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Digital Fiber Sensor
FX-500 Ver.2
Panasonic Industrial Devices Sales Company of America
Thanks to its new “application-specific integrated circuit” (ASIC), Panasonic can solve applications with Fiber Optic Sensors that were previously impossible. Not only can the FX-500 Series reach a response time of 25µs while providing extremely accurate detection, integrated logic functions save you money because external controllers are no longer needed for normal applications and threshold tracking and self-diagnostic functions save time for maintenance. Moreover, the reliability of the detection has increased by 75% compared to that of previous models.
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PXI RF Analog Signal Generator
PXI RF Analog Signal Generators deliver the functionality of RF signal generators to the modular, compact PXI form factor. These modules support frequency ranges from 250 kHz to 20 GHz. You can combine PXI RF Analog Signal Generators with other PXI modular instrumentation to design automated test systems for radar, RF integrated circuits (RFICs), and automotive test applications.
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Plasma CVD & Reactive Ion Etching System
MODEL DRIE-1100-LL-ECR
The Tek-Vac DRIE-1100-LL-ECR series systems are designed for both high-density plasma chemical vapor deposition and reactive ion etching of sub-micron integrated circuits, optical devices and RF microwave electron devices.
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Electronics Failure Analysis System
Sentris
Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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PXIe-4163, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit
784483-01
PXIe, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit—The PXIe-4163 is a high-density source measure unit (SMU). It features 4-quadrant operation with a current resolution of 100 pA and the ability to sample up to 100 kS/s. The module also offers the ability to maximize stability and measurement accuracy with SourceAdapt, which allows you to custom-tune the transient response to match the characteristics of any load. The PXI-4163 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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Photonics & Telecom
Scientific Computing International
photonic integrated circuit manufacturing delivers unmatched measurement accuracy.
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PXIe-4162, 12-Channel, ±24 V, Precision PXI Source Measure Unit
785680-01
PXIe, 12-Channel, ±24 V, Precision PXI Source Measure Unit - The PXIe-4162 is a high-precision, high-density source measure unit (SMU) with 12 identical SMU channels. This module features 4-quadrant operation, integrated remote (4 wire) sensing in each channel for accurate measurements, as well as analog-to-digital converter technology to help you perform high-precision measurements. It also features guard terminals to remove the effects of leakage currents and parasitic capacitances. Additionally, the PXIe-4162 can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4162 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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5kV Insulation Resistance Tester
KV3122
KV Hipot Power Test Equipment Co.,Ltd
KV3122 Insulation Resistance Tester is suitable for measuring the resistance of various insulating materials and the insulation resistance of transformers, motors, cables and electrical equipment. Digital insulation resistance meter is composed of medium and large scale integrated circuits, including high-precision micro current measurement system, digital boost system and automatic discharge circuit.
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Device Thermal Test Systems
Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Power Management ICs
PMICs
Renesas' power management ICs (PMICs) are integrated circuits that perform various functions related to power requirements of a host system. A PMIC may have a combination of the following functions: DC to DC conversion, battery charging, linear regulation, power sequencing and other miscellaneous system power functions.
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Test System for High Volume Production Testing of Integrated Circuits
ETS-364
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-03
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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MEMS Microphones
A MEMS microphone is an electro-acoustic transducer housing a sensor (MEMS) and an application-specific integrated circuit (ASIC) in a single package.
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Failure Analysis Services
Innovative Circuits Engineering, inc
Innovative circuits engineerin's failure analysis group performs root cause analysis on a wide variety of integrated circuit devices.
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Controllable, Programmable Linear DC Source With Load
LAB / SLR
*Linear laboratory power supply*Integrated electronic load*Automatic range selection*Linear regulated DC source with automatic range selection*Built-in electronic load*Short-term peak load operation 240 or 480 watts*Protection against short circuit, overload and overtemperature*Double current / double voltage through "autoranging"*Fast control times approx. 250µ
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Solid Tungsten Probe Tips
ST Series
The ST SERIESof probe tips, available from GGB Industries, Inc., are precision crafted from a 0.020 inch (0.51mm) diameter solid tungsten shaft that is electrochemically sharpened to a specified point. These durable, 1.5 inch long solid tungsten shaft probe tips are for use in most standard micropositioners when probing an integrated circuit, pad, or line. A variety of radius point sizes from 0.5 microns to 10 microns are available to accommodate any probing need.
