ATE
ATE systems are used to test semiconductor devices, printed circuit boards, and electronic systems during manufacturing. AI prompted RL created', prevails upon the UUT to demonstrate It's fulfillment of test requirements.
See Also: Automatic Test Equipment, ATS, Functional ATE, Combinational ATE, Semiconductor Test, PXI Switching, PXI Chassis, PXI Matrix, Automated Test Equipment, Automated Test Systems
-
Product
RFIC ATE System
RI 7100A
-
The RI 7100A, which RI has shipped for over 10 years, has proven itself as the most advanced, reliable (> 4500 hours MTBF) and cost effective RFIC ATE System available. "Our recipe for high performance microwave test has always been dependent on an extremely elegant RF signal path while maintaining the most advanced microwave calibration software," said RI President, Mark Roos.
-
Product
ATE Solutions
-
Our custom, application-specific ATE Test Solutions offer a full test suite with Test Systems hardware, software, and support services.
-
Product
Docking / ATE
-
The iDock Series is a series of connectors ideal for use with automatic machine handlers in production testing. Floating bushings allow up to .04" of re-alignment. Use with a combination of various I/O modules and a max of 5,952 signal contacts simultaneously. The iDock series is rated up to 100,000 cycles.
-
Product
ATE Products
-
Microtest ATE portfolio presents special patented solutions to reduce the cost of test.Our innovative ATE offers high multi-site efficiency, zero footprint and lower power consumption.We’re able to drastically reduce the engineering phase time also for special solutions tailored on customers’ needs.
-
-
Product
Solar ATE
MS 1534
-
The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.
-
Product
ATE Support
-
For the last 30 years, Terotest has offered a range of support services, from standard maintenance and calibration to ATE updates and legacy ATE replacement solutions.We provide, repair and exchange ATE modules, fixtures, adaptors and other hardware, as well as offering full maintenance contracts to our customers.
-
Product
RF ATE Tester
ADIVIC MP5800/MP5806
-
MP5800 seamlessly upgrades your existing Chroma 3380, 3650 to RF ready ATE test solution, user friendly debug tools, IOT turnkey test solution.
-
Product
Automatic Test Equipment (ATE) Module Products
-
Automatic Test Equipment (ATE) Module Products by ADSYS
-
Product
Automated Discrete Semiconductor Tester (ATE)
5000E
-
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
-
Product
ATE Integration
-
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
-
Product
Aerospace & Defense ATE Systems and Services
-
TE solution design, development, and integrationMeasurement / Test Process analysis and consultationEasy-to-use software interfaces for Engineers and UsersFactory automation for test processesAll major instrument brands available & supported
-
-
Product
Small Footprint Flex 20 ATE
Flex 20
-
The Flex 20 is floor mounted but maintains a small footprint on the shop floor. A VPC S6 interface is normally used on this system allowing multiple test fixtures to be used with the system.
-
Product
ATE / Bench Calibrators & Multimeters
-
Time Electronics offer a range of precision calibrators and digital multimeters that can be used in the lab or in automated testing applications. These programmable instruments are designed for precision, performance, and functionality, making them ideal for automatic testing and fault diagnosis. Each designated ATE calibrator is rack mountable for straightforward integration into user systems.
-
Product
Custom ATE Solutions
-
ATEC Matrix Corporation can be your one-stop provider of complete turn-key ATE Systems. With over 15 years in ATE Design, Development and implementation we have the expertise and experience to work with you efficiently to provide whatever level of solution your program requires.
-
Product
Pattern Converter for WGL/STIL to ATE
VectorPort
-
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
-
Product
Pin Electronics (PE)/ Pin Drivers ATE
-
Analog Devices integrated pin electronics (PE) support speeds up to 2.5Gbps at high accuracy and low power, all manufactured on ADI's proprietary fab processes, providing unmatched test solutions needed for cost-sensitive, test applications.
-
Product
ATE Connecting Solutions
-
C.C.P. Contact Probes Co., LTD.
Customized pogo towers with high frequency capability.
-
Product
High Performance VXI Chassis for Military ATE Systems
1261B Series
Chassis
The 1261B high-performance VXI chassis serves as the standard for most military ATE systems. All 1261B chassis include full-power protection features such as overvoltage and overcurrent protection, and also incorporate a quick-check diagnostic connector to verify performance of power supply voltages, currents and specific VXI signals.
-
Product
Obsolescence Solutions for Legacy ATE
-
Our obsolescence solutions, products, and services are used by the DOD and all major Mil/Aero companies to extend the life of their legacy ATE.
-
Product
Inbuilt External Controller ATE with Touch Screen Features
QT 200NXT
External Controller
Qmax Test Technologies Pvt. Ltd.
QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software. The vast library support helps you to functionally test host of different IC families. Other features like user-friendly Windows based software, add-on utilities like oscilloscope, RCV meter circuit tracer, etc. makes it a favorite and makes very effective for repairing PCBs without schematic/ circuit diagrams. All these tests are carried out using simple BUT Interface like multipin test clips, probes or custom test fixture
-
Product
Satellite ATE
MS 1123
-
Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
-
Product
Link simulation to ATE conversion
VCD2ATE
-
VCD2ATECost effective link simulation to ATE conversionDirect conversion from event driven design simulation dump (VCD/EVCD) to specific tester program files. VCD/eVCD to tester conversion Simple and cost effective conversion solution Simple cycle definition in excel High Performance Fast run time Handles very large files >6Gb
-
Product
Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
-
Product
ATE Self Test Fixtures
AL663
Test Fixture
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
-
Product
Generic RF ATE Test
-
The Generic RF ATE is developed to test the Radar and Radar Subsystems. The ATE is primarily built using an instrumentation control, precision RF routing systems and rack mounted test instruments. Generic RF ATE system enables measurement of parameters of Radar equipment such as Local Oscillators, Waveform Generators, Up and Down Converters, Analog Receivers, Array Group Receiver Units, TR Modules. The ATE is configured to test the Radars upto 18GHz frequency range.
-
Product
ATE For Data Communications Equipment
-
• Developed for DRS Codem Systems, Inc. to test the CTM-IP product line of the Multi-Interface Protocol Converter.• Manufacturing Test support for the CTM-IP chassis and Interface Modules. Functional test of signaling, protocol and software configurations for various communication interface configurations.• Regression Test support for Engineering Product Development. Configurable test sequencing allows engineer to select specific tests for execution, with the ability to exercise all combinations of data rates and interface configurations.
-
Product
RWR ATE MKII
MS 1111
-
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
-
Product
Automated Discrete Semiconductor Tester (ATE)
5300HX
-
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
