Simulation Testing
See Also: Simulation, Simulators, Simulation Software
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Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
4, 8, 16 And 32 ChannelARINC429 Test And Simulation Modulefor PCI Express
APE429-x
Simulator
ARINC429 Test and Simulation modules with 4, 8, 16 or 32 Software programmable Tx/Rx channels plus up to 8 Discrete I/O’s. The APE429-x is a functional replacement for the models API429-x/APX429-x.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
GPS Simulator
ADIVIC MP6220
Simulator
Multi-channel GPS simulator for GPS receiver position fix testIndividual channel is power adjustableSingle channel mode for receiver S/N ratio testTunable power output level from -160dBm to -55dBm
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Product
Tabletop Single Site Test Handler
3111
Test Handler
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
ARINC-429 Module
M4K429RTx
Test Module
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
Single Stream STANAG3910/EFEX Test And Simulation Module for PCI
APXX3910
Simulator
STANAG3910/EFEX Test and Simulation module for PCI with 1 dual redundant HS/LS channel and onboardFibre Optic Front End (FOFE). Easily select between EFAbus and EFEX modes for Tranche II Eurofighter. The APXX3910 is a functional replacementfor model APX3910.
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Product
PXI RTD Simulator Module 18 Channel PT100
40-262-001
Simulator
The 40-262 is a 3U PXI module range that supports 6 (in one slot), 12 or 18 (in two slots) channels of RTD simulation. Based on the design principles of our 40-260 PXI Precision Resistor, this RTD simulator module can provide a setting resolution of <8mΩ (PT100) or <90mΩ (PT1000) and a resistance accuracy of better than 0.1% on all channels.
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Product
EV Power Components End of Line Test Platform
Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
Die Test Handler
3112
Test Handler
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
Test Port Cable
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
Functional Test for Engineering Lab
Spectrum BT
Functional Test
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Product
PXI RTD Simulator Module, 20 Channel, PT1000
40-263-103
Simulator
The 40-263-103 is a 20-channel PT1000 RTD Simulator. The 40-263 range is a cost effective method of simulating PT100, PT500 or PT1000 RTDs. It supports 4, 8, 12, 16, 20 or 24 channels in one or two PXI slots. Also, channels are able to be set as short or open circuit to simulate faulty wiring to a sensor.
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Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Test Fixture
Stopper kit includedYAVCANCON2 for fixture identification not included
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Product
RTD Simulator PCI Card 6-Channel PT1000
50-262-102
Simulator
This RTD Simulator is a PCI card that supports 6 channels of RTD simulation. The card can provides a setting resolution of <90mΩ (also available in <8mΩ - PT100) and a resistance accuracy of better than 0.1% on all channels. Each simulation channel is able to provide a short or open circuit setting to simulate faulty wiring connections to a sensor. Calibration or verification of each resistor channel can be verified by using the calibration port connected to a high performance DMM and a supplied software package.
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
PXI/PXIe Battery Simulator Module, 6-Channel, 750 V Isolation
43-752A-001
Battery Simulator
Targeting EV, automotive, aerospace, energy storage and electric aircraft applications, the new battery simulator modules occupy a single PXI slot. These 6-channel battery simulators are capable of supplying up to 7 V and 300 mA per channel. The channels are fully isolated from ground and from each other, allowing series connection to simulate batteries in a stacked architecture.
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
PXI Strain Gauge Simulator Module 6-Channel, 1.5k
40-265-406
Strain Gauge Simulator
The 40-265 range consists of 6, 4 or 2 channel modules (this version is the 6-channel, 1.5kΩ) that simulate the operation of a range of strain gauges making it ideal for testing strain gauge meters and a wide variety of industrial control systems. The range provides a simple way of replacing in house developed sensors with a low cost simulator having excellent performance. The 40-265 uses the same resistor bridge techniques that real life strain gauges are based on, ensuring accurate emulation under all conditions.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M648
Test Platform
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
Testing And Simulation
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Uni- and bidirectional power supplies for testing and simulating batteries, fuel cells, electric drive trains and other components.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
Configure Battery Pack Simulator for Battery Management System (BMS) Hardware-in-the-Loop (HIL) Testing
Simulator
Customized configuration for battery pack simulator by Bloomy
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Product
Mobile Comm DC Source w/ Battery Emulation
66321B
Battery Simulator
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections.The Keysight 66321B mobile communications dc source provides fast transient response, exceptional sourcing, output resistance programming, and precision measurement. This product is specially designed for testing next generation digital wireless communications products. The 66321B mobile communications dc source offers a new capability that simulates the internal resistance of a battery or battery pack. Additionally, these high performance models offer improved transient response and stable output operation with either short or long load leads.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
