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Autocorrelators
From material processing to scientific and medical base research, ultrafast laser systems are used in many areas of their high peak intensity and extremely short pulse width. One relevant area of application is time resolved spectroscopy. The pulse width is a critical factor for the adjustment of these laser systems and the characterization of experiments.
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Broadband VNA Operation To 220 GHz
S93301B
Configure a 220 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs
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Phase Noise Analyzer and VCO Tester
FSPN
The R&S®FSPN phase noise analyzer and VCO tester is designed to provide both very high sensitivity and measurement speed for production and design engineers working in these fields characterizing sources such as synthesizers, VCOs, OCXOs, and DROs. It is the ideal instrument for demanding development and production phase noise and VCO analysis.
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FMC Loopback Test Board
The FMC loopback tester board enables developers and assembly factories to test and characterize the FMC carrier board interfaces. The board features full differential loopbacks on all the FMC high pin count (HPC) connector interfaces including LA, HA, HB, DP and CLK. It also provides a 125MHz transceiver LVDS reference clocks on GBTCLK signals. The FMC loopback board is based on VITA 57 standard with ruggedized conduction or air cooling.
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Automated Optical Inspection
AOI
No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
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Diffuse Reflectance Sphere
DRS100
Mobile displays are used in a variety of ambient lighting environments. The evaluation of mobile displays under diffuse illumination conditions is critical to the understanding of display performance in the real world, as mobile displays are used in a wide range of ambient lighting environments. The DRS100 is purpose-made to completely characterize the diffuse reflectance properties of mobile displays, providing uniform hemispherical illumination.
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Analog Modulation and Frequency-Dependent Measurements
Modern lightwave transmission systems require accurate and repeatable characterization of their optoelectronic, optical and electrical components to guarantee high-speed performance.
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General Purpose Single Axis Accelerometers
Motion of a rigid body can be characterized within six degrees of freedom. Providing mechanical excitation to simulate this motion as may be encountered in the real world can entail a variety of test machines. There are various pound/force vibration shakers for structural testing. Regardless of the apparatus, the goal is always to ensure that the product under test can adequately perform, and reliably survive, in the environment in which it will be deployed, or to which it will be exposed during transport. PCB® accelerometers provide the measurement signals needed to control the vibratory input and to analyze the product’s reaction to such testing.
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IndiRAM CTR With Quantum Characterizer
The IndiRAM CTR Raman/PL system with Quantum Emitter Microscope is a multi-purpose system capable of performing Quantum Emitter Characterization, Raman, Photoluminescence as well as Optical Emission Spectroscopy. The system consists of a Pulse Laser along with a single photon counting module (SPCM), a Pulse Synchronization unit, Motorized Scanning stage and a research grade microscope (Upright or Inverted) for TCSPC measurements. Along with these, it also contains a High throughput Spectrometer with a TE Cooled CCD and an optics box assembly to perform Raman/PL and OES Spectroscopy and Microscopy. obtained after the multiple set of experiments gives the lifetime function.
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LED solar simulators
We offer innovative A + A + A + LED solar simulators for the integration of the production process and for the stand-alone operation in the laboratory or goods receipt. Our LED solar simulators are characterized by maximum repeatability, a long pulse duration and very low maintenance.
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Test Cell System
qCf FC25/100
The quickCONNECTfixture with an active fuel cell area of 25 cm 2 has been an integral part of our product portfolio since 2006. The excellent properties and the patented design of the cellFixture offer enormous advantages in the characterization of cell-internal components for fuel cells and electrolysis.
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Test bench for Infrared Focal Plane Array detectors
BIRD
The BIRD bench enables characterization of any types of Infrared Focal Plane Array (IRFPA) detectors.
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PXI Vector Component Analyzer, 100 kHz to 26.5 GHz
M9815AS
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
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GPC/SEC Data Systems for Enhanced Control and Performance
Agilent GPC/SEC data systems enable powerful control, data acquisition, calculations, and result reporting. For accurate molecular weight analysis and complete polymer and protein characterization, GPC/SEC software provides the functionality required for conventional and advanced GPC/SEC in a simple, powerful, fully integrated package.GPC/SEC software for OpenLAB CDS adds application-specific calibration, data processing, and reporting to your OpenLAB CDS. Cirrus GPC Multi Detector software, an add-on to OpenLAB CDS ChemStation, allows you to process conventional GPC data using a column calibration. Bio-SEC software is a dedicated standalone package for characterisation of proteins and other biomolecules.
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PCI Express 4 CEM Receiver Test Automation
N5991PC4A
The N5991PC4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express 4.0 CEM Add-In Cards and systems
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BGA Sockets
Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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*Divergent Light Measurement
The IS1.5-VIS-FPD-800 & IS1.5-IRG-FPD-800 contain 2 photodiodes: a calibrated photodiode for precise power measurement using Ophir meters and a fast photodiode with integral reverse bias circuit for temporal characterization using third-party instrumentation such as oscilloscopes and spectrum analyzers. Their small, 1.5" internal diameter preserves the temporal shape of pulses down to 3.5 nsec for VIS and 6 nsec for IRG. An SMA fiber optic connector is provided for connection to a spectrometer. The large, 20 mm input aperture allows for wide acceptance angles and long working distances, making these spheres well suited for testing VCSELs and other types of laser.
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Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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Benchtop Research System
The XENON X-1100
The XENON X-1100 is the only low-cost benchtop Pulsed Light system that enables researchers to more easily characterize new processes using XENON’s proven technology.
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Materials Test Systems
An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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LXI Microwave Matrix, 10GHz, Single 8x4 With Loop-Thru
60-750-184-A
The 60-750-184-A is a single 8x4 10GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Precision Current-Voltage Analyzers
The powerful characterization software and integrated SMU of Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into characteristics across a wide range of applications. The Precision Current-Voltage Analyzer Series comprises the following three analyzer families:
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Pass-by Noise System
Vehicle Pass-by Noise TestingA very flexible Pass-by noise test system for characterizing the overall acoustic signature of any vehicle. Our solution brings a simpler, more effective and cheaper way to obtain accurate velocity and acceleration results for the Pass-by Noise test.
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Power, Energy and Disturbance Analysers
Designed for test and maintenance departments working in industrial or administrative buildings, it can be used to obtain a snapshot of the main features characterizing the quality of the electrical network.
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Surface Plasmon Resonance Analysis
Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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X-ray Diffraction (XRD) Instruments
X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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5U 6 slot ATCA backplane
109ATCA506-3013R
The 5U 6 slot ATCA backplane is a 6 slot replicated Mesh with radial IPMB, designed to meet 40Gbps (4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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LXI Microwave Matrix, 20GHz, Single 4x4 With Loop-Thru
60-751-144-A
The 60-751-144-A is a single 4x4 20GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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PXIe-5651, 3.3 GHz RF Signal Generator
PXIe-5651 / 781216-01
PXIe, 3.3 GHz, PXI RF Analog Signal Generator—The PXIe‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Keysight N7800A Test Management Environment (TME) Software
Special recommended calibration options: The N7800A software calculates point-to-point ISO GUM measurement uncertainty. The special “H-series” calibration options in the link below provide lower measurement uncertainties through use of direct comparison to devices directly characterized by NPL or NIST (or another NMI), along with data on a CD for easy import into the N7800A (avoids manual entry). The overall resulting N7800A measurement uncertainty then incorporates this lower device uncertainty in the overall calculated uncertainty. For more information on the special options please view this spreadsheet N7800A Special Calibration Matrix.
