wooden studs, metal framing, pipes, or live electrical wires behind drywall.
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x1149 Boundary Scan Analyzer
N1125A
Analyzer
The x1149 is a tool for engineers to perform structural test such as opens and shorts tests on their PCBAs. It also performs In-System Programming for devices such as FPGAs and CPLDs.
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Microscope Photomultiplier Photometers
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HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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Electronic Resistance Store
MPS2
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The MPS2 module is a mezzanine module designed to form DC resistance in two channels with a four-wire measurement circuit. MPS2 is installed on the mezzanine carrier - the NMU module and is connected to it via a local information highway. Up to four mezzanines of various types can be installed on the NMU module. The NMU module together with the mezzanines installed on it forms a VXI module of the size C-1 and is used to create information measuring VXI systems.
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Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Electronic System Design
ESD
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Smart connected devices are everywhere, in homes, in transportation, and at work. This means electronic system design (ESD) is having a greater influence on almost every type of product requiring new simulation tools to help achieve electronic, electrical, mechanical, thermal, and connectivity goals. Altair’s simulation-driven design tools enable your team of specialized engineers to collaborate across all aspects of printed circuit board development from concept to manufacturing. Our products streamline your process, eliminate design iterations, and reduce time-to-market.
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Quick Scanning Moisture Meter
L601-3
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The rugged L601-3 is specifically designed for the demanding environment of the sawmill or wood products manufacturing plant where quick-scanning of lumber is a must. The L601-3''s "Wood-Friendly" electromagnetic waves penetrate beyond the surface into the wood to a depth of 1" and provides an instant averaged reading of the board''s moisture content in a 2.5" x 2.5" x1" scanning area.
