Test Platform
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Product
VXI Precision Waveform Synthesizer
3151B
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The Racal Instruments™ 3151B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a singleslot VXIbus format. The 3151B is a greatly improved version of a field-proveninstrument ideal for VXI test stimulus generation. It replaces the 3151A+ and other similar units which were standard on many military and commercial test platforms.
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Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
Benchtop Test System
300 Series Benchtop ATE
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The Circuit Check 300 Series benchtop ATE Test Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 300 Series Benchtop ATE, test procedures can become automatic, with test steps and go/ no-go limits easily programmable in common tabular form. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Product
IL/RL Testing Platform
JW18001
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Shanghai Joinwit Optoelectronic Tech,co.,Ltd
To meet the test requirements of MPO devices, we adopt the JW18001 optical device testing platform,JW1608 No-mandrel IL/RL tester module, JW1606 multi-channel optical switch module and form an integrated solution for MPO testing. The application of No-mandrel technique solves the problem that the multi-core optical device can not be winded and needs fiber matching cream, thereby the testing efficiency of the insertion loss and return loss of the multi-core / ribbon fiber has been greatly improved. At the same time, MPO applications can configure a variety of testing mode, test reports, threshold setting function, so multi-core optical device testing is no longer complicated.
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Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M1288
Test Platform
The SierraNet M1288 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M1288 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M1288 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
Software TEsting Services & Test Automation Services
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Our test automation services help application development and delivery teams. We can help you irrespective of how many or the types of applications you need to test: web applications, mobile applications and even desktop applications. Not only are we innovators in the software testing tools space with our Qsome testing platform, but we also continually enhance software testing best-practices in the software testing services and test automation services we provide to our customers. This dedication to challenge boundaries and deliver better outcomes helps us to help you "outperform your now".
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Product
VXI Single/Dual Channel Arbitrary Waveform Generator
3100M
Waveform Generator
The Astronics Test Systems 3100M Waveform Synthesizer Series combines 300 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3100M is a greatly improved version of a field-proven instrument ideal for VXI test stimulus generation. It replaces one or two of the popular 3152A Precision PLL Waveform Synthesizers, which are standard on many military and commercial test platforms.
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Product
Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
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32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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Product
test measurement unit
ITC59100 Rg/Qg
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The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.
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Product
Test System Mainframe
ITC59000
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The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Portable, Integrated O-Level Test Platform
Guardian™
Test Platform
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
Stress-Test Platform
Litos
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Litos is an advanced Solar Cell and LED stability lifetime measurement system, operated via Fluxim’s Characterization Suite (CS) software for complete control, data acquisition, and analysis. It has 16, or 32 parallel stressing channels distributed over 4 chambers, each with individual temperature and illumination control.
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Product
Magnum VUx for NAND Protocol Test Enhancement
Magnum VUx
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Teradyne’s Magnum VUx system is a flexible, superset test platform for all NAND and MCP products, both cutting edge UFS 3.0, uMCP, and PCIe Gen 4 mobile and automotive devices, as well as SSD NAND ONFI and Toggle, and legacy NAND products such as UFS 2.1, PCIe Gen 3, e.MMC, and eMCP.
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Product
Ethernet Speed Test Solution
NET-BOX™
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The NET- BOX is an optimized Quality of Experience (QoE) testing platform that offers a low cost, reliable, high performance FPGA-based alternative to expensive high-end laptops often used for enterprise and speed tests. With a multi-test port architecture, with four 1GE, one 2.5GE test and 4 Gbps full line rate capability, the NET-BOX can truly test the limits to verify Quality of Service (QoS) and assure QoE for the ever growing high-speed internet service at and beyond 1 Gbps.
