Profile Projectors
Measure the profile of small flat objects or camparison check.
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3U OpenVPX 2-slot Profile BKP3-DIS02-15.2.8-n
65d302-1528-40
3U OpenVPX Backplane 2-slot, VITA 65, Backplane profile BKP3-DIS02-15.2.8-n, payload slot profile SLT3-PAY-1D-14.2.6, payload or peripheral slot profile SLT3-PAY-1D-14.2.6, power connection with M3/M4 power bolts.
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3U OpenVPX 12-slot Profile BKP3-CEN12-15.2.6-n
65c312-1526-40
3U OpenVPX Backplane 12-slot, VITA 65, Backplane profile BKP3-CEN12-15.2.6-n, payload slot profile SLT3-PAY-2F2U-14.2.3, switch slot profile SLT3-SWH-6F6U-14.4.1, power connection with M3/M4 power bolts.
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3U OpenVPX 6 Slot Profile BKP3-DIS06-15.2.14-3
1OVX306SX6-1X11R
Distributed mesh, no expansion plane, 2x control planes, Gbaud rate to 6.25, 3U, 6 Slots.
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Camera Based Beam Profiling
BeamGage
See your beam as never before with BeamGage®. The camera-based beam profiling system consists of a camera and analysis software. Often times, this system will need to be used with beam attenuation or beam sizing accessories, depending on your laser application. The advantage to camera-based beam profiling is the real-time viewing and measuring of a laser’s structure. BeamGage software includes an extensive set of ISO quantitative measurements, features a rich graphical interface, and features its patented UltraCal™ algorithm, providing the industry’s highest accuracy measurements.
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3U OpenVpx 6 Slot Profile BKP-CEN06-15.2.12-3
1OVX306JX3-1X11R
VPX central switch, payload in Slot 1 connected to slot 2, channel Gbaud rate up to 6.25, 3U, 6 Slots.
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Analog Surface Profile Gauge
NOVOTEST LIMIT
Mechanical depth gauge is designed to comply with ASTM D 4417-B, SANS 5772, US Navy NSI 009-32, US Navy PPI 63101-000 for (depending on configuration): measures the peak-to-valley height of a blast cleaned surface; measurement the depth of focal corrosion; measures depth of narrow holes and grooves.
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Digital Surface Profile Gauge
224
Measurement capability to ±5%Can be used in accordance with National and International StandardsTemperature stable measurementsStatistics are calculated and displayed in real timeLive and batch readings graph format for instant analysis
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RF Shielded Test Enclosure, Low Profile
JRE 1618
Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan.
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Backplane Profiling & Inspection System
603d
A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
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EV Profiler Kit V2
Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.
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UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
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Low Profile PCI Express 8-Port
7802ec
The 7802ec low profile PCI Express serial interface provides eight serial ports, each individually field-configurable for RS-422 or RS-485 communications. Each serial port features an ultra high-speed UART, flexible clock prescalar, and large 256-byte Tx/Rx FIFOs allowing the adapter to support the widest range of standard and non-standard baud rates exceeding 1 Mbps. These features make the 7802ec ideal for data-intensive applications that require reliable, ultra-fast throughput rates.
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Non-Contact Beam Profiler
BeamWatch
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
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Dynamic IR Scene Projectors
Mirage™
In 1999, SBIR introduced MIRAGE™, the world’s first integrated Dynamic IR Scene Projection System, designed to support hardware-in-the-loop testing of missile seekers, FLIRs, counter measure simulation and tracking systems. MIRAGE™ is a complete turnkey infrared scene projector that utilizes unique resistive emitter array technology to produce high definition dynamic IR scenes. The original MIRAGE™-1 used a 512 x 511 pixel resistive array emitter capable of frame rates up to 200 Hz. Below is a list outlining the progression of the product line and a list of SBIR’s currently available scene generation systems:
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Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
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3D Optical Profiler
7503
Chroma 7503 uses the technology of white light interfaces to measure and analyze the surface profile of micro-nano structures with sophisticated scanning system and innovative algorithms.
