Spectroscopy
The use of the absorption, emission, or scattering of electromagnetic radiation by atoms or molecules (or atomic or molecular ions) to qualitatively or quantitatively study the atoms or molecules, or to study physical processes. Virginia Tech
See Also: Dissolved Gas, Terahertz
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FTIR Gas Analyzers
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FTIR Spectroscopy gas analyzer instruments from MKS Instruments are capable of ppb to ppm sensitivity for multiple gas species in a variety of gas analysis applications, such as toxic gas detection, automotive emissions measurement, and monitoring stack emissions, processes, ambient air, purity, and selective catalytic reduction performance.
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Microwave Plasma Atomic Emission Spectroscopy / MP-AES Systems
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Agilent’s industry-leading microwave plasma-atomic emission spectrometer (MP-AES) systems are powerful, cost-efficient and easy-to-use for a wide range of applications from routine analysis to complex precious metals analysis. By running on air, Agilent MP-AES systems both cost less and are safer than alternative methods that rely on flammable gases. The innovative Agilent 4210 MP-AES system offers higher sensitivity and faster throughput capabilities than flame atomic absorption.
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Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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TeraSys12®
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The TeraSys12® is the ultimate solution for real time, THz imaging and spectroscopy. It is a compact terahertz instrument addressing: sensing, detection, analysis and processing methods at terahertz (THz) frequencies in real time. It is based on organic crystals to allow access to terahertz frequencies up to 12 THz not available with conventional antennas.
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IR Emitters and Controllers
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Opto Diode manufactures five families of infrared emitters that are used for a variety of medical and industrial applications, including gas analysis, environmental monitoring, spectroscopy, and process control. From the steady state (DC) emitters (SA Series), to high-power steady state emitters (SHA Series), to pulsable sources of black-body radiation (SVF Series) and fast pulsable sources of black-body radiation (SPF Series), to high-speed IR emitters with integrated drive electronics (PIREPLUS), we have the perfect family of products for your critical requirements.
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Scanning Electron Microscopy (SEM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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In Situ Diagnostics
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For researchers working on ultra thin films and novel interfaces, Neocera offers insitu, real-time process control and diagnostic tools such as high-pressure RHEED, Low Angle X-ray Spectroscopy (LAXS) and Ion Energy Spectroscopy (IES). RHEED provides exceptional growth control via RHEED intensity oscillations and the Structural data via diffraction. LAXS is a complimentary to RHEED and provides real-time Compositional information. IES provides energetics of the laser generated plasma plume which is directly responsible for obtaining high quality films and interfaces.
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Scanning Probe Microscopy
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Photoemission And Surface Photovoltage Spectroscopy
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KP Technology have developed a range of modules that feature surface photovoltage and photoemission spectroscopy capabilities.
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Terahertz Time Domain Solutions
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The Menlo Terahertz product portfolio (THz, also known as millimeter waves) covers time domain solutions in traditional pump-probe configurations, as well as solutions for imaging. The products for the time domain are ideally suited for fingerprint spectroscopy whereas the imaging instruments find their use in quality control and inspection.
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Surface Photovoltage
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The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes.
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Blazed Holographic Plane Gratings
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.A blazed holographic plane grating is the choice for high resolution spectroscopy and applications where high efficiency, low stray light levels are of high importance.
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CiCi-Raman-NIR Spectrometer
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HORIBA Scientific is the world leader in Raman spectroscopy, with a long history in the technique. HORIBA OEM has pioneered Raman systems for spectroscopy, designing and manufacturing them for over four decades. We provide miniature spectrometers and systems for industrial applications such as process control, security, pharmaceutical, medical and semiconductor. The CiCi-Raman-785 is our high performance spectrometer featuring an aberration-corrected concave holographic grating configured with Horiba Scientific's Syncerity™ TE-cooled CCD camera with a VIS-NIR 2048 x 70 detector, in a TE-cooled Head at -50° C.
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Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Material Identification Spectroscopy
ChipCHECK
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Gastops specializes in advanced fluid sensing and analysis systems specifically designed and developed for critical equipment condition monitoring applications. ChipCHECK offers the fastest way of making on-site equipment maintenance decisions. It is a field deployable analyzer designed for rapid on-site identification of equipment lube oil. This automated maintenance decision-support tool employs innovative laser spectroscopic technology, which enables on-site analysis of microscopic chip debris. ChipCHECK provides the maintainers with quick, reliable, and conclusive information, including the total number of particles, and the size, shape, and specific alloy classification for each individual particle on the sample.
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Electron Spectrometers
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SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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Ambient Pressure Photoemission Spectroscopy
APS
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The Ambient Pressure Photoemission Spectroscopy (APS) systems are KP Technology's newest addition to our large surface analysis range. The dual-mode APS systems measure the absolute work function of a material by photoemission in air, no vacuum is required. These systems hold domestic and international patents.
