Infrared Microscopes
observe, measure and analyze, sample magnified, IR view.
See Also: Microscopes, Acoustic Microscopes, Atomic Force Microscopes
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Product
Infrared Linescanners
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Fluke Process Instruments Linescanners are designed for continuous monitoring of parts or processes. The up to 300Hz scan speed is the fastest in the business. This provides more complete data about even the highest speed manufacturing processes. With up to 1024 data points per scan and up to 200:1 optics, each spot on the target surface is over sampled up to three times, providing complete coverage.
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Product
Imaging Mass Microscope
iMScope QT
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Inheriting the concept of a mass spectrometer equipped with an optical microscope from the iMScope series, the iMScope QT is also Shimadzu's flagship model for MS imaging with a Q-TOF MS(LCMS-9030).
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Product
Fourier Transform Infrared Spectroscopy (FTIR)
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Rocky Mountain Laboratories, Inc.
FTIR Analysis is used to analyze organic materials. Bulk and small particle materials can be analyzed. FTIR microscopy analysis allows for the identification of particle as small as 10 µm.
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Infrared Detectors
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Powerful, versatile uncooled long-wave infrared solutions for industrial, security and defense applications offered by Teledyne DALSA.
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Industrial Microscope Systems
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Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Inverted Light Microscopes
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Inverted microscopes from Leica Microsystems are designed to meet the rigorous demands of life science as well as material science and industrial applications.
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Atomic Force Microscope
AFM
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Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Product
Infrared CO2 Analyzer
CI-IN261
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Shanghai ChangAi Electronic Science & Technology Co.,Ltd
CI-IN261 is based on NDIR principle and adopts digital processing technology as zero point/range point calibration, linear processing, temperature compensation, switch output, flow/voltage output, parameters setting etc. - See more at: http://en.ci-ele.com/sf/a55f582e-1bef-4eac-b401-bf24b8f7e1c8.shtml#sthash.6RCIN6uu.dpuf
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Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Product
2D Far-Field Analysis of Infrared Emitters
VTC 2400
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Instrument Systems Optische Messtechnik GmbH
The VTC 2400 is a high-resolution infrared-camera that was developed specially for 2D-far-field analysis of the radiant intensity distribution of VCSELs and IR emitters. The measurement system consists of a light-permeable screen and a monochrome camera specialized for measurements in the near infrared range.
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Product
Shortwave Infrared Camera Core
Tau® SWIR
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FLIR Tau® SWIR provides outstanding short-wave infrared image quality and performance over a wide range of imaging and light level conditions. It is the ideal OEM SWIR imaging module for applications like hyperspectral instrumentation, silicon inspection, electro-optical payloads, art restoration, and portable imaging. The Tau SWIR camera incorporates the FLIR high resolution 640×512 ISC1202 Indium Gallium Arsenide (InGaAs) 15-micron pitch focal plane array (FPA) and includes several advanced camera controls features.
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Electron Microscope Analyzer
QUANTAX EDS for TEM
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Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
Modular Infinity Microscope (MIM)
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Confocal Raman Microscope
LabRAM HR Evolution
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The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Infrared Simulation Services
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INO offers a simulation service to assist with the hardware and software design of infrared and electro-optical devices. Precise performance predictions help integrators understand application requirements and bring application performance in line with client specificationsbefore the advance design and fabrication phases. For a minimal investment, infrared simulations help minimize risk in the early stages of development.
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Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Scanning Kelvin Probe Microscope
VS-SKP
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The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Product
Open Path Infrared Gas Detector
IR5500
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The IR5500 is an open path infrared (IR) gas detector that continuously monitors for flammable gas leaks over large open areas. It monitors in both the LEL-m and ppm-m ranges to detect both small and large leaks. The IR5500 offers the benefits of early detection with its high sensitivity to gas concentrations at the ppm levels.
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High-end Transmission Electron Microscope
CryoARM
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JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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OMNIR: On-Line Near Infrared Sensor
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OMNIR is the future of near infrared moisture sensing technology. Coming from OMNI, meaning “all” and NIR, meaning “near infrared,” Finna Sensors has created an intelligent all-sensing solution that exceeds expectations. It not only delivers accurate data instantaneously and non-destructively, it also monitors its own health to perform its best during your crucial processing moments. By selectively harnessing light, to ensure increased uptime and greater profitability for your operation, the future of your manufacturing operation starts now.
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Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Compact Infrared Thermometer With Laser Targeting
PIRT25
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Unique Flat SurfaceMini-Modern Housing DesignSimple One-Handed OperationLaser TargetingLCD With BacklightCelsius or Fahrenheit ModesLaser On/Off SwitchAutomatic Power OffDisplay Hold FunctionMax/Min FunctionTemperature Range: -50 to 380 Celsius, -58 to 716 FahrenheitTemperature Resolution: 0.1Emissivity: Fixed at 0.95Optical Resolution: 8:1 Distance to Spot Size RatioBasic Accuracy: +2% of Reading or +2 C / +4 FResponse Time: <1 Sec.Diode Laser: Output <1mW @ 630-630nm, Class 11 LaserSpectral Response: 6-14umPower Supply: 9V BatteryDimensions: 7.09' H x 3.94' W x 1.81' DWeight: 5.6 oz.
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Visible / Infrared / Imaging Test System
System 1808
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Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Infrared Combustible Gas Detector
SMC 4101-28
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The SMC 4101-28 IR Gas Detector is a ruggedized instrument designed specifically for monitoring methane in high-vibration environments.
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Digital Infrared Thermometer
IR-203
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Shenzhen Calibeur Industries Co., Ltd..
'- Range:-50℃ ～ 550℃;'- Accuracy: ±2% or ±2℃; '- Distance Spot Ratio: 10:1; '- ℃ / ℉ exchange;'- Max / min function;'- Automatic Data Hold and Auto Power off'- Laser Targeting Function'- Size:18.5*12CM'- Weight:0.22KG'- Power:6F22 9V(not included)
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Infrared Temperature Converter
TF Series
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TF series, infrared temperature converters provide non-cotact measurement to caculate the surface temperature of the objects by measuring the energy of infrared light. So It is convenient to measure the surface temperature of especially moving objects. Its stainless case with integrated design combining sensors, optical system, and electronic circuits. It is easy to install by connecting the screw with other devices, and TF can be used in a wide range of industries.
