Scattering
a propagating wave or moving particle's linear trajectory, interrupted by non-uniformity in the medium they move through.
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Turbidity Sensor
The Aanderaa Turbidity sensors detects infra-red light scattered by particles suspended in water.
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Metrology
Rosenberger Hochfrequenztechnik GmbH & Co. KG
Network analyzers are used to measure so-called scatter parameters (S-parameters). These describe the behaviour of electrical components with the help of wave magnitudes. Whether simple cables, filters, amplifiers or complex subsystems, the following applies to all these components: Different loads can have unseen effects on the measured values over time.
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Bending Deflectometers For ISO 178, JIS K 7171, And ASTM D790 Compliant Testing
After tensile testing, flexural tests are the most common strength tests for plastics and other resins. The main standards for plastic flexural (bend) tests are ISO 178, JIS K 7171, and ASTM D790, which require very accurate test systems. These standards include flexural strain measurements using a deflectometer, ranging from micro-strain measurements in the elastic region, the reversible elongation at the beginning of tests, to larger strain measurements in the plastic region. Shimadzu's deflectometers integrate easily into AG-X plus series, AGS-X series, and EZ-X test frames and Trapezium X testing software. Since these deflectometers push up against the specimen from below, the specimen color is not a limiting factor, as can be for laser type non-contact deflectometers. Furthermore, these deflectometers can partially absorb the shock during specimen failure, preventing specimen fragments from scattering.
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Laser Turbidity Meter
HU-200TB-EH
HU-200TB-EH is a laser-type turbidity meter that can measure turbidity of membrane filtered water, etc. with a resolution of 0.0001 degrees. A high-sensitivity turbidty meter with a minimum resolution of 0.0001 degrees at a measurement range of 0.0000 to 2.0000 degrees, which uses a long-lasting semiconductor laser as the light source and employs a transmission 90-degree scattering light method.This is best suited for sensitive measurement of turbidity on surface water.
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Multi-angle Polarized Light Scattering Measurements
LISST-VSF
In-situ measurements of P 11, P12 and P22 elements of scattering Mueller matrix, (P11 is VSF) from 15-150º.VSF (P11) only at small angles, 0.05 to 10º in 32 logarithmic steps in angles.Only two detectors employed with absolute radiant sensitivity (A/W) calibration.Beam attenuation measured with optics similar to our LISST-100X.Roving Eyeball™ optics permit 1-degree resolution in angles between 15 -150º.Sampling rate at 3 seconds per measurement set (involves 3 turns of Roving Eyeball with unpolarized, vertical, and horizontal polarized laser).Daylight rejection by laser modulation.Dynamic range in VSF measurements extended via laser power modulation.Data from small and large angles in a single data stream, including depth and temperature.
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Scattered Light Dust Measuring Devices
The reliable way to detect low dust concentrationsLight scattering by dust particles is a measurement principle that allows even very low concentrations of dust to be detected. Depending on the system-specific requirements, either forward scattering or backward scattering can be used in this context. Both measurement principles return stable and reproducible measurement results, regardless of the gas velocity, humidity, or dust particle charges.
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Logger version 2-D electro-magnetic current meter
INFINITY-EM AEM-USB
Infinity EM is an autonomously deployable EM (electro-magnetic) current meter with a data logger. Due to the principle, the instrument provides high accurate 2-D current measurements in even low scatter fields, where ADVs (Acoustic Doppler Velocimeter) has difficulties. The measurement range is wide from 0 to ± 500 cm s-1. The instrument design is compact (1.0kg in air). Infinity EM allows for current velocity measurements virtually anywhere.
