Jitter Analysis
Measure timing changes in a circuit.
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Product
Spectrum Analysis, Up To 90 GHz
S930909B
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The S930909B spectrum analysis adds high-performance microwave spectrum analysis up to 90 GHz to the N5290A/91A broadband network analyzers and other various banded millimeter-wave network analyzer configurations
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Product
Occlusal Analysis with BiteForce DynamicsTM
T-Scan
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The T-Scan is a diagnostic device that measures relative biting forces, including occlusal force, timing and location and is an ideal complementor to articulating paper. The technology was invented by Dr. William Maness in 1987 at Tufts University and M.I.T.
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Product
Gas Analysis
HPR-20 EGA
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The Hiden HPR-20 EGA gas analysis system is configured for continuous analysis of evolved gases and vapours from thermogravimetric analysers, TGA.
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Product
Acoustic Analysis
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Noise is increasingly the subject of new regulations for the protection of human health and safety as well as for improving the environment in general. As well as sound levels, the perceived sound quality of products from washing machines to vehicles is often an important part of the customer buying decision so must be considered during product development. m+p Analyzer for noise and vibration measurement and analysis provides a full range of capability for these applications. Real-time fractional octave filters satisfy all acoustic applications from simple sound pressure, sound power for equipment legislative requirements, intensity mapping to isolate sources to sound quality metrics for product refinement.
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Product
Signal Analysis Synthetic Instrument
SASI
Synthetic Instrument
Textron Systems’ SASI 240 is a Signal Analysis Synthetic Instrument that combines the capabilities of six distinct measurement systems into a single device. Our dual-channel architecture enables two independent radio frequency (RF) measurements to be run simultaneously. Whether used as a benchtop device or an integrated automated test equipment (ATE) RF subsystem, our SASI’s simple and intuitive graphical user interface (GUI) ensures easy, out-of-the box functionality.
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Product
Incident-based Abnormal Software Behavior Analysis Services
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If you have a software problem that no one can analyze, need training to get your developers, support and escalation engineers improve their troubleshooting, debugging, memory dump and software trace analysis skills or just need the expert opinion on an existing analysis report please don't hesitate to contact us.
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Product
DCA-M High-Accuracy, Low-Cost Solution for Optical Waveform Analysis
N1090A
Oscilloscope
The N1090A DCA-M builds on that legacy by using the high-performance elements of 86100 and 86105C. It can be configured to perform thorough optical transmitter compliance tests at a variety of standard data rates from 1.244 to 11.3 Gb/s and come with 20 GHz electrical channel in option.
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Product
Data Analysis Software
APP ClearView
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APP ClearView™ is the ideal data analysis software for engineeres and managers that need system information and answers quickly. It has a wide varity of graphics, math functions, reports, and file manipultion features that allow the user to easily navigate through their data. It supportsimporting of indisustry standrad formats such as COMTRADE (Common Data Transient Data Exchange) version 1996, 1997, and 1999.
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Product
Functional/Protocol Debug and Analysis Reference Solution
DDR4
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Highest confidence in measurement accuracy! Industry’s fastest triggering and data capture for DDR4 analysis, test, and debug.
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Product
Raman Spectroscopy Analysis Laboratory
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Rocky Mountain Laboratories, Inc.
Raman is used to analyze organic and inorganic materials. Bulk and small particle materials can be analyzed. Raman microscopy allows for the identification of particle as small as 1 µm.
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Product
Acoustic Analysis
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Includes cursor readout of dB bands, max & min lines, noise curve overlays, pink noise generator, and optional STC Transmission Loss.
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Advanced Data Collection, Display and Analysis Software for WIndows & Mac
PASCO Capstone
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PASCO is pushing the limits of technology, so you can push your students to their potential. Working closely with educators, we continuously develop Capstone™, making improvements and enhancing the teaching features. Capstone is designed to handle large data sets, high-speed sampling, and customized preferences to fit the needs of your lab. A straightforward user interface is approachable for beginners, yet Capstone offers all the capabilities needed for even the most advanced users. Our generous site license allows students to install PASCO Capstone on their own computers so they may perform data analysis off campus.
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Product
Sensing Analysis Software
ENLIGHT
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A single suite of tools for data acquisition, computation, and analysis of optical sensor networks based on the HYPERION system.
