X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Universal Offline AXI Systems
AXI XT-6 Series
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The XT-series provides the advanced inspection capability of Nordson TEST & INSPECTION's inline system in a smaller footprint manual load/island of automation system. The platforms are designed for flexibility and ease of use for a wide variety of products requiring 2D and 2.5D automated X-ray inspection. The XT-6/XT-6A platform is a highly flexible automated X-ray inspection system with minimum footprint and a parallel-kinematic Hexaglide manipulation unit for extreme-angle off-axis image acquisition with high resolution. It is suitable for high-quality X-ray analysis of electronic assemblies and material analysis of parts that require flexible part manipulation with multiple inspection angles. For batch modes and volume inspection the XT-6 can be equipped with a single-sided conveyor setup and magazine load/unload station (XT-6A).
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Beam Directional Power Supply Mains
SiteX CP225D
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The CP225D is currently the most powerful constant potential X-Ray generator in ICM's portfolio. Supplemental to its outstanding penetration capacity (up to 47 mm for steel in just 10 minutes), it includes a built-in multiple X-Ray output carrousel that features a Beryllium window for the inspection of lighter alloys such as aluminum and carbon fiber. The CP225D is one of the most versatile generators on the market and will adapt to an extremely wide variety of applications. In fields as diverse as the construction or petrochemical industries, its power and small focal spot, light weight, compactness and high penetration capacity will be much appreciated.
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Handheld/Mobile/Portable XRF Spectrometers
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Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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Microscopy
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Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
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XRF Lead Paint Spectrum Analyzer
LPA-1
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The LPA-1 is a state-of-the-art Lead Paint Analyzer using X-Ray Florescence (XRF) and K-Shell technologies, providing readings in as little as 2-4 seconds. It is widely considered the fastest, most reliable lead inspection system today. Non-destructive testing for lead on painted surfaces. Fast, efficient and easy to use testing device. Completes readings in 2-4 seconds.
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X-Ray Inspection System
MX1
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Manncorp’s new MX1 is a high-performance x-ray inspection system designed for real time imaging of multilayer PCBs and dense metal BGAs, μBGAs, and chip scale packages. Its high voltage (80kV), computer-controlled x-ray tube and 35 μm focal spot provide the power necessary for detection of a variety of defects including bridging, voids, and missing balls. The MX1’s standard camera features continuous zoom magnification from 4X to 50X and variable angle viewing up to 45°, and an upgrade to the x-ray tube can boost magnification to 225X.
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Rack-Mount Power Supplies
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Explore rack-mount high voltage power supplies that feature IGBT switch mode technology or active power factor correction. And check out our rack-mount modules equipped with disc sets, which are ideal for ion-beam and electron-beam systems and X-ray equipment. Choose from standard modules or customize.
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Nuclear Radiation Detector
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Henan Bosean Electronic CO.,Ltd.
A small and medium-high range radiation dose alarm instrument, with the main function of monitoring X-ray, γ-ray and β-ray. We provide nuclear radiation detector OEM/ODM service.
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Microwave Moisture Meter
RX-95
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The system works based on the absorption of microwave energy by water molecules contained inthe x-rayed material. It is a non-contact, non-destructive method of instant measurement of water content - used for materials such as coal, flour, grain, cement, seeds, sugar, etc. Thanks to high measurement sensitivity (resolution greater than 0.01% of water content by weight), short measurement time (about 5 times/sec.) and repeatability of measurement - the system is suitable for continuous measurement of material moisture, e.g. on conveyor belts and its recording on a PC or using a 4-20 mA current loop.
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XRD Diffractometers
Empyrean Range
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With the Empyrean, Malvern Panalytical has set the new standard in developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects.
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X-ray Inspection Performance
MXI Quadra 7
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Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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XRF analysis
X-Supreme8000
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XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 for quality assurance and process control requirements across a diverse range of industries.