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Non-Contact Beam Profiler
BeamWatch
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
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Air Particulate Counter
CHY002
Using import semiconductor laser tube and import semiconductor photosensitive tube, assure sensitivity and response speed.Using import micropump，assure sampling volume steady，reduce noise.The key component-light scattering sensor obviously eliminate intracorporal stray light, improve SNR, test result more precise and reliable.The light scattering sensor got Chinese patent.Confidence measurement of this instrument，According to GB/T6167-2007 Standard，realize auto estimate clean class, creatively to auto estimate ≤9 location points clean class.1000 records stored, free to check previous data.User can optional PC data analysis software, realize data management.User can choose humidity sensor (optional accessories).Sampling volume display as digit, more intuitive and precise.“Measurement Number”function，realize multipoint management.Lithium battery，more safety，continuous working 6 hours.
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NDT Wedges
Rexolite or perspex wedges incorporate a pyramidal scattering surface with an impedance matched acoustic absorber to minimise internal reflections within the wedge.
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Laser Particle Size Analyzer
Easysizer20
Zhengzhou Nanbei Instrument Equipment Co. Ltd
sysizer20 is the latest product of OMEC in Year 2006 and is highly automated, all the process can be done automatically after setting up initial parameters. Multiple sample feeding systems are available to meet your requirements. Applications：Measure the particle size distribution of powder or latex Principle：Use the principle of laser light scattering to determine particle size distribution.
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Turbidity Meter
TF16-N
The TF16-N is a high precision turbidity meter for installation into pipelines measuring scattered and unscattered light at two independent angles in various liquid process streams. The ratio of scattered to un-scattered light can then be correlated.
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Laboratory And Analysis Systems
High performance UV-VIS-IR spectrophotometer with superb optical performance for the determination of spectral absorption coefficient and spectral effective scattering coefficients
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L-Band Separate Raman Fiber Amplifier
RFA6000
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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Multi-Laser Nanoparticle Tracking Analysis (NTA)
ViewSizer 3000
Exosomes, viruses, and nanoparticles all have wide size distributions which defeat traditional Nanoparticle Tracking Analysis (NTA) analyzers. The ViewSizer 3000 features simultaneous measurement with three lasers to collect the most accurate distribution and concentration information over a wide range of sizes within the same sample. Where the signal from a particle is too bright and saturates the detector from one laser, the software automatically uses data from a lower power laser to ensure the most accurate size and concentration information. On the other hand, when scattering from one laser is too weak for detection, the software uses data from a higher power laser to accurately track the particle.
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Water Treatment Plant Analyzer
Aqualog
Aqualog® is the only instrument to simultaneously measure both absorbance spectra and fluorescence Excitation-Emission Matrices. EEMs are acquired up to a 100 times faster than with other instruments. Dedicated software automates traceable Quinine Sulfate Unit calibration and correction of inner-filter effects and Rayleigh and Raman scattering lines, enabling rapid export to modeling algorithms like PARAFAC.
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Laser Scattering Particle Size Distribution Analyzer
Partica LA-960V2
This latest evolution in the LA series advances scientific knowledge for tomorrow's world through intuitive software, unique accessories, and high performance.The LA-960V2 continues HORIBA's proud tradition of leading the industry with innovative design.
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Application Specific LC System
Reducing Sugar Analysis System
The Nexera reducing sugar analysis system uses Shimadzu’s unique post-column boric acid-arginine fluorescence derivatization method. Unlike the refractive index detectors and evaporative light scattering detectors (ELSD) commonly used for sugar analysis, this system reduces the effects of impurities and offers both high sensitivity and a wide dynamic range. As a result, sugars contained in samples can be analyzed simultaneously, without dilution even when there are significant concentration differences.
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C & L-Band Separate Raman Fiber Amplifier
RFA7000
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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X-Ray Photoelectron Spectrometer
AXIS Supra
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Present Weather Sensors
Bristol Industrial & Research Associates Ltd
Biral forward scatter Present Weather Sensors measure visibility and report precipitation type and intensity. These compact sensors can identify a wide range of precipitation types including drizzle, rain, snow, hail, freezing rain and other forms of frozen precipitation. Precipitation type is reported using a combination of WMO Table 4680 and METAR codes. The range of precipitation types identified varies with sensor model.
