Pulse Instruments
Pulse Instruments is a leading manufacturer of systems and equipment for characterization and production test of CMOS, CCD and IR image sensors, including science-grade devices. Science teams have used Pulse Instruments systems to extract maximum performance from several HST CCDs, including the chip in the most recently installed Advanced Camera System that is providing 10x the performance of its predecessor.
- (310) 515-5330
- sales@pulseinstruments.com
- 22301 S. Western Ave.
#107,
Torrance, CA 90501
United States of America
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product
Dual Channel Driver Card
40461
Two channels of 8 to 10 MHz drivers (25 V amplitude). The output voltage range is ±25V, with independent high and low voltage settings. The inputs to the Card are optically isolated. The card also contains voltage and current sense capability, which allows muxing of the current or voltage output measurements from all the Driver Channels in the system to a single DVM. The card allows independent programming of the rise and fall time of each channel as low as one nanosecond increments.
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product
Dual Channel Driver Card
42460
Two channels of 32 MHz clock drivers with up to 20 volt amplitude. The output voltage range is ±20 V, with independent high and low voltage settings. The inputs to the Card can be optically isolated. The card also contains voltage and current sense capability, which allows muxing of the current or voltage output measurements from all the Driver Channels in the system to a single DVM. The card allows independent programming of the rise and fall time of each channel one nanosecond increments.
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product
Mainframes
Our CompactPCI series mainframes are industry-standard, open-architecture chassis with enhancements to support Pulse Instruments' clock driver and DC bias cards. The enhancements are transparent to the CompactPCI specification, and 3rd-party cards CompactPCI/PXI cards can be used in our mainframes without hardware or software modification*.
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product
Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Pulse Instruments Data Acquisition and Test Software
PI-DATS
PI-DATS is Pulse Instruments Data Acquisition and Test Software, our user-friendly system software that allows complete control over Pulse Instruments test systems and test equipment. PI-DATS can dramatically increase your testing productivity by decreasing the amount of time it takes to set up and change test plans.
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product
Clock Drivers
Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.
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product
Characterization System
System 7700
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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product
Dual Channel Clock Driver Card
PI-41400
The PI-41400 is a dual channel Clock Driver card capable of operating up to 190 MHz into a 50-ohm load and up to 80 MHz at an amplitude of 8 volts into a 1-megohm load. Into a high impedance load the output voltage range is from a –3 volts to 8 volts with the output pulse amplitude ranging from 0.5 V to 9 V. When driving a 50 load the voltage range is –1.5 volts to 4.5 volts with the output pulse amplitude ranging from 0.25 V to 4.5 V. The rise and fall times of the output pulse are variable from 1.2 ns to 9 ns into a 50-ohm load and <5 ns to 9 ns into a HiZ load. The output pulse amplitude and the load being driven determine the range of variability. The driver output can be set for tri-state operation and the output polarity can be set for ‘Normal’ or ‘Inverted’ operation through software.
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product
Four Channel Low-Noise DC Bias Card
PI-41702
The PI-41702 is a four channel bipolar DC Bias supply that can provide an output current up to 100 mA per channel. The output voltage ranges from –8 V to +8 V, and this card has special filter circuitry to reduce the output noise for those applications that require a low noise bias output. Additionally there is a ‘D’ type connector that allows the introduction of laboratory type supplies to reduce the noise further. To change from using the internal power supplies to external power supplies requires repositioning jumpers. The PI-41702 also has voltage and current sense for remote measurement of the voltage and current levels.
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product
Digital Acquisition Card
PI-41000
The PI-41000-4G is a CompactPCI® bus based instrument card that allows the user to capture up to 32-bits of digital data into an on-board memory at clock rates up to 120 MHz. The inputs are software configurable to provide one 32-bit wide channel, one 16-bit wide channel with double depth or two 16-bit channels. When configured with a single 16-bit input, the card will capture at up to 120 MHz. When configured with two 16-bit inputs or as a single 32-bit input, the card will capture at up to 80 MHz. Each digital data channel requires three timing signals, frame, line and pixel to accommodate the data capture. When operating in a two channel mode, clocks from channel A can be used to provide timing to channel B. For wider words or multiple channels, more boards can be used in parallel.
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product
SystemSolutions
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your yourdevice, not on your test system.
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product
Multi-Channel Data Acquisition System
PI-3105
This highly flexible system is designed to test a wide variety of imaging devices, from low-noise astronomy and medical devices, to military and machine-vision devices with GB/sec data rates.
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product
Instrument Mainframe
PI-11008
The PI-11008 Instrument Chassis was designed to accommodate the power and noise requirements of some of Pulse Instruments analog instrument cards. These instrument cards, such as the PI-41401, PI-41702 and others supply signal outputs that require more current from the -12 V supply than available in a standard chassis. Therefore this chassis has a larger -12 V power supply that provides 2.5 Amps.
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product
Dual Channel, Low-Noise DC Bias Card
PI-41701
The PI-41701 is a dual channel bipolar DC Bias supply that can provide an output current up to 100 mA per channel. The output voltage ranges from –8 V to +8 V and features programmable current limits with LED indicators and software interrupt to show/alert the user if the channel is in current limit. This card has special filter circuitry to reduce the output noise for those applications that require a low noise bias output.
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Data Acquisition
For devices with analog outputs, we are now shipping our new multi-channel data acquisition system. This high-speed, low-noise solution is highly modular, so you can test scientific CCDs and high-speed machine-vision CMOS sensors with the same basic system. Swappable pre-amps and A/D converter modules enable you to reconfigure your test system to fit your needs.