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Neutronic Detection
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Neutron imaging is a non-destructive method used to see inside objects that may be inpenetrable by X-ray or other techniques.Neutrons offer the benefit of being able to see through heavy metals such as lead but can also be used to examine delicate processes.Photonis Neutron detector is designed to provide either still images or video using both cold and thermal neutron imaging techniquesfor non-destructive testing and neutron tomography.
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Spectrometers
VUV and XUV Spectrometers
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Innovative and affordable spectrometers for VUV/XUV/Hard X-Ray spectroscopy applications in science and industry
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Research XRD Diffractometers
X'Pert³
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The successful X'Pert platform is continued by the Malvern Panalytical’s X'Pert³ range of X-ray diffraction systems. With new on-board control electronics, compliance with the latest and most stringent X-ray and motion safety norms, advances in eco-friendliness and reliability the X'Pert³ platform is ready for the future.
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High Voltage
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A comprehensive range of high voltage power sources are available from ETPS. Product families range from programmable high precision laboratory power supplies to HV Cassettes and PCB modules. The flexible high voltage design platforms and responsive management structure enable us to offer an economically viable custom build. High voltage power supplies from ETPS are used in a variety of applications ranging from electron acceleration systems and mass spectrometers to magnetrons, x-ray and nuclear research.
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Platform
AXM XM8000 Wafer
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The complete solution for operator free, automated X-ray wafer metrology. XM8000 is specifically designed for inline use in clean room environments.
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High Voltage Film Capacitor
STHVP/STHVE
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High Voltage Pulse Current for medium frequency applicationHigh Voltage DC / AC Voltage applicationCapacitor can be discharged at rated voltage directly without any protective component and with ambient Temperature up to +105CHigh Voltage Decoupling and SnubberingVoltage MultiplierInduction heatingAct as discharge capacitor to trigger laser, X-Ray and Tesla CoilFor high voltage capacitor bank or arrayHigh Voltage Power Supplies
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Data Reporting and Analysis Software
TRACS
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TRACS (Trending-Reporting-Analysis-Capture-Software) is a graphical reporting software tool, which runs over a network and captures data from connected machines for analysis and reporting from a remote computer. Developed in partnership with AutoCoding Systems, TRACS displays live and historical batch data for all production runs and is designed to work with LOMA’s Metal Detectors, Checkweighing, X-ray Inspection and Combination Systems.
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Energy Dispersive X-ray Fluorescence Analyzer
X-5000
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HORIBA continues it's innovation in the petroleum market by proudly teaming with Olympus Innov-X to promote the X-5000 Mobile XRF Analyzer. The X-5000 is a rugged, fully integrated closed beam portable EDXRF system that offers the power and performance of a traditional benchtop XRF, but is designed for transportable operation.
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Electron Sources
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SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Energy Dispersive X-ray Fluorescence Spectroscopy
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Energy Dispersive X-ray Fluorescence Spectroscopy
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Handheld XRF Analysers
X-MET8000 range
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Hitachi High-Technologies Corp.
The X-MET8000 range of handheld X-ray fluorescence (HHXRF) analysers delivers the performance needed for rapid alloy grade identification and accurate chemistry of a wide variety of materials (solid and powder metals, polymers, wood, solutions, soil, ores, minerals etc). The X-MET is practical, rugged and easy to use to deliver results you can trust.
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Aviation Security
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Aviation is highly regulated, from ICAO Annex 17 to National Security Programs. Due to its high profile and the subsequent multitude of threats, regulation safeguards travel security. Our expertise will support your business, by supplying market leading X-Ray and Metal detection products along with maintenance, that meet the regulator requirements and best fit your business.
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Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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X-ray Non-Destructive Testing (NDT) System
DynamIx HR / Series 5
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High precision 12-bit 50µm reading allows inspection of minute image details. Wide dynamic range resulting in wide allowance of X-ray exposure value.
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Scanning XPS Microprobe
PHI Quantera II
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The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
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The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
