Radio Test Sets
See Also: TPS
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
CT/PT Test Set
PCT200Ai
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PCT200Ai is the CT/PT test set (current transformer analyzer) that can finish various current transformer test of different CT and plus reference testing functions of PT. Compared with PCT200i, its accuracy is higher.
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Product
Loss Test Set, Return Loss Test Set
LTS1315, LTS1315R
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The KD Optics LTS1315 is a combined mains / battery powered laser source and power meter designed to make attenuation testing in the field easy, reliable and most importantly, consistent. The LTS1315R incorporates return loss measurement (RLM) capability with the ability to switch very easily between dBrel and return loss.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M648
Test Platform
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Hipot Test Set
KVLF VLF
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KV Hipot Power Test Equipment Co.,Ltd
Voltage withstand testing is an essential electric test for electric equipment to determine the effective of insulation .
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Aircraft Test Set
CA-2100S-07
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The CA-2100S-07 is a bench mounted, modularized and computer based test set used to service all types of aircraft electronics. It simulates the aircraft environment and replaces a myriad of specialized test fixtures found in the industry.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
Test Instrument
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Oil Test Set
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We are the most reliable manufacturer and exporter of Oil Test Set that is ideal for testing of Breakdown / Withstand Test of Transformer and Circuit Breaker Oil. This test set is manufactured using premium quality raw material under the supervision of versed professionals. Moreover, the offered test set is checked by our quality inspectors on various parameters to ensure its flawlessness at clients' end. Our valuable clients can avail this Oil Test Set from us at competitive prices.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
Battery Management (BMS) Environmental Test System
Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
Test Fixture
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Conductor Damage Test Set
CD-2M
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Is designed to carry out tests specified for Switches used for Domestic and similar applications as included under IS:3854:1997. It is used to ensure that Screwtype terminals of switches are such that they clamp the conductor without causing undue damage to the conductor strands. It is a compact and robust andequipment housed in a bench top enclosure. The CD-2M is motorized to allow easy operation. The Instrument is designed to meet the requirements of IS:3854:1997 and other related specifications.
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Product
Optical Signal Test Set
OST
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The Optical Signal Test Set (OSTS) combines a state of the art optical power meter, a variable attenuator, and a high stability laser source. The unit is able to measure optical signals below -100dBm with 0.001dB resolution at a fraction of the size, power, and cost of competing solutions. Other features include data logging, programmable filtering, and auto calibration. Its small shielded ruggedized package, USB/power interface, and low cost make this unit perfect for lab use or for integration into larger systems.
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Product
CMC test Set Extender
RXB1
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RXB1 extends CMC test sets with 4 additional binary relay outputs. Each binary output channel consists of a normally open ("make") and a normally closed ("break") contact.
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Product
ARINC 818 Tester
Test Platform
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Product
Primary Injection Test Set
T1000
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T1000 primary injection test set is the model featured with light weight and 2 minutes continuous output time at 1000Aac.
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Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Product
Test Sets For Transformer Industries
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Contemporary Test Sets For Transformer Industries are developed to recognize the potentially disastrous current transformer errors. They prevent the primary current from overpowering insulation and short circuits. They are used for developing a testing and maintenance plan for addressing the errors before any failure to save money and time. With these powerful test sets, they are sure to perform saturation testing to test the knee point of a signal by comparing primary and secondary windings.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Walker Test Set
PGA-710B
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A unique electrostatic data analysis device for use with Prostat’s PFK-100 Field meter/Charge Plate Monitor Set.• Records, plots, analyzes and automatically constructs reports of body voltage generation, electrostatic decay, voltageretention, ionizer performance and other static measuring functions.• Creates detailed reports to help determine the risk of equaling or exceeding damaging or hazardous HBM dischargevoltages in static sensitive facilities.• Analyze Footwear & Flooring Combinations: Records personnel walking voltages in accordance with ANSI/ESD STM97.2 Body Voltage measurements as required by ANSI/ESD S 20.20 ESD Program Standard• Other Equipment Applications include voltage generation of chairs, carts and process equipment
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Product
Test Set With Control Unit
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Supreme Instrument Laboratories
Single Phase A.C. High Voltage Test set (BDV Flash Test) suitable for operation on 230 Volts, A.C. 50 Hz., designed for carrying out dielectric test on transformers, electrical switchgears, and installations. It operates on single phase A.C. and provides an output voltage zero to maximum rated voltage.
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Product
PARTIAL DISCHARGE test set
pdnt02
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International Biological Laboratories
This Test Kit is used for non-destructive means of assessing the quality of high voltage transformers, motors, cables etc., which are used in generation & distribution of electric power.
