Sensor Test
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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SoC/Analog Test System
3650-S2
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Differential Sensor, Wide Dynamic Range, 100 MHz
CX1105A
The CX1105A ultra-low noise differential sensor is a dedicated accessory for the CX3300 series and enables dynamic current measurements from 1 μA to 100 A under up to 100 MHz bandwidth with existing shunt resistors on your test board.
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E-Series Average Power Sensor
E9300H
Measure the average power of all modulation formats Wide dynamic range power measurements from -50 dBm to +30 dBm Frequency range 10 MHz to 18 GHzLow SWR for reducing mismatch uncertainty Calibration factors, linearity and temperature compensation data stored in EEPROM Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters
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High Temperature Component Test Fixture
16194A
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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10 MHz – 6 GHz USB Power Sensor
U2001A
U2001A USB power sensor enable fast, simple setup by providing plug-and-play USB connectivity and by eliminating the need for a separate power meter.
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Configurable Functional Test System
ATS-5000
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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10 MHz To 50/53 GHz LAN Wide Dynamic Range Average Power Sensor
L2055XA
The Keysight L2055XA is a fast, accurate and wide dynamic range 10 MHz – 50/53 GHz LAN average power sensor.
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Automated Compliance and Device Characterization Tests
N5990A
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Two-Path Diode Power Sensors
NRP-Z2x1
The R&S®NRP-Z211 two-path diode power sensors combine all key characteristics relevant for their use in production: They are cost-effective, fast, precise and USB-capable. The sensors support the same measurement functions as the R&S®NRPxx‑Z11/R&S®NRP‑Z2x/R&S®NRP‑Z31 three-path diode power sensors and offer the best price/performance ratio in their class.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Power Sensor
8483A
The 8483A diode power sensor measures average power over the frequency range 100 kHz to 2 GHz and power range -30 to +20 dBm (50 dB dynamic range).
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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DC to 120 GHz USB Thermocouple Power Sensor
U8489A
The U8480 Series is the fastest USB thermocouple sensor in the world without compromising the best-in-class linearity of the legacy 8480/N8480 Series thermocouple sensors. The U8489A covers the widest frequency range, DC to 120 GHz.
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10 MHz – 18 GHz USB Power Sensor
U2000B
U2000B USB Power Sensor measures average power over the frequency range 10 MHz to 18 GHz and power range -30 dBm to +44 dBm.
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Electronics Testing Solutions
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Testing Service
CloudTesting™ Service
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Combinational Base Test Platform
6TL24
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid-volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Diode Power Sensor
8481D
The 8481D diode power sensor measures average power over the frequency range 10 MHz to 18 GHz and power range -70 to -20 dBm (50 dB dynamic range).
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Test Fixture
16047E
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Digital Power Meter
66203/66204
Chroma 66203/66204 Power Meters are designed for multiple phase power measurement applications. The wiring mode function allows the user to take accurate power measurements for various wiring modes 1P2W/1P3W/3P3W/3P4W as well as providing accurate standard power measurements common for most electrical devices. A unique feature of the 66203/66204 is its stateof- the-art DSP digitizing technology instead of less accurate and slower traditional analog circuits. The internal 16 bits analog/digital converters with sampling rates of up to 250kHz provide both high speed and high accuracy measurements which is unprecedented within the industry for this class of power meters. The instruments include a four part display with 7-segment LED front panel readouts. Users can easily select desired parameters and readouts with a touch of a button. The 66203/66204 meters also include remote control using USB or GPIB interfaces via rear panel connections.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Mini In-Circuit Test System
U9403A
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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E-Series Average Power Sensor
E9304A
Refer to the E9301A for standard power sensor features Low frequency coverage (9 kHz to 6 GHz) for EMC/EMI test applications such as the radiated immunity test (IEC61000-4-3)High sensitivity (-60 to +20 dBm) and fast measurement speed to reduce the time taken to calibrate radiated field uniformity and EMC/EMI test receivers Measure transmitter power and receiver sensitivity at Very Low Frequency (VLF) to microwave frequencies Special option available to 18 GHz Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters
