Simulation Testing
See Also: Simulation, Simulators, Simulation Software
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Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Single or Multi-channel Coherent Signal Simulator
Z2090B
Simulator
The Z2090B-3xx can generate single or multiple coherent outputs to 44GHz with precise phase and amplitude offsets. It is available as a component bundle or as an integrated system.
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Product
Solar Array Simulator DC Module, 65V, 8.5A, 510W
E4361A
Simulator
The Keysight E4361A is a 510W solar array simulator DC power module that simulates the output characteristics of a solar array. The E4361A is primarily a current source with very low output capacitance. It offers fast I-V curve changes allowing you to accurately simulate the output of different solar arrays under various environmental conditions (ex. temperature, age, eclipse, spin etc.). The E4360 gives you the flexibility to operate it in two ways:
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Product
Test Port Cable, 1 Mm
11500K
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 20-cm cable featuring a return loss of 16 dB minimum
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Product
Fixturing Kit
10744A
Test Fixture
The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
Desktop PCB Test System
BOARDWALKER 9627
Test System
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Wireless Test Standards Software
test
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Product
PCI Strain Gauge Simulator Card, 2-Channel, 1k
50-265-202
Strain Gauge Simulator
These cards simulates the operation of a range of strain gauges making them ideal for testing strain gauge meters and a wide variety of industrial control systems. They provide a simple way of replacing in house developed sensors with a low cost simulator having excellent performance that is easy to calibrate and use.
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Product
PCI Strain Gauge Simulator Card, 4-Channel, 350 Ohm
50-265-014
Strain Gauge Simulator
These cards simulates the operation of a range of strain gauges making them ideal for testing strain gauge meters and a wide variety of industrial control systems. They provide a simple way of replacing in house developed sensors with a low cost simulator having excellent performance that is easy to calibrate and use.
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Product
Digital Interconnect Test System, Reference Solution
Test System
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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Product
Flying Prober Test System
QTOUCH1404C
Test System
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Product
P104 Synchro/Resolver Simulation Board
73DS2
Simulator
NAI’s 73DS2 is a PC104-compatible Synchro/Resolver Simulation Board with three isolated channels. These channels can incorporate up to three Digital-to-Synchro/Resolver Converters with 1.2 VA drive capability in a stack-through module. With galvanic isolation, one of the outputs can be grounded without affecting performance.
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Product
Benchtop Communication Test System
ATS3000A
Test System
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
PXI Strain Gauge Simulator Module 4-Channel, 1.5k
40-265-404
Strain Gauge Simulator
The 40-265 range consists of 6, 4 or 2 channel modules (this version is the 4-channel, 1.5kΩ) that simulate the operation of a range of strain gauges making it ideal for testing strain gauge meters and a wide variety of industrial control systems. The range provides a simple way of replacing in house developed sensors with a low cost simulator having excellent performance. The 40-265 uses the same resistor bridge techniques that real life strain gauges are based on, ensuring accurate emulation under all conditions.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
PCIe 4.0 Test Platform
PXP-400A
Test Platform
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
PXI Strain Gauge Simulator Module 2-Channel, 350 Ohm
40-265-012
Strain Gauge Simulator
The 40-265 range consists of 6, 4 or 2 channel modules (this version is the 2-channel, 350Ω) that simulate the operation of a range of strain gauges making it ideal for testing strain gauge meters and a wide variety of industrial control systems. The range provides a simple way of replacing in house developed sensors with a low cost simulator having excellent performance. The 40-265 uses the same resistor bridge techniques that real life strain gauges are based on, ensuring accurate emulation under all conditions.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
Functional Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
Fibre Channel PXI Express Test & Simulation Instrument
PXIe-FC4
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Avionics Interface Technologies
3U PXIe form factor will fit into any PXIe or hybrid slot - Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speeds - Comprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Triggering and Filtering - Error Injection on any Header or Payload Parameter - Data Capture to on-board memory or disk file - Live Capture and Current Value Monitoring - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent Analyzer - Supports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Supports HS-1760E applications, including AS5653, AS5625, and AS5627fcXplorer Windows-based FC Simulator and Analyzer Test Software
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
Test Port Cable, 1 Mm
11500J
Test Port Cable
The Keysight 11500J test port connector has a length of 16 cm and a frequency range of DC to 110 GHz. The 11500J integrates with the Keysight N5250A network analyzer and Keysight 8510XF network analyzer systems.
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
Test Platform
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Product
PCI Strain Gauge Simulator Card, 6-Channel, 3k
50-265-106
Strain Gauge Simulator
These cards simulates the operation of a range of strain gauges making them ideal for testing strain gauge meters and a wide variety of industrial control systems. They provide a simple way of replacing in house developed sensors with a low cost simulator having excellent performance that is easy to calibrate and use.
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Product
PXI RTD Simulator Module 6-Channel PT100
40-262-101
Simulator
The 40-262 is a 3U PXI module range that supports 6 (in one slot), 12 or 18 (in two slots) channels of RTD simulation. Based on the 40-260 design principles the module can provide a setting resolution of <8mΩ (PT100) or <90mΩ (PT1000) and a resistance accuracy of better than 0.1% on all channels. Each simulation channel is able to provide a short or open circuit setting to simulate faulty wiring connections to a sensor. Calibration or verification of each resistor channel can be verified by using the calibration port connected to a high performance DMM and a supplied software package.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