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3U OpenVPX 9 Slot Profile BKP3-CEN09-15.2.11-3
1OVX309LZ3-1X11R
Single star, no expansion or control planes.
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Roundness And Cylindrical Profile Measuring Instruments
We respond to a variety of needs with our lineup including both rotating table types that enable high precision measurement of cylindrical workpieces, and rotating type detectors that handle eccentric or heavy workpieces.
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6U OpenVPX 5 Slot Profile BKP6-DIS05-11.2.16-3
1OVX605MX6-1X01R
VPX mesh, 4 lane Fat Pipe, up to 6.25 Gbps per channel.
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6U OpenVPX 5 Slot Profile BKP6-CEN05-11.2.5-1
1OVX605FX1-1X01R
VPX centralized switch, channel Gbaud rate up to 3.125.
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Low Profile PCI Express 4-Port
7402e
The 7402e low profile PCI Express serial interface provides four serial ports, each individually field-configurable for RS-422 or RS-485 communications. The board uses a 16C954 UART with 128-byte Tx/Rx FIFOs that enables data rates to 921.6K bps for reliable high-speed communications in data intensive applications. This high-performance UART includes 9-bit framing support and is register compatible with legacy 16550 software applications. In addition, the board derives a 62.5 MHz clock from the PCI Express link. This ultra-high speed clock is divided by a flexible 8-bit clock prescalar with 1/8 steps to provide support for the widest range of standard and non-standard baud rates.
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6U OpenVPX 6 Slot Profile BKP6-DIS06-11.2.10-3
1OVX606BX6-1X01R
6U OpenVPX backplane features 6 slots, a distributed mesh data plane topology with a data rate of up to 6.25 Gbaud per channel and a switched control plane topology.
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Rapid Profiling
MIDAS SVP
Suitable for rapid profiling down to 6000m depth, the MIDAS SVP gives the most accurate Sound Velocity Profiles currently possible.
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Beam Profiling System
BeamCheck
BeamCheck is an integrated laser measurement system designed to measure critical laser beam parameters for laser-based additive manufacturing systems BeamCheck includes a CCD camera for spatial measurements and a NIST-traceable power sensor that will provide a complete analysis of the laser power density profile.
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Ice Profiler
Estimate ice forces for design of offshore platforms and operational planningDetermine the extreme thickness of ice for pipeline installationsExamine in detail the underside of sea-iceUnderstand the dynamics and thermodynamics of the sea ice regime for scientific research.Climate change studies
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Non-contact Optical Surface Profiler
VS-OSP
The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
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3U OpenVPX 9 Slot Profile BKP3-CEN09-15.2.17-3
1OVX309KX6-1X11R
Hierarchical star, expansion and control planes, 3U, 9 slots.
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MiniCTD Profiler
The miniCTD has been developed to provide a cost-effective tool for the collection of CTD Profiles, without compromising the quality of the data.
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Sub-Bottom Profilers
ParaSound Series
The ParaSound is the most advanced hull mounted parametric sub-bottom profiler in the market. It utilises the parametric effect to generate a low frequency secondary signal by emitting two primary signals of higher frequencies. In comparison with traditional towed systems the ParaSound family offers very narrow transmission angle and greater positioning accuracy as well as higher operational speed and availability. Our sub-bottom profilers are suitable for operations to depths beyond the continental rise into the abyssal plains and down to the deep ocean trenches.
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Compact Low Profile Load Cell
1000 Series
Compact Low Profile load cells are fully stainless steel, hermetically sealed load cells with a multi-beam internal structure, and fully integrated electronics to provide high level analog or digital outputs. This type of load cell is easy to use for measuring tension or compression loads from 200N (50lb) to 5kN (1000 lb), and is capable of rejecting side forces that would otherwise affect accuracy. This type also offers the user the ability to set the gain and offset (span and zero) electronically, to provide maximum flexibility for the user application.
