Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Beverage Analysis
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Analyze multiple quality control parameters of your beverages in parallel, within 3 to 5 minutes only. See all parameters on a bright, easily customized 10.4’’ touchscreen display. Anton Paar’s modular beverage analysis solutions are quickly adapted to your needs in a Plug and Play fashion. In any case, the sample filling and measurement process is completely transparent and traceable.
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Gas Analysis
QIC BioStream
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A gas analysis system for continuous analysis of gases and vapours from multiple fermentation reactors with multi off gas and multi reactor dissolved gas species analysis capability. A high-performance Proteus multi-stream valve supplied with 20, 40 or 80 inlet streams is included with programmable sequence control software for analysis of multiple reactors. Streams can be allocated for either dissolved species analysis or off gas analysis.
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Structural Analysis
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With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
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Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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Chemical Analysis
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The chemists at IMR have numerous analytical tools at their disposal, all geared toward providing accurate, NIST traceable analyses of metals and process solutions. The staff is experienced, professional, and knowledgeable in the latest analytical techniques.
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Signal Analysis
FFT Analysis
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The program FFT (Fast Fourier Transform) Analysis is used for narrow-band spectral processing of signals coming from the input channels of ADC modules and FFT spectrum analyzers (in real-time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Product
Failure Analysis And Magnetic Imaging Services
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Micro Magnetics offers failure analysis services on a contractual basis. We maintain two current density metrology systems at our headquarters in Fall River and can produce maps of current flow in a wide variety of ICs and packages, usually with initial results delivered within 48 hours. Our engineers will work closely with you to understand and interpret the results in order to determine the root cause of the failure.
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Product
WAFER MVM-SEM® E3300 Series
E3310
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The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Wafer Probe Test System
STI3000
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Product
Code Analysis
Kiuwan
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Identify code defects & vulnerabilitesto manage your remediation effortsBlazingly fast analysis in a collaborative and unlocalized environment.
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Product
Wafer Chucks
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American Probe & Technologies, Inc.
High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,
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Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Wafer Inspection Products
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Sonix provides manual and automated wafer inspection and metrology systems for wafers ranging from 100mm to 300mm, with extensive analysis capabilities at both the wafer and device level. These industry-leading automated wafer inspection systems are used by the world’s top manufacturers to ensure quality from development through production.
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Malware Analysis Tool
ThreatAnalyzer®
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See how you can defend your network from targeted attacks, advanced malware and Zero-days with ThreatAnalyzer®, the industry''s premier malware analysis sandbox. Our dynamic malware analysis sandbox (formerly known as CWSandbox) is used to dig deep into malware to reveal its impact on your organization so you can respond quickly – knowing what''s happening on your network and what systems or data are at the greatest risk.
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Product
Corrosion Analysis
Profometer Corrosion
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The Profometer Corrosion is the most versatile corrosion analysis solution in the market based on the half-cell method. Proceq’s unique wheel electrodes allow the fastest and most efficient on-site testing. As direct successor to the Canin, it is compatible with existing Canin and most third party electrodes.
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Wafer Test Solutions
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Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
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The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
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Ballistics Analysis Software
BallAX 4
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BallAX 4 is used to acquire and analyse measurement data from firearms, guns, artillery, projectiles and grenades using different ammunition and explosive propellants. Data gathered by the software aids in determining the accuracy and consistency of a projectile before it exits a firearm. Manufacturers of firearms ranging from basic hunting rifles to critical military artillery will benefit from the precision data afforded by this industry-specific software module.
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Display and Analysis Software
IADS
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Curtiss-Wright Defense Solutions
IADS telemetry client software is the integrated display and analysis portion of the IADS data display, processing, delivery and archive software suite. IADS client facilitates real-time mission analysis and raises situational awareness, safety monitoring, and test point clearance capabilities to a new level.
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Static and dynamic analysis
MEMS
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Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
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Product
Probing & Analysis Adapters
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No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Product
Water Analysis Meter
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Shanghai Selon Scientific Instrument Co. Ltd.
A tool used to measure various physical and chemical properties of water to determine its quality.
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Product
DCME Analysis System
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DCME Analysis System (SCL-DAS) is a software based application, which is designed to classify, process and decompressed the compressed signals transmitted over the satellite links.DCME Analysis System supports most of the commercially available DCMEs including PCM, ADPCM, DX-3000, DX-7000, DTX-600, DTX-360, DTX-240 (D,E,F,T), CELTIC-3G, OKI TC-2000 etc. While processing the compressed/normal E1 carrier, the SCL-DAS provides the processed intelligible output in the form of Voice and Fax along with Originating Point Country, Destination Point Country, Outgoing Number, Incoming Number etc.
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Product
Enable Non-Invasive Analysis
Sparklike Handheld™
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Sparklike Handheld™ is practical and quick method to test IG gas concentration. Technology is based on plasma emission spectroscopy. A high voltage spark is launched in the IG unit's cavity causing a light emission which is observed and analyzed further.
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Product
Flexoplate Analysis
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Quality Engineering Associates Inc.
QEA has the most comprehensive and sophisticated lineup of evaluation tools for flexography, one of the fastest-growing sectors in commercial printing. Our test tools quantify flexo plates, film, masks, photopolymer- and metal-backed plates and sleeves, letterpress, newsprint and direct-engraved plates, as well as the final print.
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Wafer Thickness, TTV, Bow and Warpage
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ALTO-TTV FAMILY OFFERS THE SPEEDY MEASUREMENT OF WAFER GEOMETRY PARAMETER, MORE IMPORTANTLY, WE CAN AUTOMATE THE TOOL TO HANDLE FROM THIN WAFERS TO PERFORATED, WARPED, BUMPED, AND TAPE-FRAMED WAFERS. OPTIONAL SORTER AND SHIPPING JAR UNPACKING FUNCTION AVAILABLE.
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Elemental Analysis Instruments
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Chongqing TOP Oil Purifier Co., LTD
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