Chroma ATE Inc.
Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma". Significant markets served by Chroma include semiconductors, photonics, LED, photovoltaics, video & color, flat panel displays, power electronics, passive components, electrical safety, green batteries, electric vehicles, thermoelectrics, automated optical inspection and intelligent manufacturing systems for ICT and cleantech industries.
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Guishan, Taoyuan 333001
Taiwan, Province of China
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Product
Automatic System Function Tester
3240
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Chroma 3240 is an innovative handler for high-volume multi-site IC testing at the system level.
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Product
Component Test Scanner
Model 13001
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Support component test scanningSupport 8 slots for plug-in (removable), up to 320 channels for one unitOption A130007 40 channels scan module, input up to 500VDC for IR test without switchingMax. 8 salve units for multiple scanner (master/slave interface)Support Chroma LCR meterSupport Chroma 3302/3252/11025 turn ration functionSupport 11200 CLC/IR meter for IR testStandard RS-232, GPIB and USB interface13001 can be installed in Chroma Component ATE model 8800Support ICT applications
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Product
Brick Power Module Test
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Modern servers, workstations, and telecom equipment often use an Intermediate Bus Architecture (IBA) powered by isolated DC/DC converters known as "brick" modules. These brick converters step down the input voltage to a lower DC bus voltage, enabling designers to implement efficient, high-density, non-isolated Point-of-Load (POL) regulators that power components such as microprocessors, FPGAs, and ASICs on system boards. With smaller voltage step-down ratios now common, designing POL regulators has become more straightforward. Brick modules are so named for their standard physical formats (1/4 Brick, 1/2 Brick, Full Brick, etc.), making them easy to integrate and replace.
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Product
Hybrid Single Site Test Handler
3110
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Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Product
3D Optical Profiler
7503
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Chroma 7503 uses the technology of white light interfaces to measure and analyze the surface profile of micro-nano structures with sophisticated scanning system and innovative algorithms.
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Product
FPD Tester Power Module
67393-120-480
Power Module
The 67393-120-480 FPD Tester Power Module is a new generation of small, stable, high reliability AC to DC power supply. It adopts compact mechanical design and uses Chroma FPD Tester for signal input/output that can provide a total solution for testing the signal, control and power of diversified panels.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
TO-CAN Package Inspection System
7925
System
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
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Product
Thermal Data Logger
51101 Series
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It is a general requirement to record temperatures, voltages, currents, and many physics quantities during research, product development, productions, and quality assurance processes. The number of record channels can be a simple one to several complicated set of hundreds. Thermal/multi-function data loggers are prefect solutions to serve for these measurement and tracking needs.
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Product
DC Power Supply
DC Power Supply
DC power supplies offer many unique advantages for telecom, automated test system & integration, industrial, battery charge & simulation for hybrid cars and solar panel simulation. These advantages include high power density of 15KW in 3U, precision readback of output current and voltage, output trigger signals as well as the ability to create complex DC transient waveforms to test device behavior for spikes, drops, and other voltage deviations.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Single Site Test Handler
3210
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Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
VCORE Power Test
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To support the heavy computing loads required by AI technologies, system servers must rely on high performance CPUs and GPUs capable of complex, real-time processing. These processors are powered by VCORE power supplies, embedded DC/DC converters, or voltage regulator modules (VRMs).
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Product
PCBA Pattern Analyzer
A222917
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Chroma A222917 is a multi-functional PCBA main board board signal test device for display. It has ultra high speed LVDS (Low -voltage differential signaling) as image signal analysis core to provide high efficiency and stability test quality.
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.






















