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Earth resistivity meter
16GL-N
Last release of a very popular family of earth resistivity meters, this 16 bits geoelectrical instrument represents a really performing and affordable solution for Vertical Electrical Soundings at medium and great depth. Reliable and lightweight, 16GL-N is characterized by really first-rate performances, even if it remains extremely easy to use. The possibility to download data through USB enables a quick interpretation with the data inversion software. It is recommended, as to exploit its capabilities, to use it in conjunction with one or more P-100-N rechargeable accumulators.
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Dual Blackbody Wide FOV
Dual blackbody, all reflective background IR target projector is used to characterize WFOV IR sensor systems. It features a broadband, 3 to 14 micron range, reflective IR target technology for the most accurate and stable differential targets, controlled background radiance, a 5º FOV with 36º uniform background.
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Multiplexer 2:1 With De-Emphasis 32 Gb/s
M8062A
R&D and test engineers who need to characterize serial interfaces of up to 32.0 Gb/s can use the M8061A 2:1 Multiplexer with optional de-emphasis to extend the rate of J-BERT M8020A and J-BERT N4903B pattern generator. For the most accurate receiver characterization results, the M8061A provides four calibrated de-emphasis taps, which can be extended to eight taps, built-in superposition of level interference and Clock/2 jitter injection. The M8061A is a 2-slot AXIe module that can be controlled via USB from the user interface of J-BERT M8020A as well as N4903B.
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Oil-in-Water Analyzers
The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
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Mux-scrambling Modulator
SFT3394T
Hangzhou Softel Optic Co., Ltd.
SFT3394T is a high performance and cost-effective DVB-T modulator designed by SOFTEL. It has 16 DVB-S/S2 FTA tuner input, 8 groups multiplexing and 8 groups modulating, and supports maximum 512 IP input through GE1 and GE2 port and 8 IP (MPTS) output through GE1 port and 8 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. To meet customers’ various requirements, this device is also equipped with 2 ASI input ports. NDS3394C is also characterized with high integrated level, high performance and low cost. It supports dual power supply (optional). This is very adaptable to newly generation broadcasting system.
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PAM4 Bit Error Rate Tester.
BERT-1102
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
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Open Loop Current Sensor
C03 30A
The C03 offers efficient and precise sensor solutions for direct, alternating and pulsed currents in industrial, commercial and communication systems. It consists of three main components: an accurate, linear Hall sensor with low temperature drift, a flux collector and a transformer. It is characterized by a very low resistance and thus lowers power loss and temperature drift - for optimal performance.
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Membrane Conductivity Testing
Designed for membrane and separator characterization in a liquid environment. Measure resistance, conductivity, permeability, cross-over, and selectivity.
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Scatterometers / Thin Film Metrology Systems
OptiPrime Series
The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Programmable Digital Attenuator
LDA-602EH
The LDA-602EH has a large attenuation range of 120 dB with an exceptional 0.1 dB step size, allowing for both precision and accuracy during fading tests or device characterizations. This attenuator also features a fast 15 us switching speed, an operating temperature from -30oC to 50oC, a maximum RF input of +28 dBm, and is priced at $875. The LDA602-EH operates with a low insertion loss of 9 dB to 6 GHz, an input IP3 of +55 dBm and a typical VSWR of 1.3:1. Easily programmed for ATE applications, the LDA digital attenuators are a cost effective solution whether you are in engineering, the production test lab, or in the field. Units are ROHS compliant and can be used with any PC or laptop computer with USB 2.0 port (or powered USB hub) and Windows operating system. Lab Brick Signal Generators are provided with easy to use Lab Brick GUI software, 32 and 64 bit API DLL files, LabVIEW and Linux compatible drivers.
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OTDR
palmOTDR
The compact palmOTDR now offers even more testing capacities, flexibility and value with combination of 850/1300/1310/1490/1550/1625/1650nm (Mono/double/triple wavelength) OTDR, 1310/1490/1550nm PON Power Meter, Stabilized Laser Source and VFL. The OTDR wavelengths cover the applications of regular end-to-end fiber characterization (1310/1550nm), premise/enterprise LAN testing (850/1300nm), FTTx fiber link construction verification (1490nm) and PON live fiber troubleshooting (1625/1650nm with filter). The integrated PON Power Meter can perform in-service testing of all PON signals (1310/1490/1550nm) on any spot of the network featuring pass-through design and burst mode support. palmOTDR is your ultimate solution to meet various testing requirements of entire fiber network.
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Multi-Surface Profiler
Tropel® FlatMaster® MSP
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
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Arbitrary Waveform Generators
M8100 Series
The M8100 Series arbitrary waveform generators (AWGs) offer a level of versatility that enables you to set up complex real-world signals — whether you need precise signals to characterize the performance of a design or need to stress a device to its limits. From low-observable radar to high-density communications, testing is more realistic with our precision arbitrary waveform generators.
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Broadband VNA Operation To 170 GHz
S93300B
Configure a 170 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs.
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Temperature, Velocity & Pressure Measurement
ATVS-NxT
Advanced Thermal Solutions, Inc.
The ATVS-NxTTM hot wire anemometer is a fully-portable scanner that provides rapid and highly precise of temperature and air velocity measurements for thermally characterizing electronic packages.
