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Flash Solar Power Meter
OAI’s Flash Solar Power Meter is a versatile measurement tool used for measuring the irradiance (in Suns) from Flash Solar Simulators. Flash Solar Simulators are commonly used in the production of solar panels. Integrated into the solar cell production line, this meter calibrates the flash solar simulator allowing for constant and repeatable irradiance output. By sampling at speeds up to 4000 Hz, the flash pulse temporal profile can be recorded in the meter’s memory and downloaded to a USB 2.0 port on a PC for further analysis.
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3U VPX Flash Storage Module Carrier
FSM-C
Curtiss-Wright Defense Solutions
The Flash Storage Module Carrier (FSM-C) provides rugged, removable, VITA 48.2 compliant, solid state storage in a 1” pitch, industry standard 3U VPX format. By providing a COTS storage solution, the FSM-C can lower schedule and technical risk for embedded storage applications.
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Flash Photolysis Spectrometer
Vernier Software & Technology, LLC
The Vernier Flash Photolysis Spectrometer is a simple, user-friendly device for demonstrating the fundamental principles of chemical kinetics and photochemistry to undergraduate chemistry students.
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Flash ISP Feature, GTE 10.00p
K8219B
The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
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GB20550-2013 Fluorescent Lamps Initiator Gauge
CX-YGQ
Shenzhen Chuangxin Instruments Co., Ltd.
GB20550-2013 fluorescent lamps initiator gauge
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Flash SATA Disk /SATA2 SLC
FSA 2.5-inch Series
Axiomtek's FSA (Flash SATA Disk) series is a high performance 2.5" flash disk and fully compatible with SATAII standard which make it an ideal replacement for conventional SATA HDD without any driver or system modification. This 2.5" SATAII flash disk is provided with huge capacities up to 256 GB to meet diverse needs of data storage. With the features of high capacity storage, data integrity, anti-vibration and low power consumption, the FSA series is surely a solid solution for expanding an industrial computers memory.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Surface Flash Tester
TF313
TESTEX Testing Equipment Systems Ltd.
Surface Flash Tester. The rapid spread of flame over the surface of the material without ignition of its basic structure, usually applied to pile or fur fabrics. This flammability tester is safe and easy to operate, Swivelling butane burner is traversed across the face of the fabric to determine whether surface flash occurs and to record any damage to the base fabric
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Flash Vs. Scan
A LiDAR system can observe the complete field of view (FOV) at once, called Flash systems. Flash typically works well for short to mid-range (0-100m), and by capturing the complete scene at once also objects with high relative speeds can be detected properly. Another implementation is to focus on a subset of the FOV, consequentially look at the next subsets, until the complete FOV is covered, called Scanning. Scanning can focus the light on the subset instead of the full FOV, and therefore can do object detection at a longer range compared to Flash.
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Flash SATA CFast™ SLC ,MLC
FSC Series
*Compliant with CFast™ 2.0 Standard, Capacity SLC: 2 GB ~ 64 GB, MLC: 4 GB ~ 128 GB*SATAIII interface*Suitable for high demanding applications*Well performed under harsh operating environment and industrial temperatures*Anti-vibration & shock resistance*Support static wear leveling algorithm*S.M.A.R.T. & i-S.M.A.R.T. Supported*Intelligent system for error recovery*Excellent data transfer speed*Extremely low power consumption*High operating reliability & durability*Hardware write protect*Enhanced power cycling management
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3U VPX Flash Storage Module
Curtiss-Wright Defense Solutions
The 3U VPX (VITA 46 and 48.2) Flash Storage Module (FSM) provides high-performance, high-capacity, solid-state SATA storage with AES-256 bit encryption using an Application Specific Integrated Circuit (ASIC) that is FIPS-140-2 validated (Certification #1472). The 1" pitch conduction-cooled solid state storage device utilizes high reliability SLC NAND flash designed for the most demanding application.
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Led Lamps
The range of professional lamps signed HT, to facilitate your work and shed light on your results.
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Automatic Tag Closed Flash Point Tester
LD-LACF-A10
Automatic Tag Closed Flash Point TesterLD-LACF-A10is a highly automated machine with -50°C lowest flash point and simple operations. Used to determine flash point of liquids with viscosity below 5.5 cSt (mm2/s) at 40°C (104°F) or below 9.5 cSt (mm2/s) at 25°C (77°F) and flash point below 93°C (200°F) . Test method is complied with ASTM D56 international standard.
