Test Adapters
See Also: Interface Test Adapters
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SD Express
SCHILLER AUTOMATION GmbH & Co. KG
The Standard SD Express Memory Card Test Adapters support PCIe® 16 GT/s (Gen4) and PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD8.0 and SD7.1. Minimal crosstalk, short trace lengths. The Micro SD Express Memory Card Test Adapters supports PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD7.1. Minimal crosstalk, short trace lengths. They all support SDHC, SDXC, and SDUC operation modes Data collection via Lab Standard SSMP Test Cables and hard gold mating surface allow for high cycle count insertions and reliable performance.
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SM / Expansion Unit
A testing procedure designed to thoroughly test the electrical characteristics of a wire or cable, may require additional test points to connect the end points of all conductive paths. The changing and alteration of Test Adapter Cables (TACs) would become obsolete when having access to one or several expansion units. Increased testing efficiency alleviates the long, drawn out down times of the disabled aircraft while improving product readiness. Additional time can be spent on troubleshooting and problem identification and will not require the user to unhook and connect TACs to different matrices. Adding additional expansion units will save the user time, money, and effort.
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Pneumatic Test Adapter
Pneumatic test adapters from INGUN are particularly suitable for contacting medium-sized electronic assemblies (series testing) and a large number of variants. The test adapters are designed as a replacement kit system, are connected to an existing test system and operated with replacement kits that are specially designed for the electronic assembly to be tested.
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Test Adapter
Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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Test Adapter
FECVF1600
Frothingham Electronics Corporation
The VF1600 Test Station is a high current forward pulser designed to be used in conjunction with our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of much higher forward current. The VF1600 station can produce a maximum current of 1600A at up to 5V using an 8.3 mS half sine waveform at the built in test station, and THETA and DVF tests at up to 500A at 10mS pulse width. It is derated for wider pulses. For rectangular VF pulses at 300us or 1ms, it can produce up to 2000A. The station can also test all of the usual FEC200 tests in the same test program.
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(ITA), Breakout Box & Fixtures
WinSoft provides a wide range of Interface Test Adapters (ITA) and test fixtures to meet the most challenging functional test and signal conditioning requirements. This includes high frequencies, voltages and current.
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K-Base Test Board Adapter
1180
The TESCO K-Base Test Board Adapter allow quick, convenient testing of self-contained K-Base meters on test boards designed for socket type meters. The K-Base Test Board Adapters are designed for single phase (Catalog No. 1180-2) and polyphase (Catalog No. 1180-4).
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Test Adapter
cPCI/VME/VME64x
The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.
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Test Adapter
RAMCHECK® SIMM
The RAMCHECK SIMM Adapter is another addition to the RAMCHECK memory tester. It provides a needed solution for testing older 72-pin EDO/FPM DRAM SIMM modules. An optional adapter for 30 and 72-pin SIMMs is also available
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Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Automatic Test Equipment, Test Interface Units and Test Program Sets
Axis Aerospace & Technologies Ltd.
AXISCADES is a pioneer in Test Solutions and has a long pedigree in developing Test Systems. AXISCADES has designed and developed Automatic Test Equipment, Test Interface Units/Interface Test Adapters and associated Test Program Set Software for Indian and Global, Aerospace and Defence OEMs and End Users.
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RF/Microwave ATE Systems
Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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NI HIL and Real-Time Test Software Suite
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
510140141-1
PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
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Explosive Test Site Range Instrumentation
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Infotainment Test for Automotive Applications
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
510140125-1
PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
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PXI Pull-Thru Adapter, Wired, QuadraPaddle, 68-Pin Male VHDCI
510140132-1
PXI Pull-Thru Adapter, Wired, QuadraPaddle, 68-Pin Male VHDCI
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PCB Adapter, Receiver, SIM, VTAC, 96 Pos, 14 Slot, to (1) 12x InfiniBand
510170108
A small, modular PCB board that connects high speed digital inserts (VTAC) to a single 12x InfiniBand connector. Great for COTS cable configurations. Compatible with all VTAC/SIM receiver modules.
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Imperial Test Executive
ITE
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Interconnect Adapter, C-Size, Double Slot, 4 Module Positions
510109118
Interconnect Adapters funnel wiring from modules to a VXI card. The adapter has removable side, top and bottom plates. Connector cover plates and cable clamps are ordered separately.
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ITA 192-Pin PCB Adapter to 3x IDC 64
YAV90Q06
3x 2 IDC 64 x 1000mmCables set J6200560 (Order Separately)
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Scienlab Battery Test System — Cell Level
SL1002A
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
