Test System Integrators
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Laser Diode Characterization System
58620
System
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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Product
Inflight Entertainment System Hardware
System
Innovative IFEC solutions that enable connectivity, entertainment, and control.
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Product
Airframe Electrical Power Systems
System
Rely on Astronics CorePower® airframe electrical power systems, where solid-state technologies deliver highly efficient, clean power that improves aircraft operation through weight and system wiring savings.
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Product
Scienlab Battery Test System – Module Level
SL1001A Series
Test System
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Product
Mezzanine System Carrier
MMS8010 / MMS8011
System
The Abaco ECM 3U VPX carrier supports up to six Abaco Systems Electrical Conversion Modules (ECMs) in a VITA 46 VPX form factor. Each ECM site connects 32 single-ended 3.3 V signals to the FPGA. The specific ECM board installed on a site converts the FPGA signals to 16 I/O signals, for a total of 96 I/O signals across the six ECM sites.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
VPX Development System
VPX370 3U
System
The VPX370 is a second generation VPX development platform that delivers, performance, flexibility, and scalability all in a compact 3U VPX form factor.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
Mezzanine System
5158
System
The 5158 Electrical Conversion Module (ECM) provides eight (8) RS-232 outputs and eight (8) RS-232 inputs. Built around Maxim 1488 & 1489 chips for true RS232 levels and voltage tolerance, all outputs come up in the 1, mark or idle state. Electrically this is a negative output voltage, the start bit is always a 0 or a positive voltage level.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
VIP Cabin Management Systems
System
Where elegance meets powerful functions, add a new level of electronic sophistication to your cabin.
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Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
System
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Product
Smart Sensing Systems
System
The Astronics Smart Aircraft System enables the gathering of information through sensor and IoT technology to help airlines gain the valuable insight needed to increase passenger satisfaction, improve operational efficiency, and lower costs.
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Product
Bloomy Simulation Reference System
System
The Bloomy Simulation Reference System provides a hardware in-the-loop (HIL) test environment for dynamic, closed-loop testing of many aerospace and transportation control systems. The reference system integrates the computing, I/O, and software components needed for standalone use or to form the basis of a more complex test system.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
EFT Module for Teststand
test
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
4U 8-Slot CompactPCI® System with Redundant Power Supplies
cPCIS-6418U
System
The cPCIS-6418U Series Subsystem is designed for maximum density and has 8 horizontal slots for 6U cPCI boards with 80mm RTMs. The chassis is 4U in height and standard 19" rack mount width.
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Product
In-Circuit Test System Rentals
Test System
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Product
Battery Cell Formation System
17000 series
System
Chroma 17000 series is specifically designed for the formation of Lithium Ion and Lithium Polymer secondary batteries. The 17000 series is a complete turn-key system, including carrier trays, robust battery probe contacts, high quality charge/discharge modules and intuitive software all under computer control. Patented Battery Voltage Tracking (BVT) DC-DC conversion power modules minimize power consumption in battery charging, and Energy Recycle Modules (ERM) recycle the discharged energy directly back to the DC power system for increased power efficiency. These power saving designs provide a planet friendly solution along with cost savings by reducing energy consumption. The intuitive software provides a flexible selection in the charge/ discharge channel, current rating, and modules under test. These features allow the Series 17000 to be used for final cell development, pilot line production, high volume production and ongoing reliability monitoring/quality control.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Systems
System
In addition to our ISO 9001:2008 certification, we are proud to have the highest possible score for delivery-on-time and QA rating - 100% - from all the major aerospace companies.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