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Vector And Scalar Mixer / Converter Measurements
S95083B
The Keysight S95083B measurement software includes the scalar mixer / converter plus phase (SMC+Phase) measurement class. It provides fully calibrated conversion gain / loss, relative phase, and absolute group delay measurements of mixers and converters without the need for reference or calibration mixers. Eliminating the calibration mixer requires a U9391C / F / G comb generator and an external DC power supply. A vector mixer characterization (VMC) is also included for measuring group delay of frequency-converting devices. VMC can be used to characterize a user-supplied calibration mixer.
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PXIe-4139, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit
782856-02
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 20 W of DC power. This module features analog-to-digital … converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Phase Noise Analyzers
The phase noise analyzer portfolio from Rohde & Schwarz offers an affordable, mid-range solution with high sensitivity and fast measurements as well as high-end ultra-high-sensitivity solutions with advanced measurements modes. Ideal for phase noise analysis and VCO tests, the industry-leading solutions enable two-path phase noise analysis with real-time cross correlation and fast VCO characterization with built-in low-noise DC sources. Additionally, high-end signal and spectrum analysis can be added into a single box.
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Field Comm Analyzer
S5800E
S5800E Series Field Comm Analyzer is an economic instrument which is designed specifically for wireless communications field engineers and technicians. S5800E series provide all necessary measurement functions and performance to accurately characterize the signal environment in addition to clearing, detecting, identifying and locating signal interference.
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40 Channel Single-Ended Multiplexer Module for 34970A/34972A
34908A
Use the Keysight 34908A module for the 34970A/34972A Data Acquisition/Switch Unit for the greatest density in common-low applications, such as battery test, component characterization, and benchtop testing. Each module switches 40 one-wire inputs. All two-wire internal measurements except current are supported. The module low connection is isolated from earth and can float up to 300 V.
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ALD For Research & Development
Veeco’s atomic layer deposition research systems are designed by ALD scientists and built for maximum experimental flexibility and value. With universal precursor delivery systems, you can use solid, liquid or gas chemistries in any precursor port. There are many options to choose from including ozone generators, in-situ monitoring and various configurations. As always, our team of ALD scientists are ready to answer your recipe development and film characterization questions. Over 2500 published academic papers feature research performed on our Savannah® thermal ALD system and Fiji® plasma ALD system.
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Vibration Test Technology
These vibration exciters (also called shakers) use permanent magnets and are available as portable and stationary systems for simulating ambient vibration conditions. Robust design ensures a long service life, and typical applications include structure analysis and testing smaller subassemblies. These shakers are characterized by high lateral and axial stiffness and come in lightweight construction as specified by industrial users.
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MXG X-Series RF Analog Signal Generator, 9 kHz to 6 GHz
N5181B
Take your devices & designs to their limit with outstanding hardware performance, including unmatched phase noise & spurious characteristicsDrive power amplifiers & characterize nonlinear behavior with industry-leading output powerThoroughly test receiver performance by simulating complex analog modulation scenarios with multi-function generator capabilityLower your cost of ownership with 3-year cal cycles & comprehensive solutions for self-maintenance
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PXIe-6571, 1-Slot, 100 MVector/s PXI Digital Pattern Instrument
786320-01
1-Slot, 100 MVector/s PXI Digital Pattern Instrument - The PXIe‑6571 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. It also includes debugging tools … like Shmoo, digital scope, and viewers for history RAM, pin states, and system status. The PXIe-6571 requires a chassis with 82 W slot cooling capacity, such as the PXIe-1095.
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Dynamic Image Analysis (DIA)
CAMSIZER
Dynamic Image Analysis (DIA) is a modern high-performance method for the characterization of particle size and particle shape of powders, granules and suspensions. Retsch Technology's optical analyzers CAMSIZER P4 and CAMSIZER X2 are based on this technology, covering a measuring range from 0.8 m to 30 mm.
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TF Analyzer
The TF Analyzer platform is the heart of the modular and flexible measurement systems for the characterization of piezoelectric materials.
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MUX-scrambling Modulator
SFT3316
Hangzhou Softel Optic Co., Ltd.
SFT3316 IP Mux-Scrambling modulator is the latest generational Mux-scrambling-modulating all-in-one device developed by SOFTEL. It has 16 multiplexing channels, 16 scrambling channels and 16 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 16 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is also characterized with high integrated level, high performance and low cost. This is very adaptable to newly generation CATV broadcasting system.
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Low-leakage Switch Matrix Family
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
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Photonic Device Testing
ficonTEC’s series of photonic device testing machines is focused on automated electrical, optical or mixed-signal electro-optical characterization (test-&-qualify) of chips and dies, opto-electronic assembles and integrated devices. Capability includes PIC design validation and device verification.
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Light Simulator
From the review of the scientific development history, reliable and stable artificial light sources have played a very important role in the past century. For example, the artificial solar simulator is an important part of simulating sunlight to ensure accurate performance of PV characterization. With the growth of light sensor applications, more and more requirement of light simulators (or artificial light sources) explored. One of the core technologies of Enlitech is the artificial light sources. We can manipulate different lamp types (short arc lamps, LEDs, filament lamps et. al.) to generate different spectrum-form in different light intensity levels, beam sizes, and wavelength ranges. We have launched different artificial light source products for different applications fields. For instance, SS-X series solar simulators and ILS-30 ambient light simulator are for the PV field, HAAS is highly accurate star light simulator for the space field, and ALS-300 is a general-purpose light source in science research field. These products can not only meet the needs of your application, but also speed up the process of your research or mass-production.