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Product
Test Management Platform
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Comprehensive suite of test management products fosters global project team collaboration, drives down costs, shortens release cycles, and provides real-time visibility into the status and quality of the software projects. Manage all aspects of software quality; integrate with JIRA and various test tools, all within the enterprise. Manage all aspects of software quality; add test management capabilities right inside JIRA.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
ATACTS-Automated
ATS3000A
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The ATS3000A represents the 3rd generation in the evolution of the ATACTS product. The ATS3000A is designed using Astronics' proven Synthetic Instrumentation (SI) architecture, which combines the functions of multiple instruments into a single, software-defined platform. Astronics' Next Generation Synthetic Instrumentation Architecture (NGSIA) provides the user with a complete and compact RF, Analogue and Digital test platform.
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Product
Maxirack - 200 x 60 x 80 cm
OTP2 module no003
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The rack serves as the basic framework for your individually designed test system. Various OTP² modules can be installed in the 200 x 60 x 80 cm rack in order to meet the most varied of test requirements.The modular architecture of the OTP (Open Test Platform) is based on a flexible instrumentation matrix, LXI-based sources and measuring devices, combined with a high-quality transfer interface for connecting the test adapters. The systems can easily be expanded with customer- and application-specific functions. We use standardization to build cost-effective systems that still fit your requirements exactly.
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Product
ATE Self Test Fixtures
AL663
Test Fixture
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Product
In-Circuit Testers
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SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
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Product
Test Automation Platform (TAP)
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The Keysight Test Automation Platform (TAP) provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments.
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Product
JTAG 3rd Party Controller Support
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Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Ethernet Testing Network Performance
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Networked Communication Solutions, LLC
Xena Networks and Veryx Technologies have created an innovative Ethernet test platform that combines Xena’s high performance, wire-speed Ethernet test hardware with Veryx’s broad portfolio of IP & Ethernet functional and conformance test suites. The result: an affordable, high-performance platform for IP & Ethernet load stress, protocol conformance & functional verification testing.
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Product
Electronics Manufacturing Services
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In many cases variability of production and test platforms available restricts production flexibility and may cause bottlenecks in factories. Therefore, standardization of existing test equipment and reusability of fixtures/needle beds in off-line and in-line platforms are essential aspects.
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Product
Sensor Solutions for IoT
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Imec is a reference in the design of ultra-low power electronics, low-power algorithms to increase intelligence and data security, and in all aspects of data science. Our multi-sensor environmental monitoring platform features sensors for temperature, relative humidity, NO2, CO2, VOC (volatile organic compounds), particle matter, ambient light, sound, vibrations and presence detection. Our test platform is suitable for indoor and outdoor air quality monitoring and control, and can be used in smart buildings, smart cities and more.
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Product
Midirack - 120 x 60 x 80 cm
OTP2-Modul-Nr002
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The rack serves as the basic framework for your individually designed test system. Various OTP² modules can be installed in the 120 x 60 x 80 cm rack in order to meet the most varied of test requirements.The modular architecture of the OTP (Open Test Platform) is based on a flexible instrumentation matrix, LXI-based sources and measuring devices, combined with a high-quality transfer interface for connecting the test adapters. The systems can easily be expanded with customer- and application-specific functions. We use standardization to build cost-effective systems that still fit your requirements exactly.
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Product
Cots Boards
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Built in strict adherence to open architecture standards, Data Patterns designs COTS module products which are used in today's rugged applications and automatic test equipment platforms. Open standard form factors include cPCI, FMC & XMC, IP, MM, PCI, PCMCIA, PMC, VME, VPX and VXI.A portfolio of 'Off the Shelf ' products for testing and on-board applications have been developed by Data Patterns. COTS boards developed have been sold to many customers, in India as well as Europe and North America. They are used for system level products such as Automatic Test Equipment, Rugged Military Electronics, etc.Data Patterns focus on building COTS product is to provide the technological capability to develop system level products with very fast run around times. Use of Data Patterns' COTS module in system level products ensures Data Patterns ability to maintain the products for a significantly longer life cycle. The proximity to the system level engineering team with the COTS development team ensures that end applications are delivered faster, enabling a shorter time to market for the customers
