Semiconductor Test Handlers
Our broad portfolio ensures the most-efficient solution for your test application, including leaded and leadless devices, singulated packages and packages in strips, tri-temp test and MEMS test. We offer optimized performance with our fast and accurate systems.
Striving to offer the best cost of test, our handlers are designed to meet the requirements for best return on investment, highest efficiency and maximum productivity.
-
Product
Gravity Handler
MT9928 xm
-
tri-temp from -55 to +175 °C (+200 °C on request)fast and reliable kit exchange for SO and MLF/QFN packagesthroughput up to 28,000 uphcontacting: standard, high frequency and high power Kelvintube and metal magazine loading and unloadingbowl feed loading and bulk unloadinginstalled MT99x8 base: more than 1.000 systems
-
Product
Tri-Temp Test Handling
MT2168 XT
-
innovative, extremely scalable architecturesimplified operations and auto self-teaching processeshigh throughput for the entire temperature rangesproven temperature performance with scalable temperature test capabilitiesadvanced plunging for best first pass yield
-
Product
Tri-Temp Pick and Place Handler
MT9510 XP
-
up to 8 contact sitestri-temp from -55 °C to +175 °Ckitable system for QFP, BGA, QFN and other packagesindex time 0.38 secthroughput up to 5,300 uphcontacting: standard, high frequency and Kelvinoutstanding temperature performanceinstalled MT9510 bases: more than 800 systems
-
Product
High Parallel Tri-Temp Pick and Place Handler
MT9510 x16
-
up to 16 contact siteoutstanding temperature performancetri-temp from -55 to +175 °Ckitable system for QFP, BGA, PGA, QFN and other packagesadvanced, scalable ESD protectioncontacting: standard, high frequency & Kelvinthroughput up to 5,300 uphinstalled MT9510 base: more than 800 systems
-
Product
High Parallel Test of ICs and Sensors
InStrip®
-
temperature range: -40 °C +125 °Cpanel exchange time < 3,5 sindextime < 250 msmassive parallel testing capabilitylarge soak capacityslotted input and outputconversion in less than 15 minutesmaximum contacting force 4000 N
-
Product
Xcerra Test in Carriers
InCarrier® Process
-
loading into strip-like device carriers with Xcerra loading equipmentsupports standard transportation media of the backend processleverages Xcerra InStrip for singulated packagesoffers all features of the standard InStrip set-upunloading into final packaging mediafull traceability
-
Product
High Speed Loading for Test in Carriers
InCarrier Loader plus
-
up to 16,000 uphfull device traceabilitystandard SEMI mapping interface G84 or E142integrated loading quality controlcarrier damage control