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.13u ESD diode
Impulse TSMC
The Impulse TSMC .13u ESD diode was made to provide ESD discharge paths when integrating third party IP in an integrated circuit design for total ESD protection. The Impulse ESD diode has been successfully used with Dolphin Technologies, Artisan/ARM, TriCN/Synopsis I/O libraries, as well as popular IP blocks from RAMBUS, Chip Idea and other quality IP vendors. A 5.5 volt reverse bias anode to cathode operational specification enables the Impulse TSMC .13u ESD diode to be the device of choice for 5 volt tolerant designs.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-01
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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FlexiForce Sensor Demo Kit
30056
The Flexiforce sensor features a pressure sensitive disc pad on the end of an ultra-thin (0.008 in.) flexible printed circuit ribbon that can be easily integrated into force measurement applications. Note that the flexible ribbon is to accomodate optimal placement of the pressure-sensitive disc; the sensor does not measure force applying curvature to the ribbon itself.
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Clamp Meter, Auto, True RMS, 400 A AC, 600 V AC, 600 V DC, 28 mm Jaw Opening Max.
72-7226 CAL DU
The 72-7226 CAL DU from Tenma is a digital clamp meter. This stable, safe and reliable digital clamp multimeter is designed with large scale integrated circuits and A/D converter as the core as well as overload protection and novel structure which make them a superb tool for electricians. It measures AC/DC voltage, AC/DC current, frequency, duty cycle, resistance, diodes and continuity and also includes data hold, sleep mode and relative mode features. The resistance measurement range from 400 ohm/4kohm/40Kohm/400Kohm/4Mohm/40Mohm (±(1%+2)), frequency measurement range from 10Hz to 10MHz (±(0.1%+3) accuracy). It is 3 3/4 digit digital clamp meter with precise operation, fashionable structure and highly reliable measuring instrument. The meter uses large scale of integrated circuit with double integrated A/D converter as its core and has full range overload protection. It complies with IEC61010, pollution degree 2, overvoltage category (CAT II 600V, CAT III 300V) and double insulation.
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RTM Communication Board
MS 3636I
CPCI Rear IO Communication Board is a signal conditioning and interface board for CPCI Integrated Communication Card (MS3635i). This board has required signal conditioning and interface circuits for RS422. Two 96 Pin Euro Connectors are used to interface all IO’s.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Laser Interferometer Position Measurement Systems
When built into manufacturing and inspection equipment, a laser interferometer system reports the position or controls the motion of a product platform with more accuracy than any other method. It allows manufacturers to produce precision products from integrated circuits to medical devices to aerospace components that meet the most stringent specifications.
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Power Management ICs (PMICs)
Telecommunications and defense industries demand ever-increasing functionality in equipment such as satellites, probes and spacecrafts. CAES offers a family of radiation hardened Power Management Integrated Circuits (PMICs) designed for high reliability applications.
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USB-8451, 250 kHz I2C, 12 MHz SPI I2C/SPI Interface Device
779553-01
The NI USB‑8451 is a master interface for connecting to and communicating with inter-integrated circuit (I2C), System Management Bus (SMBus), and serial peripheral interface (SPI) devices. With plug‑and‑play USB connectivity, the USB‑8451 is a portable solution to communicate with consumer electronics and integrated circuits. It also includes eight general-purpose digital I/O lines for a variety of applications, such as configuring the address of I2C devices or toggling LEDs. The USB‑8451 can be physically located more closely to I2C/SPI devices than PCI interfaces, reducing I2C bus length and minimizing noise problems. Additionally, the interface provides +5 V and GND to power circuits with no external power supply.
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High Speed DC Electronic Load
6330A series
The 6330A family offers 8 types of modular loads with power ranging from 30 watts to 1200 watts, current from 0.5mA to 240A, and voltage measurement from 0.5mV to 500V. Each load is isolated and floating, programmable in dual current range and measuring voltage range, and capable of synchronizing with other modules for control operating. The load can be operated in constant current, constant voltage, and constant resistance. With Synchronic parallel control capability, 6330A series loads allow users to parallel and synchronize more than one load together from an internal loading control signal. This feature provides synchronic dynamic loading test for multi-output power and high power test solution. Real time measurement of voltage, current, is integrated into each 6330A load module using a 16-bit precision measurement circuit. The user can perform on line voltage measurement and adjustment, or simulate short circuit test using the simple keypad on the front panel.
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Standalone with Drop-In Test Systems
800 Series ATE
The Circuit Check 800 Series ATE provides the versatility of utilizing the economical drop-in fixturing present in the 600 Series or an integrated dedicated fixture, while simultaneously providing the increased test equipment capacity of the 1000 Series. This combination produces a cost effective full turnkey test solution.