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Industrial Flash & Memory Solutions
Advantech provides a full range of industrial storage module, memory module, and embedded I/O module.
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Flash In Disk-IDE
FID Series
Axiomtek's FID (Flash in Disk-ATA) series is a high performance 2.5 flash disk and fully compatible with IDE standard which make it an ideal replacement for conventional IDE HDD without any driver or system modification. This 2.5 IDE flash disk is provided with huge capacities up to 256GB to meet diverse needs of data storage. With the features of high capacity storage, data integrity, anti-vibration and low power consumption, the FID series is surely a solid solution for expanding an industrial computers memory.
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Cleveland Open Cup Flash Point Tester
SYD'
Chongqing Lushun Scientific & Technological Development Co., Ltd.
The instrument is designed and made as per the National Standard of People's Republic of China GB/T3536-2008 "Test Methods for Flash Point and Fire Point of Petroleum Products (Cleveland Open Cup Method)". It is suitable to determine flash point and fire point of petroleum products and asphalt, excepting fuel oils and petroleum products having open cup flash point lower than 79 C.
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Goniophotometer for Traffic Signal Lamps
LSG-1950S
LSG-1950S is a high automatic test system for luminous intensity distribution of luminaires and can be applied to quality evaluation and quality control for signal luminaires, luminaires for cars, motors, vessels and Retro-reflectors. LSG-1950S system is a goniophotometer which can measure all kinds of lamps and luminaires.• Rotations of test samples around both vertical axis (-90°~+90°) and horizontal axis (-35°~+35°) • Accuracy of angle: 0.1° • Resolution of angle: 0.01° • Photometer detector: CIE class A (standard class) accuracy • All software control, high intellectual faculties and simple operation
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Goniophotometer Test System For Led Lamp
1680A 1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341,the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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Flash Chromatography System for Operation up to 300 psi (20 bar)
CombiFlash NextGen 300
The CombiFlash® NextGen 300 is configurable to your needs. Like the CombiFlash NextGen 300+, active solvent and waste level sensing, along with column air purge, is standard. The system is designed for liquid injections, operating at up to 300 psi (20 bar). Similarly, RFID rack and column read can be added if desired. You determine what your needs are; don’t invest in unused or unwanted features.
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Lamp Cap Temperature Rise Test System
TMP-L
TMP-L is according to IEC60360-1998 and GB2512-2001 (Standard method of measurement of lamp cap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards.
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UV Lamp Weathering Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
Sanwood is a company with professional research and development, sales of Bench-top UV test chamber,Bench-top UV lamp aging test chamber,Bench-top UV weathering test chamber,Bench-top UV aging test chamber,Bench-top UV aging test chamber for 23 years. Ultraviolet light in the sun is a major contributor to the durability of most materials. We use UV lamps to simulate the short-wave ultraviolet portion of sunlight, which produces very little visible or infrared spectral energy. We can choose UV lamps of different wavelengths according to different test requirements, because each lamp has different energy and wavelength in total UV irradiation. Generally, UV lamps can be classified into two types: UVA and UVB.
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Arc Flash Monitoring
Arc fault protection for the fast clearance of arcing faults on BUS bars & within metal clad switchgear & associated cable boxes. The arc is detected using an optical sensor & the signal input to a protection device which alsomonitors the load current on the system.
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Flash Chromatography Columns & Cartridges
RediSep®
A flash chromatography system, no matter the quality, needs superior columns to perform its best. That’s what you get with Teledyne LABS RediSep Flash Columns. Designed for high-capacity purification, RediSep columns are precision-packed for high resolution and reproducibility. They feature a one-piece design with no cumbersome or expensive adapters, valves, barrels, or other accessories. Luer end-fittings provide quick, easy connection to CombiFlash® systems You’ll enjoy fast, easy purification and scale-up from milligrams to tens of grams with RediSep Flash columns.
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Flash SATA Disk /mSATA SATA 3 SLC,MLC
FSA 300 Series
*SATA III (6.0Gb/s) interface*Capacity: SLC 1 GB to 64 GB, MLC 4 GB to 128 GB*iSMART disk health monitoring*Intelligent error recovery system*Write protection security*Anti-vibration mechanical design*Excellent data transfer speed*Zero mechanical interference*JEDEC standard MO-300B dimension
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Programming on-chip flash in your processor
XJDirect
XJDirect is an advanced and innovative method for programming the internal flash of your processor and implementing some aspects of board test through JTAG when traditional boundary scan techniques cannot be used.
