DAQ Systems
Sense, log and store information.
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Product
Benchtop Communication Test System
ATS3000A
Test System
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
SSD Test Systems
Test System
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
Software (DAQ)
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Configuration and data acquisition software for monitoring and supervision.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
2-Channel DAQ Module
FMC150
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Sundance Multiprocessor Technology Ltd.
The FMC150 is a dual channel ADC and dual channel DAC FMC daughter card. The card provides two 14-bit A/D channels and two 16-bit D/A channels which can be clocked by an internal clock source (optionally locked to an external reference) or an externally supplied sample clock. In addition there is one trigger input for customized sampling control. The FMC150 daughter card is mechanically and electrically compliant to the FMC standard (ANSI/VITA 57.1).
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Product
USB DAQ
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ADLINK USB DAQ modules leverage the expertise of ADLINK's analog design capability, enhancing convenience of data acquisition. Simply plug the ADLINK USB DAQ into a USB port on your computer or notebook for performance equaling or even exceeding that of ADLINK PCI/PCIe DAQ cards, with no need to power down or open the chassis. As well as providing basic voltage measurement, ADLINK USB DAQ modules feature built-in signal conditioning to directly receive measurement from most commonly used sensors, with no need for extra signal processing. From basic testing to high-accuracy measurement, from portable application to industrial automation, the ADLINK USB DAQ series delivers easy, efficient, and accurate measurement every time.
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Product
Configurable Data-Logging System
NI CompactDAQ
Data Acquisition System
This NI CompactDAQ configurable data-logging system includes an NI CompactDAQ controller or chassis, C Series I/O modules, and Chameleon software. It is designed for structural test and monitoring applications with the NI CompactDAQ controller, which includes built-in processing and nonvolatile storage for running Chameleon software and logging data locally. Alternatively, you can choose a USB or Ethernet chassis for a lower cost system that requires an external PC. This system accepts a variety of C Series I/O modules, so you can mix and match microphones, accelerometers, and temperature and bridge-based sensors.
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
VME Data Acquistion System
ADM-31
System
The VME-based ADM31 data acquistion system supports up to 48 differential or up to 96 single-ended analog inputs. The ADM31 control card is an intelligent A/D subsystem master or slave device that controls the analog A/D cards. Up to two A/D cards can be configured with the control card to complete the A/D system.
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Product
LabVIEW Full Development System
System
LabVIEW is engineering software designed specifically for test, measurement, and control applications that require rapid access to hardware and data insights. The LabVIEW Full Development System is recommended to customize your engineering application with advanced inline analysis and control algorithms. For applications that require software engineering tools to develop, debug, and deploy professional applications, consider LabVIEW Professional Development System.
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Product
Smart Sensing Systems
System
The Astronics Smart Aircraft System enables the gathering of information through sensor and IoT technology to help airlines gain the valuable insight needed to increase passenger satisfaction, improve operational efficiency, and lower costs.
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Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
FMV Compression System
daq8580
System
The Daq8580 is designed to address the challenges of processing, transporting and storing full motion video through video encoding, and can interface with a wide variety of analog and digital I/O and process standard video formats up to 1080p30 as well as computer resolutions up to 1600x1200.
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Product
1-Channel DAQ Module
FMC160
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Sundance Multiprocessor Technology Ltd.
The FMC160 provides one 12-bit A/D channel at 3.6Gsps and one 14-bit D/A channel at 5.6Gsps (2.8Gsps direct RF synthesis) clocked by either an internal clock source (optionally locked to an external reference) or an externally supplied sample clock. In addition, a trigger input for customized sampling control is available to users. The FMC160 daughter card is mechanically and electrically compliant to the FMC standard (ANSI/VITA 57.1).
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Product
High-Speed Digitizers and Multichannel DAQ Solutions
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With our high-speed digitizers, we improve your measurement fidelity, signal integrity and measurement throughput, keeping low the total cost of ownership. The entire range includes PCIe, PXIe and AXIe form factors, configurable in single to multichannel solutions. Our products cover several applications in commercial OEM, aerospace & defense, wireless & RF communication and high-energy physics.
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Product
2-Channel DAQ Module
FMC110
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Sundance Multiprocessor Technology Ltd.
The FMC110 is a dual channel ADC and dual channel DAC FMC. The FMC110 provides two channels of 12-bit A/D @ 1 GSPS and two channels of 16-bit D/A @ 1 GSPS enabling simultaneous sampling at a maximum rate of 1 GSPS. The sample clock can be supplied externally through a coax connection or supplied by an internal clock source (optionally locked to an external reference). Additionally a trigger input for customized sampling control is available.
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Product
AIM System Solutions
System
AIM can provide a wide range of customized solutions:*Special-to Type Test Equipment (STTE)*High Level Bus Analysers (HLBA)*Data Acquisition Recording & Simulation Systems*Aircraft Ground Equipment (AGE)*MIL-STD-1760 Weapon Test Sets*Fibre optic MIL-STD-1553 Stub/ARINC429 Link Extension System (FoMIS/FoL)
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Product
4-Channel DAQ Module
FMC176
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Sundance Multiprocessor Technology Ltd.
The FMC176 is a quad channel ADC and dual channel DAC FMC. This daughter card provides four 14-bit A/D channels at 250Msps and two 14-bit D/A channels at 5.6Gsps (2.8Gsps direct RF synthesis) clocked by either an internal clock source (optionally locked to an external reference) or an externally supplied sample clock. In addition, a trigger input for customized sampling control is available to users. The FMC176 daughter card is mechanically and electrically compliant to the FMC standard (ANSI/VITA 57.1).
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Product
Data Acquisition DAQ
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Keysight Technologies has provided data acquisition (DAQ) and switching solutions for more than twenty-five years. We provide data acquisition solutions for electrical, physical, mechanical, acoustic and signal routing applications up to 50GHz.
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Product
Ethernet Multifunction DAQ Device
T4
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USB or Ethernet multifunction DAQ device with up to 12 analog inputs or 16 digital I/O, 2 analog outputs (10-bit), and multiple digital counters/timers. For more information on the T4 take a look at the T4 product announcement news post.
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Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
Systems Certification
System
Project integration offering a complete turnkey solution including design, engineering, FAA and international regulatory certification services and testing, and installation kit manufacturing.
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
High-Speed Signal Recording Systems
System
GaGe has a long history of providing high-speed, real-time signal acquisition, processing, and recording systems on PC-based platforms. This expertise saves customers time and eliminates uncertainties and risks with self-integrated systems.
