IC
circuitry in a chip.
See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes
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Product
Packaging Manufacturing
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KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.
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Product
24-Pin SOWIC-to-22-Pin 0.400" CRT DIP Adaptor for 75ALS162 and Others
1111903
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24Pin SOWIC IC to 22Pin .4 CTR DIP Adapter for 75ALS162 and other IC?s. A cost effective means of upgrading to SOIC without changing your PCB layout.
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Product
TTL/I2C/SPI* Expansion Kit
OP-SB5GL
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OP-SB5GL is the interface expansion kit that has a port to measure RS-232C(V.24) and a port to measure the TTL / CMOS signal level communications. The port for TTL / CMOS supports the measurement of TTL / CMOS level communications that power supply system is from 1.8V to 5V. It is suitable for monitoring the communications between the LSI and the interface IC on the printed circuit board by directly probing into the lines. It supports the protocol of not only UART and HDLC but also I2C and SPI* on monitoring and simulating.
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Product
Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
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The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Clock & Timing
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Analog Devices clock ICs and timing solutions enable new architectures, lower development and manufacturing costs, and shorter design times. Products feature low jitter and phase noise for clock cleanup, synchronization, generation, delay, and distribution.
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Product
Display ICs For Automotive
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Renesas has invested in key technologies to address the latest trends within the automotive market. Offering both standard and AEC-Q100 qualified products for automotive applications, Renesas' automotive display IC product line is defined by feature rich, highly integrated semiconductor solutions that incorporate many key function blocks for front console, rear seat entertainment, and rear camera display applications.
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Product
Shallow Water Ice Profiler
SWIP
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The Shallow Water Ice Profiler (SWIP) is a real-time acoustic ice thickness measurement (ice draft) instrument for shallow water applications. The underwater components include a low-cost acoustic transducer, a tilt sensor, a high-precision pressure sensor and a temperature sensor, all providing suitably high resolution for shallow water measurements.
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Product
Advanced Multimeter
7117
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Peaceful Thriving Enterprise Co Ltd
This is a low power consumption, high accuracy and stable hand held 6000 counts multi-meter; with special designed IC to support true RMS measurement. It performs measurements of DC voltage/current, true RMS AC voltage/current, resistance, capacitance, frequency, diode, continuity, temperature and non-contact voltage sensing.
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Product
Immunity
ESD coupling
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is used for conducted coupling of Langer ESD pulses (200ps rise time) into ICs.
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Product
AC-DC Converters
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With robust, advanced high-voltage converters, power factor correctors, a variety of controllers and supervisors/housekeeping ICs, together with innovative architectures and extended temperature ranges.
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Product
Power ICs - Smart Load Switches
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Combining multiple functions in a single IC, Vishay smart load switches eliminate the need for external circuitry . A simplified GPIO interface allows for power distribution and sequencing of multiple sub-systems. Slew-rate-control devices provide a controlled supply ramp to reduce inrush current, while fault protection and isolation switches increase robustness with reverse current, overtemperature, current limiting, and short circuit protection features. The ICs offer quick output discharge and small footprints, while their integrated design saves PCB space compared to discrete solutions, reduces BOM counts, and lowers manufacturing costs.
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Product
High Current IC Test
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C.C.P. Contact Probes Co., LTD.
Our patented probe design allows very high currents of up to 5 Amps
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Product
PXIe-4138, 60 V, 3 A System PXI Source Measure Unit
782856-01
Source Measure Unit
±60 V, 3 A System PXI Source Measure Unit—The PXIe‑4138 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4138 features 4-quadrant operation. The PXIe‑4138 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Product
Chassis and Safety ICs
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ST is a world-class supplier of IC smart power solutions for all the Chassis and Safety applications, ranging from passive safety, braking, vehicle dynamics and steering systems. Type of devices in ST portfolio are analog and mixed-signal ICs, integrating different functions such as supply modules, drivers for loads and actuators, diagnostic functions, system monitoring and communication interfaces.
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Product
Configurable OSAT Friendly Pick-and-Place Handler
Delta Eclipse
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Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
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Product
Passive Probe, 10:1, 200 MHz, 1.3 M
N2871A
Oscilloscope Probe
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Product
Vector Modulators
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Analog Devices high dynamic range vector modulator RF ICs offer 360° continuous phase control, a continuous gain control of 40 dB, and a low output noise floor of at least –160 dBm/Hz at the maximum gain setting.
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Product
600A Digital Clamp Meter
7128C
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Peaceful Thriving Enterprise Co Ltd
This is an auto-ranging, high accuracy and stable hand held clamp meter to make electrical maintenance safe and easy. With special designed IC to support true RMS, the meter is available to measure AC/DC voltage to 600V, AC/DC current to 600A and resistance to 60MΩ; also having the capability to test diode, continuity, frequency and non contact voltage sensing. Sub switch included Function Select, Value Hold, Range Select, Relative Value Measurement, Inrush Current Indication, Hz/Duty Cycle, Illumination and Back-light.
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Product
Semiconductor Test Equipment
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Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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Product
288-Pin Dual In-Line Memory Module
SQR-UD4(ECC)
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SQRAM is Industrial Grade DRAM memory. all of SQRAM are designed with original IC chip and adopt a rigorous test program.
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Product
Digital Incircuit Test
PFL780/760
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The PFL780 and 760 use IC clips as a test interface. This makes them ideal for the service and maintenance of legacy systems. If you need to work on high density surface mount PCBs you should consider the GRS500 as a more suitable alternative.
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Product
Hail Impact Tester
HIT
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Hailstorms can cause severe damage to modules and collectors. Our test stand enables you to carry out tests according to international standards. The hail impact test stand uses an air-pressurized launcher that shoots ice balls representing hailstones of a predetermined size at the module or collector mounted on the support frame.
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Product
InCarrier Loader/Unloader
NY32-LU
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NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.
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Product
Switches And Latches
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With 30 years of leadership in digital position sensor ICs, we offer the broadest portfolio of magnetic switch, latch, and speed and direction solutions in the industry to serve almost any application need.
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Test Handlers
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Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.
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Product
Digital Logic ICs
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Renesas' general-purpose logic devices support the information equipment and computer fields, which demand small size and high performance. With a variety of power supply voltages, functions, and capabilities, these logic devices provide strong support for specialized applications such as bus switching, level conversion, and clock-related applications.
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Product
Near Field Probes 30 MHz up to 3 GHz
RF1 set
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The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Chip Manufacturing
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KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.
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Product
Demonstration Boards
SAMPULSE50GHz and SAMPULSE70GHzANT
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The SAMPULSE50GHz and SAMPULSE70GHzANT are demonstration boards for Furaxa InP single channel sampler/pulser ICs. The SAMPULSE50GHz model contains a 2.4mm combined TDR input/output connector to the common sampler/pulser node in the IC. The SAMPULSE70GHzANT is similar, except that instead of a single-ended 2.4mm connector, the sampler IC's differential inputs are fed from a bowtie antenna. In both models, the IC's differential sampler output is converted, using an AD8009 op amp, into a single-ended ground-referenced output that is sent to an SMA jack labeled SAMPLER OUTPUT.
