X-ray Photoelectron Spectrometers
determine the atomic composition of a surface.
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Modular Spectrometers
B&W Tek boasts one of the most comprehensive lines of UV, Vis and NIR spectrometer modules on the market. Combined with our wide selection of spectroscopy accessories, we offer you nearly limitless utility. Due to their small form factor and customizable software control systems, fiber optic spectrometers are the ideal choice for both integration into your OEM system and for the laboratory, where you can combine modular products to form a complete solution.
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Raman Imaging & High Resolution Spectrometer
LabRAM Odyssey
Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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High Spectral Rate and High Dynamic Range Miniature Spectrometers
VS70-HSR & VS70-HDR
VS70 is a high performance compact fiber coupled spectrometer system covering wide spectral range of 200 to 1050 nm. This OEM optical module is built around Horiba’stype-IV Aberration-Corrected Flat-Field Holographic Ion-Etched concave grating and is specially designed to easily adapt to a large variety of detectors and electronic drivers. This system is fitted with a custom variable order-sorting filter to eliminate higher orders.
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X-ray Inspection System
NEO-690Z / NEO-890Z
Off-line Microfocus X-ray Inspection System equipped with PONY ORIGINAL Direct Conversion X-ray Camera; SID-A50. Suitable for inspection of BGA, CSP, and LGA on PCB.
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Spectrometer
AirSPEC
Baltic Scientific Instruments, Ltd
Scintillation gamma-ray spectrometer AirSPEC is intended for measuring scintillation spectra and alsofor determination of activities and specific activities of radionuclides in samples and in conditions of natural occurrence in geometries 2 and 4.Spectrometercan be usedfor various tasksradiation monitoring, including the definition ofspecific effective activity of naturally occurring radionuclides (NORM) in building materials (granite,crushed stone, gravel, etc.), raw materials, products, waste industrial productionand rockswithoutsampling; measurements surface activity of the radionuclide 137Cs (and other); mass fraction of NORM in rocks andoresin the conditions oftheirnatural occurrence on a surface, inboreholes and in warehouses andtransportcontainers, and also in study ofsurface contaminationof soil,as well asprospecting and exploration ofmineral deposits resources.The spectrometercan be used forworkin the laboratoryand in the field conditions.
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X-ray Inspection System
Cougar ECO / Cheetah ECO
Cheetah and Cougar ECO X-ray inspection systems for use in the electronics industry. These microfocus systems, which have been developed by Yxlon in Germany, are characterized by an excellent price-performance ratio. Being entry-level systems in two sizes, each of them provides best inspection results in quality control in the SMT and semiconductor industries.
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Spectrometers
Via the waveScan technology, A·P·E offers a spectrum analyzer for different wavelength ranges of CW and mode-locked laser systems. Featuring high resolution and supreme ease of use, several versions of waveScan are available, to allow measurement of scan rages ranging from 200
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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Domestic Direct Reading Spectrometer
CS-8610
Wuxi Jinyibo Instrument Technology Co., Ltd.
1. Convenient, practical and reliable: unique combustion device, equipped with infrared detection system, direct connection, remote control operation.2 , patented burner design (using utility model patent technology)The burner electrode upgrading system adopts a spring structure, the electrode adjustment is convenient, and the double sealing ring guarantee the pressure balance in the furnace cavity without tempering.3 , to ensure accurate measurement results◆Using low-noise, high-sensitivity, high-stability pyroelectric infrared detectors.◆Specially-made new platinum infrared light source, continuous heating and high spectral efficiency.The modular design of the whole machine, the electronic circuit is highly integrated, which improves the reliability of the instrument.◆Industrial-grade integrated linear module power supply, stable output, no fault.◆The infrared detection part and the combustion furnace are connected by optical fiber, and cooperate with multi-level concealed isolation circuit to completely eliminate arc interference.◆Double filter device to reduce the impact of dust on the analysis results.4 , electronic balance is not quantitative sample: you can choose different brands of electronic balance, automatic online, to achieve non-quantitative weighing.
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Raman Spectrometer
Spec 64
The fiber coupled high speed Raman spectrometer is optimized for maximum light throughput and high speed spectrum acquisition. Connected to an AFM or a scanning stage, high speed Raman imaging is possible due to an integration time down to 10 ms per spectrum. The spectrometer can be operated with a separate software as stand-alone device or synchronized via the Anfatec AFM software.
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Dual-Channel Spectrometers
Sometimes a single-channel spectrometer is not enough, for example, when you want higher resolution or perform two redundant measurements simultaneously. The AvaSpec dual-channel spectrometers are designed specifically for this purpose. Each spectrometer can be configured independently. The dual-channel can be equipped with two AvaSpec-ULS2048CL or two AvaSpec-ULS4096CL spectrometers.
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X-Ray Inspection
X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