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Deep Submersible Particle Size Analyzer
LISST-Deep
The LISST-DEEP instrument obtains in-situmeasurements of particle size distribution,optical transmission, and the opticalvolume scattering function (VSF). Using ared 670nm diode laser and a customsilicon detector, small-angle scatteringfrom suspended particles is sensed at 32specific log-spaced angle ranges. Thismeasurement is post-processed to obtainsediment size distribution, volumeconcentration, optical transmission, andVSF. The electronics and opticalconfiguration in the LISST-DEEP are verysimilar to Sequoia’s workhorse, the LISST-100X. However, because of the extremedifficulty associated with keepingalignment under high pressure, the LISSTDEEPhardware design is radically differentfrom the LISST-100X. This allows theLISST-DEEP to be deployed down to 3000m and obtain reliable measurements ofthe in situ particle size distribution andvolume concentration in waters withoptical transmission up to 98.5%.
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Solar Cell Simulation
Setfos
Easily calculate the short circuit current, open circuit voltage Voc and fill factor with Setfos. Tweak the layer stack and add light scattering layers for enhanced absorption. Optimize for AM1.5 or specific wavelength bandsElectrical IV curvesCurve fitting & parameter extractionAC simulation and transient experiments like photo-CELIVAdvanced device physics: SRH-recombination, excitons, ... Design anti-reflection coatings or transparent cells
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Turbidity Sensors
Turbidity sensors measure the amount of light that is scattered by the suspended solids in water. As the amount of total suspended solids (TSS) in water increases, the water's turbidity level (and cloudiness or haziness) increases. Turbidity sensors are used in river and stream gaging, wastewater and effluent measurements, control instrumentation for settling ponds, sediment transport research, and laboratory measurements.
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Particle & Molecular Size/Charge Analyzers
Zetasizer Range
Instruments in the Zetasizer range are used to measure particle and molecular size from less than a nanometer to several microns using dynamic light scattering; zeta potential and electrophoretic mobility using electrophoretic light scattering; and molecular weight using static light scattering. The Zetasizer system is available in a range of variants, including the new Zetasizer Pro and Ultra. These two new systems offer unprecedented ease-of-use and flexibility, along with empowering user guidance and novel measurement techniques such as MADLS® and Particle Concentration.
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Fiber Fusion Splicer
Shenzhen Sharingtek Communication Co., LTD
Fusion splicing is the act of joining two optical fibers end-to-end. The goal is to fuse the two fibers together in such a way that light passing through the fibers is not scattered or reflected back by the splice, and so that the splice and the region surrounding it are almost as strong as the intact fiber.
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Physical Contact Connectors
Amphenol Fiber Systems International
Physical Contact (PC) connections are characterized by the physical mating of two optical fibers. Precision ceramic ferrules are typically utilized for PC connections. A PC connection is accomplished by terminating the optical fiber into a precision ceramic ferrule. Epoxy is used to affix the fiber into the ferrule. The tip of the ceramic ferrule is polished in a precise manner to ensure that light enters and exits at a known trajectory with little scattering or optical loss. Polishing the terminated ceramic ferrule is a critical process in Physical Contact fiber optic connectors.
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C-Band Separate Raman Fiber Amplifier
RFA5000
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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Network Analyzers
A network analyzer is an instrument used to analyze the properties of electrical networks, especially those properties associated with the reflection and transmission of electrical signals known as scattering parameters (S-parameters). Network analyzers are used mostly at high frequencies; operating frequencies can range from 9 kHz to 110 GHz
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Gloss & Reflectance
Visual appearance can determine a person’s perception of a product. Colour and Gloss are two key parameters that are used to define a product’s overall quality. Perception is subjective, but Elcometer’s range of gloss meters, DOI meters and colour assessment equipment can quantify appearance measurement. The ability of a surface to reflect light without scattering is known as gloss. Using a gloss meter, gloss is measured by directing a constant intensity light beam at a fixed angle to the test surface and then by monitoring the amount of reflected light at the same angle. Different surfaces require different reflective angles.
