Test Boards
See Also: Board Test, Testboards, DUT, Extender Boards
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Product
Semiconductor Package Wind Tunnel
WT-100
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Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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Product
Kelvin Test Contactor
nano
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nano Kelvin™ test contactor is a well-established Cantilever Kelvin test contactor with proven performance in the automotive market and further increasing popularity due to the robustness and reliability of the product.Featuring a small imprint area, contact motion decoupled from the test board and simple and cost-efficient test boards.
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Product
Meter Test Station
WECO 8000
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The innovative WECO 8000 Meter Test Station is the first of its kind – a multi-position test board integrating meter qualification and accuracy. This versatile and economic test station is the solution for utilities needing the ability to switch between functional testing and accuracy testing. Separate multi-position test boards are no longer a necessity.
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Product
Development Boards
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Advantech Development boards provide a schematic software & reference to reduce design effort at the development stage. Development Boards have been designed in order to allow customers to verify the functions of COM, text carrier board problems and support COM series. Advantech has designed a Development Board which can be used to test carrier board problems and support COM series, and Qseven, ETX / XTX form factors.
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Product
Board Test Fixture Probes
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Offering a wide range of standard spring contact probes to meet your testing requirements and has long been recognized as the world’s largest probe manufacturer. With over 60 different probe series ranging from 0.02" (0.51 mm) to 0.187" (4.75 mm) pitch with multiple length, travel, ICT, lead free and rotator options, we provide a full portfolio designed for general purpose test on bare boards, loaded printed circuit boards and surface mount assemblies.
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Product
Programming on-chip flash in your processor
XJDirect
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XJDirect is an advanced and innovative method for programming the internal flash of your processor and implementing some aspects of board test through JTAG when traditional boundary scan techniques cannot be used.
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Product
A-Base Test Board Adapter
1182 and 1183
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From time to time, you may find yourself needing to test A-Base meters. Or perhaps you will need to test them for the first time in years as part of a removal project. Well, TESCO can help with the A-Base Test Board Adapter!
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Product
Clamshell Type Mechanical Fixtures
Series 71
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The VP Series 71 dual well mechanical kits provide a solution to printed circuit board testing using the Virginia Panel ITA G12 Interface and the advantage of testing two devices. This can be similar devices, or devices that are used together in a functional test. The VP Series 71 Kits have the same available features and options as the Series 70 Kit and are available with or without the ITA G12 Interface.
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Product
Debug Fixture
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With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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Product
Clamshell Type Mechanical Fixtures
Series 30
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Semco’s GR Series 30 mechanical kits are an inexpensive solution to printed circuit board testing that requires the benefits of GR2270 style (VG) interface compatibility.
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Product
K-Base Test Board Adapter
1180
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The TESCO K-Base Test Board Adapter allow quick, convenient testing of self-contained K-Base meters on test boards designed for socket type meters. The K-Base Test Board Adapters are designed for single phase (Catalog No. 1180-2) and polyphase (Catalog No. 1180-4).
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Product
ARINC-664 Part 7 Test and Simulation Board
EXC-664PCIe
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The EXC-664PCIe board is an ARINC-664 part 7 test and simulation board designed to help integrate avionics suites, and can simulate up to two ARINC-664 P7 End Systems with full dual redundant support for receive and transmit operation. The board also contains room for two standard 4000 modules that can support multiple channels of other avionics communications protocols including MIL-STD-1553, ARINC-429, Serial, Discrete, ARINC-708 and CANbus.
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Product
Printed Circuit Board Testing Solutions
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IES Systems is a turnkey test systems solution provider with 10 years of proven experience in printed circuit board testing solutions. Our experienced engineers design electro/mechanical solutions to interface between your product and our custom designed test instrumentation. We provide a complete solution to your PC board testing needs.
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Product
Backplane Test System
402HV
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Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Product
In-Circuit Test Fixture Design Services
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An integral part of board test is the test fixture. Innovations in board technology may manifest themselves as challenges in test fixture design. Utilizing a creative & systematic design philosophy, Acculogic consistently delivers state of the art solutions for the most complex test interface problems.
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Product
FEA and Strain Gauge Testing
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Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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Product
Test Adapter
cPCI/VME/VME64x
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The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.
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Product
Clamshell Type Mechanical Fixtures
Series 70
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The VP Series 70 Mechanical Test Kits provide a solution to printed circuit board testing using the Virginia Panel ITA G12 Interface.