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Product
Cross-Section Analysis Laboratory
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PCBs are constructed of a variety of materials such as glass, ceramic, copper, solder and Teflon. Trialon has the equipment and experienced staff to perform this difficult analysis. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Product
Real-time 1/1, 1/3 Octave Analysis Software
DS-0323
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This software analyzes the 1/1 and 1/3 octave bands for 2 - 32 channels (2 - 64 channels when two units are connected ) in real-time from 0.5 to 20 kHz. The filter is compatible with the IEC, JIS, and ANSI standards. The equivalent continuous A-weighted sound pressure level (Laeq) and the single-shot sound exposure level (Lae) are calculated simultaneously by setting measurement time. Variations in level (time series) for each band can be saved for up to 2,000 points.
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Product
PLTS N-Port Measurement And Analysis
N19307B
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PLTS N19307B extends the N19301B base product to perform N-port (greater than 4 ports) measurements and analysis
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Product
Full-Wave Three-Dimensional Analysis Software
EZ-FDTD
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Based on the Finite-Difference Time-Domain method, EZ-FDTD brings the full power of electromagnetics to solve complex EMI/EMC real-world problems for any frequency ranges that your application demands. Eliminate guessing for critical problems. Eliminates rule of thumb uncertainty. Provides insight, confidence and solutions.
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Product
Surface Plasmon Resonance Analysis
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Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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Product
PathWave BenchVue Advanced Power Control And Analysis For Multiple Instrument Connections
BV9200B
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Control and analyze voltage and current measurements from multiple N6705C, N7900 or RP7900 Series
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Product
Automated Analysis Software
RevospECT Pro
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RevospECT Pro is the industry’s first commercially available high-powered, adaptable and scalable automated analysis system. It provides end users the power and control to perform comprehensive automated analysis of eddy current data. RevospECT has a proven track record in the field and meets rigorous industry standards for flaw analysis from bobbin, rotating and array inspection techniques. Once configured for an inspection, RevospECT Pro will process and analyze data at an extremely fast rate utilizing its robust distributed processing power, often outpacing data acquisition rates and generating results that can be verified immediately by the reviewing data analyst. More importantly than system speed is the consistency of the results that are delivered using computer-aided analysis.
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Product
Zero-footprint Coverage Analysis For Critical Software
RapiCoverZero
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*Collect coverage from systems that produce branch traces*Save time with efficient merge and mark verification workflow*Simplify verification through integration with your CI tool*Collect coverage for libraries without source code
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Advanced NDT Data Acquisition & Analysis
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WeldSight™ software’s comprehensive acquisition and analysis tools enable you to engineer compliant and repeatable advanced phased array (PA), ultrasonic testing (UT), and time-of-flight diffraction (TOFD) weld inspections.
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Impedance Analysis
S96041B
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Make impedance analysis measurements of Surface Mount Device (SMD) components on the E5080B vector network analyzer with 16198A-010 10 GHz SMD test fixture.
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Analysis Software for FCS and cross-FCS
Burst-Analyzer
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*FCS Fit with User-Defined Model Functions*Identification of Single-Molecule Photon Bursts in Parameter-Tag Data*Analysis of Fluorescence Intensity and Lifetime within Photon Bursts*One- and Two-Dimensional Histograms of Burst Parameters*Filtered Histograms of Burst Parameters*Discrimination of Different Fluorescent Species or FRET States*Determination of FRET Efficiencies*Exclusion of Artifacts in Intensity Traces
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Product
DC Power Output Analysis Service
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We will detect decrease in power output of a customer’s solar power plant caused by trouble of the panels or other system components quickly, by analyzing the monitored data.
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Product
Wafer Analysis Systems
Tropel®
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Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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Spectroscopy, Elemental & Isotope Analysis
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Research, production and analytical laboratories worldwide rely on us for rapid, efficient qualitative and quantitative analysis. Our innovative instruments and user-friendly software serve a range of industrial, educational, environmental and health markets. We offer a comprehensive portfolio for the quantification and identification of trace elemental species at ppm to sub-ppt levels in addition to isotopes. We also provide a wide range of lab-based and handheld instruments employing analytical techniques including XRF, FTIR, NIR, Raman spectroscopy, IRMS, ICP-MS and more.
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Product
X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
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Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
