Test Insight Ltd.
TestInsight enables semiconductor companies to develop ultimate test programs using innovative ATE software tools. To create these tools, we have partnered with the major ATE vendors, keeping your test program always up to date to maximize ATE utilization.
- 972-3-7517383
- 972-3-6122128
- info@testinsight.com
- 33 Zeev Jabotinsky Street
P.O. Box 1893
Ramat Gan, 52118
Israel
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Content based revision compare of Test Programs
Test program Comparator
TP-C is part of the new test program life cycle solutions from TestInsightAddress concerns such as - Why does my test program yield differently in two sites ? Is it really the same program ? What is different in a given test program revision ?
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Wave display utility
GUI
GUI allowing users to view and analyze test vectors in all common formats (VCD/EVCD/WGL/STIL).
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Link simulation to ATE conversion
VCD2ATE
VCD2ATECost effective link simulation to ATE conversionDirect conversion from event driven design simulation dump (VCD/EVCD) to specific tester program files. VCD/eVCD to tester conversion Simple and cost effective conversion solution Simple cycle definition in excel High Performance Fast run time Handles very large files >6Gb
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Pattern Conversion
Wave Wizard
Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
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Emulate Test in simulation
STIL-VT
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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Virtual tester
Emulate tester patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test programs. Reads the actual ATE program and creates a Verilog /VHDL simulation test bench.
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Test Program Management
TP-M
TP-M utilizes TestInsight unique capability to read and analyze a whole test program from flow to every test pattern, timings, levels etc.
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Direct conversion from cycle driven simulation data
Test program generator
Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester. TDL/WGL/STIL to tester conversion Supports STIL ext 0,1,2 constructs Easy to use and cost effective conversion solution Optimize tester resources usage Supports advanced tester features (Such as Xmode, Multi-port etc’) Compress and minimize vectors count Allow direct tester binary patterns creation
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Conversion Tools
Tester Data Link
VCD/eVCD to tester conversion (via STIL)WGL/TDL to tester conversion (via STIL)Most flexibility to handle complex devices functionality Support protocol definitionUtilize advanced tester features (Such as Xmode, concurrent test etc’… )High Performance Fast run time
