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Product
RF Shielded Test Enclosure, Slim rack mountable
JRE 1724A
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Designed for testing devices with a flat form factor that need plenty of I/O, the rack-mountable JRE1724A is ideal. Similar to our JRE1724, but not as high, you can place multiple devices within its large footprint. Dual I/O panels allow for a multitude of connectors and interfaces. The JRE1724A comes standard with dual honeycomb style vents - pictured is the enclosure with optional cooling fan and USB2.0 interface.
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Product
Computer On Module
ITX-M-CC452-T10
Carrier Board
The ITX-M-CC452-T10 is an industrial Mini-ITX small form factor Type 10 reference carrier board designed to fully test WINSYSTEMS’ COMeT10-3900 COM Express Type 10 Mini module. The carrier board adheres to the PICMG COM Express specifications providing compatibility with other COM Express mini type 10 modules.
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
PXI 8 Trib Daisy Chain Switch 75 Ohm 96 Way
40-792-701
Daisy Chain Switch
The 40-792/793 Daisy Chain Switching Module is designed for telecom test applications. It allows production or verification testing of SONET/SDH transmission multiplexers switching 2MBit/s or 1.5MBit/s data. Traffic is sequentially Daisy- Chained through all tributaries (or any selection of tributaries), modules can be cascaded to test any number of tributaries.
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Product
250 A Molded Case Circuit Breaker Tester
MCCB-250
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The Vanguard MCCB-250 is a programmable, high-current source designed specifically for testing molded-case circuit breakers, thermal magnetic and solid-state overload motor-protection relays.
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Product
Ball Pressure Test Apparatus
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The Ball Pressure Apparatus is designed to perform test specified in IS Standard where resistance of insulating material to elevated operating temperature is to be determined. It is used to test insulation materials used in Electrical Appliances, Electrical wiring accessories, luminaries, motors, connectors, etc. It is a precision engineered test instrument for use by safety and compliance testing laboratories.
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Product
PCI Resistor Card 4-Channel 1 Ohm To 255 Ohm
50-293-013
Programmable Resistor Module
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
PXI Resistor Module 2-Channel 1.5R to 2.04k
40-293-022
Programmable Resistor Module
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
N Test Finger Nail
TF-24 series
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Are designed to perform tests specified in many standards to determine compliance with safety requirements.
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Product
LAN Cable Tester
LAN-1
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The LAN-1 Cable Tester is designed for testing opens, shorts and miswired cable installations. It is designed to work with various data cables and connectors. This cable tester provides a quick go / no-go LED display of the wiring and connection of item under test. You can either step through the test cable wiring one at a time or have the unit automatically pulse through the pin-outs and display the results.
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Product
Axial Extensometer
Model 3542
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Jinan Testing Equipment IE Corporation
These extensometers are designed for testing a wide range of materials, including metals, plastics, composites and ceramics. All will work in both tension and compression. The dual flexure design makes them very rugged and insensitive to vibrations, which permits higher frequency operation.They come standard with Epsilon’s quick attach kit, making it possible to mount the extensometer on the test specimen quickly and easily with one hand. The quick attach kit can be removed, allowing mounting of the extensometer with springs or rubber bands.The Model 3542 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.For gauge lengths 100 mm (4 inches) or greater see Model 3542L.
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Product
HSI System Test Panel
TA-500
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This panel was designed to test primarily the NSD360 series of HSI systems. Panel allows running the complete system on the bench. Included is a panel mounted TA-902 API which can also be used for testing external instruments via a panel mounted switch. The API and standard meter drives allow testing many different instruments.
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Product
PXI-6225, 80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO, PXI Hybrid, Multifunction I/O Module
779296-01
Multifunction I/O
80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module - The PXI‑6225 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
USB-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device
779959-01
Multifunction I/O
80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6255 offers analog I/O, digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
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The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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Product
Systems Modeling
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Altair model-based development (MBD) tools drive fast development for smarter connected systems. Altair customers simulate complex products as systems-of-systems throughout your entire development cycle from early concept design to detailed design to hardware-in-the-loop testing (HIL). Explore more by combining mechanical models with electrical models (in 0D, 1D, and/or 3D) to enable multi-disciplinary simulation and leverage automatic code-generation for your next generation embedded systems.
