Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Product
Impact Analysis
MetaDex™
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Allows you to instantly see the impact of any changing data object or application on all downstream objects and applications.
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Static and dynamic analysis
MEMS
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Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
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Product
Automotive Serial Triggering and Analysis (CAN, LIN) for DSOX1000 Series Oscilloscopes
DSOX1AUTO
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The automotive serial triggering and analysis (CAN, LIN) option for InfiniiVision 1000 X-Series oscilloscopes allows you to trigger on either standard or extended CAN message IDs, including the message ID of a remote transfer request frame. It supports triggering on a data frame and allows you to specify message IDs, data and data length for filtering messages of interest. Triggering on active error frames also is supported. In addition, it supports triggering on LIN frame IDs and data, and it includes color-coded parity and check sums errors. You can easily isolate serial packets to find error sources due to hardware or software related problems.
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Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Product
DC Electronic Load
M9822/M9822B
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M9822/M9822B is newly designed circuit adopts rapid AD and DA technology to achieve rapid measurements with high accuracy. And the resolution of 0.1mV/0.1mA can effectively display the minor change of voltage and current, so the instrument has a wider application field and achieves better test results. Meanwhile your operation becomes much more comfortable and easy by equipping the high-light VFD, the simple menu and displayed contents and the operation state indicators on all keys. Otherwise the complete and humanized test functions will greatly improve your productivity.
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PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
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The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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The Leading Measurement System for the Analysis of Porous Materials
ELWIS
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ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Electronic Multifunction Data Loggers
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The DeltaTrak Electronic Data Logger is a portable, pocket sized electronic device powered by a 10-year lithium battery. It is designed for easy and reliable tracking of parameters such as temperature, relative humidity, electric current, pressure, process signals, and pulse signals. All data loggers have a built-in temperature sensor plus single or multiple external channels where different sensors can be attached for remote monitoring of a variety of parameters. The DeltaTrak Data Loggers interface with a PC and have an internal memory for up to 32,000 readings. Each data point is automatically time and date stamped as it is recorded. Sampling intervals are set by the operator via a user-friendly Windows program on the PC. Recorded data is downloaded and graphed or exported in ASCII format to a spreadsheet for numerical print outs.
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High Power Beam Analysis
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The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
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Product
High Power DC Electronic Load
34000C Series(6KW~24KW)
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34000C Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.
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Sensing Analysis Software
ENLIGHT
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A single suite of tools for data acquisition, computation, and analysis of optical sensor networks based on the HYPERION system.
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Microscopy Image Analysis Software
analySIS FIVE
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The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
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Opto-Mechanics, Electronics, Software, Accessories
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A variety of complementary products expand the function of our measuring instruments and support the configuration of complete measuring systems.
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*Laser Spectroscopy
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*Sum Frequency Generation (SFG) vibrational spectroscopy and microscopy*Investigation of surfaces and interfaces of solids, liquids, polymers, biological membranes and other systems
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Fiber Optic Type Chemical Concentration Monitor
CS-600F
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The CS-600F achieves a higher level of functionality best suited for manufacturing, such as the ability to perform in-line measurement of high temperature chemical solutions in various applications, stable operation for reduced downtime, and compact size for improved space productivity in order to meet the precise chemical solution concentration management required in leading-edge semiconductor wet process.
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Product
Custom Reed Relays from Pickering Electronics
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Pickering Electronics manufactures hundreds of model relays. Many of these custom reed relays are minor variations of a standard part, for example, a different test specification or pin configuration. Others are custom designed to meet our customer's particular requirements.
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Destructive Physical Analysis (DPA)
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Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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Gas Analysis
HPR-20 R&D
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The Hiden HPR-20 R&D specialist gas analysis system is a bench-top mass spectrometer for real time gas analysis of evolved gases and vapours.
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On-line Water Quality Analysis
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Shimadzu is one of the world’s leading manufacturers of high-quality continuous monitoring systems that meet the application requirements of a wide range of customers for environmental testing, pharmaceuticals, chemicals, and academic research, etc.
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Strain Measurements and Experimental Stress Analysis
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Experimental structural testing using strain gauges is necessary in a wide range of applications from airframes and sub-assemblies down to individual components such as turbine blades, satellites, wind turbines, buildings, bridges and many others. These tests enable the engineers to compare the acquired data with the predicted results from the design calculations.
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Near-infrared Spectroscopy Evaluation Module
DLP® NIRscan™ Nano
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The DLP NIRscan Nano is a compact battery-operated evaluation module (EVM) for portable near-infrared spectroscopy solutions. Featuring the DLP2010NIR digital micromirror device (DMD), the NIRscan Nano supports Bluetooth low energy to enable mobile lab measurements for hand-held spectrometers.
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Probing & Analysis Adapters
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No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Electronic Control Unit Functional Test
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End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Electronic Controllers
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CAES designs and manufactures stepper and brushless DC controllers for aerospace applications. A variety of interfaces (1553, RS422), input voltages, and drive schemes are available. Custom requirements are welcomed.
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Product
500 Watt Electronic Load Module
N3305A
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The Keysight N3305A is a 500 W (0-60A, 0-150V) electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3305A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3305A can also digitize waveforms.
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Non Destructive Analysis
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The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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Product
Single-in-Line (SIL / SIP) Reed Relays From Pickering Electronics
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The SIL / SIP reed relay is the industry standard when high reliability and consistent performance are desired in a compact package. Pickering Electronics Series 100 - 110 SIL / SIP reed relays feature the highest quality instrumentation grade reed switches making them suitable for the most demanding application





























