Vacuum Interrupter Test
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2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Vacuum Switches/Sensors
Whitman Controls offers a diverse range of vacuum switches and transmitters. We pride ourselves with offering the highest quality units in the industry, fully customizable to meet your process control and design requirements. We offer vacuum pressure sensors that are designed to withstand even the harshest weather conditions and to operate reliably in severe vacuum conditions. When the conditions are harsh, Whitman’s vacuum switches thrive!
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Vacuum Test Adapter
Vacuum test adapters (VA) are suitable for contacting electronic assemblies with large quantities (mass testing) and a small number of variants. INGUN vacuum test adapters are available as standard as a single system without an exchangeable replacement kit.
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Positioning Test System
TS-LBS
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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RF Testing Platform for ATx05
AT118
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Vacuum Sensor, Thermocouple Vacuum Gauge for High Vacuum
DV-5 Series
Teledyne Hastings, manufacturer of the original DV-4, DV-5, and DV-6 thermocouple vacuum gauge tubes, produces vacuum measurement equipment with exceptional stability, accuracy, and reliability under the most demanding conditions.
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Functional Test System
TS-5040
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Current Interrupter
CI-50
MIL-SPEC locking Instrument EnclosureTan color reduces heat and blends with surroundings(4) AA's replaces 12v lantern type from previous modelLocking style port connectionHold setting in memory
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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In-line vacuum test systems
Ensuring that products meet the highest quality standards is absolutely essential in the manufacture of food, pharmaceutical and cosmetic products in particular.Leak-tight product containers have a major role to play here. Leak-tight product containers have a major role to play here. Leakages allow the contents of a container to get out, but more importantly they also allow germs to get in, rendering the contents unusable.INDEC vacuum test systems monitor containers for leak tightness fully automatically within the production process. A wide range of containers, including bottles, jars and cans as well as tubs and trays, are tested for leak tightness by means of a non-contact inspection.The means to this end is a pre-existing vacuum or a vacuum created in the container expressly for the purpose of leakage testing. Containers which are not leak-tight are reliably identified and automatically rejected.These processor-controlled test systems are highly reliable and extremely easy to use, qualities which have played no small part in making them the first choice already for many companies throughout the world.
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Bottom Electrode SMD Test Fixture
16198A
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Vacuum Handling Systems
RECIF Technologies history started in 1982 offering its first wafer handling solution: Vacuum handling Systems.Based on this historical technical mastery, Recif Technologies provides today a full range of single wafer manual vacuum handling solutions adapted to our customers’ and current Semiconductor industry’s’ requirements.
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Vacuum Inspection
INDEC
INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.
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Spectrometers, Vacuum
A compact and versatile vacuum ultraviolet monochromator. A selection of aberration-corrected diffraction gratings is available so you can tailor the instrument to your wavelength of interest and application. Connect this instrument directly to your vacuum plasma physics experiment or build an intense UV tunable source. It is available as a scanning monochromator, as a spectrometer, or as a spectrograph with microchannel plate or direct-detection CCD. The Model 234/302 is popular in systems due to its compact design, high throughput and resolution. It is also available with an additional entrance or exit port.
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In-Circuit Tester
Sparrow MTS 30
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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HV Test System for Patient Monitors
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Vacuum Compatible Instruments
Nearly all standard systems can be modified for vacuum applications to 10-8 Torr if baking is not necessary. Many UHV applications require custom designed solutions. With experienced UHV instrumentation specialists on staff, we can provide custom nanopositioning and micropositioning solutions for your vacuum application.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Wide Range Vacuum Gauge
HVG-2020B
The HVG-2020B wide range, dual sensor vacuum gauge takes measurement to the next level. With a Piezo based sensor and a thermal based Pirani sensor accurately and confidently measure pressures across seven decades. The Piezo sensor is media isolated, gas composition independent, and periodically zeroed by the Pirani sensor. An ambient thermal sensor enables the instrument to adjust for temperature and therefore better accuracy.
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Thermocouple Vacuum Gauge Tubes
DV-6 Series for Medium Vacuum
Teledyne Hastings, manufacturer of the original DV-4, DV-5, and DV-6 thermocouple vacuum gauge tubes, produces vacuum measurement equipment with exceptional stability, accuracy, and reliability under the most demanding conditions.The Teledyne Hastings’ DV-6 series thermocouple vacuum gauge tube acts as a localized sensor which is then paired with a selection of meters or controllers to provide reliable, cost-effective measurements in diverse applications. The robust sensor gauge tube is easily installed into vacuum systems and when properly excited, generates a thermoelectric voltage to provide a vacuum pressure measurement based on gas density. The DV-6 thermocouple vacuum gauge tube fully compensates for temperature and rate of temperature change.Thermocouple gauge tubes are calibrated on vacuum systems that contain N2 or Air, but can be used with other gases. Additionally, thermocouple gauges and their controllers can be recalibrated when a replacement thermocouple gauge tube is installed, following instructions in the manual. However, our DB-20 reference tube is available to confirm meter/controller performance. A complete line of installation accessories are also available to simplify the integration of our thermocouple gauge tubes into a variety of vacuum systems. Our goal is to provide “one less thing to worry about”, when performance matters! With a wide range of meter, fitting, relay and output options, the DV-6 series provides a reliable pressure measurement in numerous industries and applications.
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Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Vacuum Slip Rings
Vacuum Slip Rings are especially suitable for a space environment on satellite platforms or payloads but can also be used in vacuum chambers of large ground-based scientific instruments such as synchrotrons or telescopes.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
