KITA Manufacturing Co.,Ltd.
KITA Manufacturing Co.,Ltd. is manufacturing company and specializing in spring probes(Pogo pin) for testing semiconductor and PCB based in Osaka, Japan.
- +81-72-485-1900
- +81-72-485-1901
- 4-27 Rinku-Minamihama
Sennan-shi, Osaka 590-0535
Japan
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product
Fine Pitch Spring Probes
For MARATHON series, we have ultra-fine spring probes with high quality for small lot order and in short lead time. We have product range from probe outer diameter 0.11mm.
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product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 230gf
K100-H080230-SKAU
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
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product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type D, Ø0.80mm, 155gf
K100-D080155-SKAU
K100 Series, Pitch 100mil, Tip Style D, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
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product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 230gf
K100-I126230-SKAU
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 230gf, Steel with Gold Plating.
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product
High Frequency Spring Probes
We have spring probes for high frequency for 0.5 and 0.8mm pitch. We provide spring probe with low insertion loss by shorten the total length to 1.5mm (use length 1.1mm).
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product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type E, Ø1.50mm, 155gf
K100-E150155-SKAU
K100 Series, Pitch 100mil, Tip Style E, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type L, Ø1.50mm, 305gf
K100-L150305-SKAU
K100 Series, Pitch 100mil, Tip Style L, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type D, Ø0.80mm, 305gf
K100-D080305-SKAU
K100 Series, Pitch 100mil, Tip Style D, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 230gf
K100-K150230-SKAU
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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product
Semiconductor
You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
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product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 155gf
K100-H080155-SKAU
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
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product
High Force Type Prbobe For PCB, K100 Series 100 Mil Pitch, Receptacle
KR100
K100 Series, Pitch 100mil, Receptacle, no wire wrap pin. Brass with gold finish.
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product
Standard Type Spring Probes
From for bare board to for ICT, we have variety of spring probes for PCB. In addition to variety of tip type and total length, we also have receptacles that match the best to spring probes. We can also attach lead wire to the receptacles.
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product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 305gf
K100-A080305-SKAU
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 155gf
K100-I126155-SKAU
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 155gf, Steel with Gold Plating.
Parent
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Cohu, Inc.
We are a global leader in test handling, thermal subsystems, package inspection, contactors and MEMS test solutions used by the semiconductor industry.
Siblings
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ECT
Has been a leader in the development of advanced probes and fixtures since 1965.
Siblings
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Equiptest Engineering Pte Ltd
Equiptest Engineering (EQT) is focused in providing innovative test interface solutions to cater today rapidly changing technological environment.
