Fuse Test
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Product
Functional Test
cUTS
Functional Test
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
80 AMP FUSE BUDDY TESTER
FB315
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*Tests circuit current from 0 to 80A*Includes 20A maxi fuse for use with mini and ATC circuit testing*Resolution: .1A (100 mA)
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Product
Fuse Saver Standard Kit
#8005
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Innovative Products of America
The Fuse Saver provides a fast and safe solution to the old methods of "smoke testing" a short. This all inclusive kit includes a durable custom blow molded case. With the Fuse Saver you can move about your vehicle while checking for shorts in the electrical system.
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Product
1310nm/1550nm Fused Biconical Taper WDM
SWD1315
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Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai SWD1315 single mode DWDM adopt fused bi-conical taper technical with low insertion loss, channel flatness features. Mainly used in optical network 1310nm and 1550nm combination and halve.
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Product
FUSE BUDDY PRO TEST KIT
FB310K
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*Tests circuit current from 0 to 30A*Checks blower motor and fuel pump amperage draws and performs current readings on A/C compressors that are not easily accessible*Features three interchangeable test functions: 30A ATC fuse, 30A mini fuse and 30A all purpose
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Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
Fused Imagers
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Fused imagers (fusion multi-sensor imaging systems) offer increased surveillance capabilities due to fusion of classical thermal image with classical visible image. The fusion systems are typically built by combining optically images from thermal imager and classical night vision device, or by combining digitally images from thermal imager and digital night vision devices (or electronic VIS-NIR camera).
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
Polarization Maintaining Fused Wavelength Division Multiplexer (
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Zhongke Rayzer Optical Technology Co.,Ltd
Polarization Maintaining Fused WavelengthDivision Multiplexer product, has thecharacteristics of low insertion loss, high handing power, high extinction ratio and double-axis operation. It is mainly used in the fields of polarization-maintaining fiber laser, polarization-maintaining amplifier, polarization-maintainingsensing system and scientific research application.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
Fused Optical Couplers
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Nanning Xionghua Photonics Technology
Fused Optical Coupler by Xionghua Photonics
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Product
HV Test System up to 20000 Volt
Test System
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
Fused Visible & IR Testing
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SBIR offers a visible/NIR/I-Squared/IR target projector that features a fused visible and thermal source capability by combining a MWIR and LWIR differential blackbody source with a visible/NIR integrating source. A beam-combiner allows the thermal energy and the visible energy to be processed simultaneously on the optical centerline of the collimator.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Test Fixture
16047E
Test Fixture
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Product
Fuse Circuit Breaker and Fault Finder
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Shanghai Beha Electronics Co., Ltd.
*is a Fuse and Fault Finder which comprises of two parts: The Receiver and the Transmitter.*Locating and tracing of cables*Finding Circuit Breaker/RCD
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Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
Functional Testing and Test Engineering
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Customer-supplied or developed in-house• Ruggedization of existing (lab-built) fixtures• Co-develop hardware/software• Deployment, implementation, and training• Engineering evaluation tools• Design verification• Medical device evaluation• Manufacturing test systems• Verification test systems• Go/No-go tests• Serialization, recordkeeping, and datalogging• Troubleshooting failed units with other test platforms
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Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
