HV Test
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Product
HV AC Hipot
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The HV AC Hipot package is a hardware and software upgrade available for select Eclypse Analyzers. This package adds a High Voltage AC stimulus source CCA to the analyzer chassis and the HV AC Stimulus utility provides the software drives for ELITE to integrate AC Hipot into test programs.
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
HV Breakout Modules
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The HV Breakout Modules (BM) are specifically designed for safely measuring directly from HV voltage power cables. Currents and voltages are measured directly and the raw data is acquired at up to 2 MHz per channel. With the Vector eMobilityAnalyzer software, which is optimally paired to the CSM HV Breakout Modules, real time power analysis is also possible.
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Product
HV AC Voltage Test Systems
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Fivestar HV Testing Equipment Co., Ltd.
FSHV offers three different types of AC voltage test systems, the conventional type is AC test transformer design, mainly for testing objects of medium & low capacitance products, particularly for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (like inductive voltage transformers). Another is AC resonant test systems, according to series resonance circuit XL=XC (2πfL=1/2πfC), by setting F frequency of power supply or L inductance of reactor, generate a pure sinusoidal waveform of the test voltage, and the required input power is only 1/Q. Variable frequency type operates in a frequency range from 20Hz to 300Hz, ideal for field commissioning test of power cables and GIS/GIL. Variable inductance type outputs continuous AC voltage of power frequency (50/60Hz), mainly for factory testing of high and ultra-high voltage cables, power transformers, GIS, etc.
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Test Handler
M4841
Test Handler
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Test System
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
Automated Test Systems
Test System
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
50-Pin D-Type Fem with Backshell, HV
40-960-050-F-HV
D-Sub Female Connector
This connector is designed to allow users to directly terminate cables with soldered connections.
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Product
HV & AC Resonant Equipment
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Kvtester Electronics Technology Co.,Ltd
This kind of products are small in volume, light in weight, with compact structure and multiple function, general-purpose and easy to use. Applies to the test of frequency or insulating intensity under DC ,HV for all kinds of HV electric equipments, components, insulated material in electric system, industrial and mining enterprises, traffic , post and telecommunications, science institute, etc.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
50-Pin D-Type Female without Backshell, HV
92-960-050-F-HV
D-Sub Female Connector
This connector is designed to allow users to directly terminate cables with soldered connections. 50-Pin Female HV connectors can be directly mated to a corresponding Pickering Switching Module.
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Product
Ultrasound Pulser ICs And HV Multiplexers
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ST's Ultrasound Imaging IC Solutions offer a complete range of integrated high-voltage transmitters from quad and octal, to the latest device, the state-of-the art STHV1600 ultrasound pulser IC, to high-voltage multiplexer IC, the STHV64SW, a 64-channel, high voltage analog independent switches. ST’s proprietary BCD6s-SOI and BCD8sSOI process technologies enable the combination of low-voltage CMOS logic, precise analog circuitry, and robust power stages on the same chip, offering unprecedented level of integration.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
Configurable Functional Test System
ATS-5000
Test System
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
IP Parallel HV
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High Voltage [up to 30V] IP Compatible card with 48 programmable IO. 40 mA sink. Open collector interface. Interrupt generator on each input channel. Filtered or direct input.
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Product
Test Handler
M4872
Test Handler
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
37-Pin D-Type Female Solder Pin HV
92-960-037-F-HV
D-Sub Female Connector
This accessory is designed to allow users to directly terminate a cable with soldered connections. When the product is used without a backshell users should make their own cable strain relief arrangements and ensure appropriate electrical safety precautions are observed.
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Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
LXI Dual 75x4 2-Pole HV Matrix
60-311-002
Matrix Switch Module
The 60-311 is a 2-pole Matrix Module available with one, two or three separate 75x4 matrices housed in the same case. It is capable of cold switching 750VDC continuous with a carry current of 2A plus higher pulse conditions e.g. typically 1000VDC for 1s with low duty cycle or 6A for 200us with <1% Duty Cycle.