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Product
Spring Probe For Testing Bare Board And/or PCB
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You can see Spring Probe for testing bare board and PCB here. Standard pitch is from 0.5mm to 3.0mm.
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Product
FPGA Test System
DO-254/CTS
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DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests. The FPGA testing results are captured at-speed and displayed using a simulator waveform viewer for advanced analysis and documentation.
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Product
Test Set
TS® 22
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The TS22 Test Set’s unique built-in one-way amplified speaker provides three audio levels for hands-free listening and use with automated voice response systems. Multiple memories enable storage of nine 18 digit telephone numbers in repertory dialer (speed dialing) for easy access to test boards, the central office and other frequently called numbers. The last number redial feature eliminates the need to re-key your last entry. The TS22 Test Set offers an unbeatable combination of reliability, durability and expanded utility.
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Product
ASA240
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The ASA240 Analog Signature Analyser will assist you in testing, diagnosing and troubleshooting printed circuit boards without powering them (known as ‘power-off testing’).Connected via USB to a compatible PC running our own free software, with the ASA240 you can easily capture, measure and compare known good signatures (from your ‘golden’ board) with signatures from your suspect board. The built-in gate/bias generator (+/-10V, 100ohm source impedance) can be used to help test active components such as SCR’s, opto-couplers, small relays, TRIAC’s etc. An external dual footswitch can be connected to the ASA200 and can be user configured to control various functions.The built switching matrix (40 x 2) is easily configured from the software and maybe used with adaptors (such as DIP or SO) to speed up testing of boards, or maybe connected to a ‘bed-of-nails’ to facilitate rapid testing of boards in production.With the ASA240 we set out to bring the incredibly powerful technique of Analog Signature Analysis to engineers and repair shops at an affordable price.
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Product
Semi-automatic Three-phase kWh Meter Test Bench
SY8310
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Hong Kong Songyang Industrial Ltd.
The new SY8310 series semi-automatic three phase energy meter test board, designed according to International Standard, is a newly developed ideal measuring equipment for energy meters. The equipment can be operated easily through test board button to preset directly all data of meter under test and test process.
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Product
Calibration Pulse Processor
2401
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TESCO’s Calibration Pulse Processor (Catalog No. 2401) adapts to any Next Generation three phase test board to directly calibrate with three independent single phase standards.
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Product
Carrier Boards
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Advantech Development boards provide a schematic software & reference design to reduce efforts needed in development stage. Advantech Development Board can be used to test carrier board problems and support COM series, and Qseven, ETX / XTX form factors.
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Product
Function Tester with Low Number of Channels
UTP 6010 RF
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The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
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Product
Test Extension Boards
XJIO
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The XJIO boards are expansion units that enable you to improve the test coverage for a Unit Under Test (UUT) by verifying the signals right through to the external connections. They will integrate with your XJTAG test system to provide access to otherwise inaccessible areas of your circuit. With a range of digital and analogue I/O pins on the board, you can improve fault isolation, verify power rail levels, and dispense with costly custom test jigs - even for non-JTAG boards.
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Product
CompacFrame Type 39PS, Short VPX Payload Test And Development Platform
Type-39PS
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Elma’s Short VPX CompacFrame platform is designed to accelerate development and test of boards designed to fit a smaller form factor of 3U boards (3U x 100mm deep). Accommodates up to 4-slot OpenVPX or 2 VPX power & ground only backplanes.
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Product
Bypass Diode Thermal Test System
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King Design Industrial Co., Ltd.
* Power: the heating board control panel uses 220V single-phase power.* Power consumption: 1.0KVA, 1000W(Max)* Volt: 220VAC* Current: 4.5A* Heating board: one controller per board* Power rate: room temperature raise to 75°C± 5°C within one minute.* Heating board dimension: 500mm x 1,000mm* 6-sheet electrical heating boards test: used to test the 2,200mm x 2,600mm module. It can be customer-designed.* The length of board power cable and thermal sensor cable shall exceed 3,000mm.* To get uniform heating effect, the electrical board is sandwiched by 2mm aluminum sheets at both sides of board.
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Product
Fault Diagnostics in Power-Off State
QT55
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Qmax Test Technologies Pvt. Ltd.
Signature Method of Testing is also known as VI Trace Characteristics, is a proven fault diagnostics technique in Power-Off state while testing a board. By applying known wave from signal with desired Voltage, Source impedance and Frequency of the stimulus signals, depending upon the test node and its characteristics, a Voltage (V) vs Current (I) graph is plotted and studied.
