Impact Test
forceful strike to UUT determining strength and durability or detection of loose particles.
See Also: Drop Testers, Pendulum Impact, Impact Hammers, Crush, Hardness Testers, Rupture
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Product
Damped MEMS High-G Shock Accelerometers
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Damped MEMS high-amplitude shock accelerometers represent state-of-the-art industry technology for miniature, high amplitude, DC response acceleration sensors. This series is capable of measuring long duration transient motion, as well as responding to and surviving extremely fast rise times, typical of a high-g shock event as found in explosive, gun and impact testing. Both packaged and OEM configurations are offered, to fulfill a variety of installation requirements.
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Product
NI-9236, 10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module
785996-01
Strain/Bridge Input Module
10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The NI‑9236 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The NI‑9236 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 V rms transient isolation, providing high‑common‑mode noise rejection and increased safety.
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Product
C Series Strain/Bridge Input Module
Strain/Bridge Input Module
The C Series Strain/Bridge Input Module works with higher-channel-count, dynamic strain measurement systems. Modules can acquire measurements from up to eight channels, with compatibility options for quarter-, half-, and full-bridge sensors. The C Series Strain/Bridge Input Module is ideal for application channels requiring measurements at particular times, such as impact tests. It includes built-in voltage excitation, as well as transient isolation for high-common-mode noise rejection and improved safety.The C Series Strain/Bridge Input Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Product
PTL Impact Hammer
F22.50
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Shenzhen Chuangxin Instruments Co., Ltd.
The Universal Impact Hammer is designed to perform impact tests for product durability. The F22.50 meets the testing needs of industry standards such as IEC 60068-2-75 and required by IEC 60065, 60335, 60598, 60601, 61010 and others. The hammer simulates mechanical impact to electronic products and electrical appliances.
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Product
Drop Tester
KD 688 A
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King Design Industrial Co., Ltd.
*PLC control, linear motor fast speed control the height setting.*Alarm warning before testing.*Light support structure decreases the test impact.*Support dropping very smooth with dual lubrication guide.*No second impact. *A data acquisition for the impact wave record (Option).*Non maintenance request for continue operation.*According to ISTA, ASTM .....etc international standard.*Equipped edge & corner holder.
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Product
Footwear Test Equipment
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AVENO footwear testing equipment including leather tester, shoes tester, rubber tester, and velcro tester, related to water resistance test, abrasion test, flexing test, impact test, fatigue test, and etc. of all shoes material.
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Product
Digital Impact Test Machine
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The Digital Impact Testing Machine mainly used to determine the anti-impact capability and strengthen impact toughness of non metallic materials such as nylon, glass fiber reinforced plastic, ceramic & cast stone, electrical insulating materials etc.Sample and support are easy centeringThe pendulum of the machine can be raised or released automatically by button pressedDigital LCD screen control and value displayThe machine comply with GB / T1843, ISO 180, GB / T21189, GB / T2611 and other international standard
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Product
Drop Weight Impact Testing Machine
DWTT Series
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Jinan Testing Equipment IE Corporation
DWTT Drop Weight Impact Testing System is suitable for drop weight tear test of various kinds of ferrite, especially for the test of DWTT for pipeline steel as ASTM-E 436, API-RP 5L3, ASTM-E 208 and DIN EN 10274. DWTT has integrated mechanical, electrical, and automatic control technology, and achieved full automation of feeding, hammer lifting impact, and fracture specimen collection. The load frame has a four-column design, features in stable supporting structure, rigid, dual sliding rails. The Drop Weight Drop Weight Tester is equipped with positioning mechanism, anti-dumping mechanism, safety mechanism, hydraulic buffer devices and security guard net. The impact energy is determined by the lifting height and configuration of different net weights. DWTT Drop Weight Impact Testing System is the essential quality control equipment for pipeline manufacturers, steel mills, iron and steel enterprises, and is also widely used for research institutes.1. Buffer device is equipped to avoid the second impact and absorb the residual energy after breaking the specimen so as to prevent the weigher and anvil from destroying. The installation of safety mechanism, buffer device, and security guard net will effectively secure the testing machine and its operation to extend its life.2. Configuration of the specimen-feeding system, anti-second impact device, and specimen centering mechanism will guarantee a quick, accurate and reliable test.
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Product
Impact Testing
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Educated Design & Development, Inc.
1250 g body includes release mechanism and striking element guide.250 g striking element comes with cocking knob and hammer head, polyamide face, is hemispherical with a radius of 10 mm, has a hardness of HR85-100.60 g release cone with a 10N release force.Single Impact Force models range from a 0.2 J Hammer to a 2.0 J Hammer.Custom padded carrying case included.
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Product
Common Metallic Pendulum Impact Testing Machine
JB-(C/D)
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Jinan Testing Equipment IE Corporation
KB- (C/D) common type metallic pendulum impact testing system is the basic model for impact tester. The metallic pendulum impact tester is used to determine the impact resistance of metal materials under dynamic load and capable of doing a large number of impact tests continuously. The display method for the models is different, respectively there are analog dial display, touch screen digital display and computer display. For the later two models, it can display the impact power, impact toughness, and pendulum rotation angle. All the testing reports can be printed out. The metallic pendulum impact testing system is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.
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Product
IK07-IK10 Pendulum Impact Hammer Apparatus
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Shenzhen Chuangxin Instruments Co., Ltd.
IK07-IK10 Pendulum Impact Hammer Apparatus is desinged according to IEC60068-2-75 and IEC62262 standards. The IK07-IK10 Pendulum Impact Hammer Apparatus can be used for the mechanical impact strength test of metal enclosure.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Film Impact Tester
DRK136A
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Shandong Drick Instruments Co., Ltd.
DRK136A Film Impact Tester is applicable in the precise impact resistance test of plastic films, sheets, laminated films, rubber and other nonmetal material.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
Automated Compliance and Device Characterization Tests
N5990A
Test Platform
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M1288
Test Platform
The SierraNet M1288 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M1288 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M1288 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
Portable, Integrated O-Level Test Platform
Guardian™
Test Platform
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
Battery Management (BMS) Environmental Test System
Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
6TL19 Off-Line Base Test Platform
H71001900
Test Platform
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Product
EVSE Test Platform
Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