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Product
24-Bit High-Resolution Dynamic Signal Acquisition and Generation Module
PCI-9527L
Signal Module
The PCI-9527L is a high-performance, 2-CH analog input and 2-CH analog output dynamic signal acquisition board. This board is specifically designed for audio testing, acoustic measurement, and vibration analysis applications.The ADLINK PCI-9527L features two 24-bit simultaneous sampling analog input channels. The 24-bit sigma-delta ADC provides a sampling rate up to 216 KS/s at high resolutions, making it ideal for higher bandwidth dynamic signal measurements. The sampling rate can be adjusted by setting the onboard DDS clock source to an appropriate frequency. All channels are sampled simultaneously and accept an input range from ±40 V to ±0.316 V. The PCI-9527L analog input supports software selectable AC or DC coupling and 4 mA bias current for integrated electronic piezoelectric (IEPE) sensors.
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Product
PXI Source/Measure Unit
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Keysight PXI source/measure unit (SMU) offers high-throughput and measurement quality for design validation and production test of RF power amplifiers. It delivers industry-leading output stability under extreme, dynamic load conditions and unmatched transient performance to dramatically reduce voltage droop due to pulse loading for faster test time.
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Product
LED Tester Software
Lumeresoft
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Evolusys Technologies Sdn. Bhd.
At the heart of the software design philosophy is the ease to create test recipe amidst the dynamic range of LED packages design & test requirements. Whether it is a single die LED, multiple die LEDs, Chip-On-Board (COB) substrate, etc. the same software can be used off-the-shelf without any special customization.
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Product
Telecom Generators
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Telecommunication networks are exposed to particularly natural disasters such as lightning and its effects. Therefore all connected telecommunications systems require reliable protection. Our subsequent Surge Simulators are specifically designed for EMC testing of telecommunications systems in accordance with ITU-T.
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Product
M-Class System
ACQUITY UPLC
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The ACQUITY UPLC M-Class System delivers the performance you expect from nano- to microscale separations with the usability of an analytical-scale UPLC system. Each part of the system was designed and tested to deliver the right flow for the right column. The ACQUITY UPLC M-Class System provides excellent performance with overflow rates from 200 nL/min to 100 µL/min and a range of column inner diameter (I.D.) from 75 µm to 1.0 mm.
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Product
The Lorlin© Impact Series
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Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Product
Ring Wave Simulators
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Suzhou 3ctest Electronic Co.,Ltd.
Ring wave interference on electronic line, control line and signal line can be caused by transient due to switch of mains and controlled switch or lightening strike. RWS 600 is designed to conduct immunity test for electronic and electrical device.
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Product
PCI Resistor Card 2-Channel 1.5 Ohm To 4.09k Ohm
50-293-023
Programmable Resistor Module
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
PCI-6280 , 16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device
779108-01
Multifunction I/O
16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6280 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Two-Way Radio Communications and High Speed Data Transfer
Leaky Feeder System
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Leaky Feeder systems offer clear two-way radio communication and high-speed data transfer capabilities throughout your underground complex.PBE’s Leaky Feeder System can be tailored to specific site requirements to provide the best radio coverage and data communications. This two-way radio system can provide complete communications coverage for your site, including above ground surface coverage. PBE offers design, supply, testing and commissioning of temporary and permanent communication infrastructures for underground mines, tunnels, plants and buildings. PBE provides a wide range of leaky feeder system options: conventional leaky feeder system, CMTS system, permanent radiating cable network and hybrid networks.
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Product
35b profile VDSL2 Tester
TM600P
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*TM-600 VDSL tester specially designed for xDSL line test (xDSL include: ADSL, ADSL2, ADSL2+, READSL, VDSL2 etc) and maintenance It provides xDSL test, PPPoE dial test, DMM test, Modem emulation, line voltage indication and so on.
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Product
PXI Programmable Resistor Card 4-Channel 2 Ohm to 255 Ohm - SPST
40-294-113
Programmable Resistor Module
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
PXI-6289, 32 AI (18-Bit, 625 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module
779123-01
Multifunction I/O
32 AI (18-Bit, 625 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6289 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
High Voltage Test Station
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High-voltage test stations place high demands on the safety aspect. We design these test stations in cooperation with our manufacturers as self-sufficient test systems.