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Spectrophotometer - Spectrometer
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Spectroscopy has a wide area of application in many fields. Spectroscopy is based on the concept of Energy = frequency x Planck (E=ʎh) constant which is used to study matter. Spectrometry is the technique which is used to analyze the concentration of elements in the sample being tested. Our products are able to analyze carbon, aluminum, sulfur, gold, silver, magnesium, steel, alloys and many other elements. We can also calibrate our products to account for elements like oxygen which are present in many compounds by calibrating with a known sample.
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LIBS Analyzer
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LIBS is a type of optical emission spectroscopy used to measure elemental concentrations in a material.
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Tunable Diode Laser Absorption Spectroscopy
5100HD TDLAS
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Using tunable diode laser absorption spectroscopy (TDLAS) technology, the 5100HD can be configured with one or two absorption cells, providing dual stream analysis and/or the measurement of multiple analytes at the same time.
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Versatile Hyperspectral Cathodoluminescence
H-CLUE
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The H-CLUE direct coupled solution offers the ultimate performance for Cathodoluminescence Imaging and Spectroscopy analysis.Embedding field-proven optical components of HORIBA Scientific, H-CLUE overcomes its competition in terms of sensitivity over wide spectral ranges from FUV to extended NIR.
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Analysis System
Pegasus (EDS-EBSD)
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The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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IDE Sensors & Interdigitated Electrodes
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PotentioLab interdigitated electrodes and IDE chips are designed for impedance spectroscopy, sensing, thin-film evaluation and microelectrode research. Options include gold IDE chips, quartz or ceramic substrates and practical laboratory connection formats.
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Fiber Pigtailed Tapered Amplifier
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The AOSense tapered amplifier (TA) provides a coherent high-power beam, inheriting all properties from the seed source. TA’s are an essential optical component for quantum sciences, such as laser cooling and trapping, cold atom sensors, electromagnetically induced transparency, and quantum spectroscopy. The TA is also used in commercial laser modules, including master oscillator power amplifier (MOPA) lasers and external cavity lasers.
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Electron Multipliers
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Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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CAPS True NO2-NOX-NO Analyzer
Model N500
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Teledyne Advanced Pollution Instrumentation
The Model N500 CAPS NOx analyzer uses superior Cavity Attenuated Phase Shift (CAPS) Spectroscopy to measure True NO2, NOx, and NO gases. The instrument combines direct NO2 measurements with highly efficient gas phase titration (GPT) to convert and measure the NO gas component. An automatic baseline reference cycle accounts and compensates for any potential baseline drift due to varying environmental conditions.
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Infrared, Near Infrared and Raman Spectroscopy
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rom the very compact FTIR spectrometer to the world’s highest resolution: Bruker offers the industry's largest selection for demanding routine and High End FTIR research application including the new and unique verTera cw THz functionality.Process monitoring with FTIR / FT-NIR process spectrometers.A complete line of Near Infrared Spectrometers to fit all your needs, including Process Monitoring.FTIR Microscopy and Raman Microscopy and Spectral Imaging for high sensitivity at high spatial resolution.High spectral resolution, high performance Raman and FT-Raman spectrometers for advanced routine solutions.FTIR Gas Analyzers for the fully automated and high precision real-time monitoring of gas compoundsImaging Remote Sensing systems for analysis of gases, liquids and solids.CryoSAS semiconductor material quality control for photovoltaic and electronics industry.OPUS, the "all-in-one" IR and Raman spectroscopy software consists of a suite of software packages that cover both standard and specialized applications.ONET, software for the setup, administration and control of large FT-NIR spectrometer networks.
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NanoSpectralyzer
NS1
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ANF offers the NS1 NanoSpectralyzer®, a unique automated fluorimetric analyzer based on the most advanced research in nanotube spectroscopy. This patent-pending instrument combines a specialized optical system with custom software to enable efficient, turn-key analyses of bulk SWNT samples. The NS1 NanoSpectralyzer is valuable for tuning the process conditions in SWNT growth reactors, for quality control, for guiding nanotube sorting and separation methods, and for a wide range of research applications that require detailed compositional data on a rapid time scale.
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Versatile AFM Optical Coupling
TRIOS
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The TRIOS platform is an advanced research instrument that provides the entry path for researchers in materials science, biology, spectroscopy and photonics. TRIOS is the most versatile optical coupling platform providing three ports for optical spectroscopy measurements with top-down, side (oblique) and inverted accesses to the AFM tip and sample.If you work with opaque and/or transparent samples, either in air or in liquid looking at nanoscale structures and near-field optical properties investigation, the TRIOS platform is the right solution for you. It perfectly combines upright optical, inverted optical, and atomic force microscopies, and unleash all the power of both techniques providing instrument adjustment and measurement automation, high resolution and integration flexibility. Such performance is only available from HORIBA.
