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Product
Gel Strength Test System
LD-LGST-A10
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Gel Strength Test SystemLD-LGST-A10is mainly used to measure the gel strength of gelatine under the stipulated environment. It has traveling accuracy ± 0.3 % and Test range up to 5 to 1000 g Bloom. It consists of Jelly Strength Tester, Constant Temperature Bath and Refrigerator. Sampling depth can be present arbitrarily in 1 to 60 mm. It consists four kinds of sampling measurement modes: single-step, maintaining, circulating and automatic.
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Product
Brake Test Systems
GIANT 9000 Series
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The major test target is to detect noise and vibrations generated by the vehicles brake. Our intention was to build a dynamometer that can operate either with brakes mounted to the complete vehicle, or with just the axle module mounted to a universal adaptor system or wheel suspensions.
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Product
Electro-Stimulation Equipment Testing System
STIMU-600
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Test device for functional testing of electrical stimulation devices.
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Product
Process Indicators & Field Devices
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Field devices from the Field Analog series record and convert signals from resistance temperature detectors, thermocouples, resistance-type sensors, and voltage sensors directly on site.
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Product
Optics Test Systems
Scientific Instrument Engineering
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Optik Elektronik Gerätetechnik GmbH
Development, design, manufacture and assembly of opto-mechanical assemblies and complete devices, including software.
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Product
Standards Reference for Test Systems PXI Card
GX1034
PXI Card
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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Product
Digital Reconfigurable I/O Device
ITA
The Digital Reconfigurable I/O (RIO) Device features user-programmable FPGA for onboard processing and flexible I/O operation. You have complete control over the synchronization and timing of all signals and operations along with custom onboard decision-making that executes with hardware-timed speed and reliability. You can configure user-defined hardware for a wide variety of applications, such as custom digital DAQ, high-speed waveform generation, sensor simulation, hardware-in-the-loop (HIL) test, custom digital communications protocols, bit error rate testing, and other applications that require precise timing and control.
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Product
Cable Test Vans and Systems
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Precise cable fault location, testing of new and diagnostic testing of existing cable routes – the BAUR cable test vans are suitable for any operation. Fast and reliable. Exactly adapted to individual requirements and predefined vehicle systems.
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Product
Integrated 5G mmWave Test System
IQgig-5G
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The IQgig-5G is a fully-integrated, non-signaling solution for testing 5G mmWave products at both the 28 GHz and 39 GHz frequency bands. All signal generation, analysis, and RF front-end routing hardware are self-contained inside a single chassis. The IQgig-5G is license-upgradeable to support the pre-5G and 3GPP standards evolution with up to 1 GHz of tester bandwidth. The IQgig-5G solution has three bi-directional source and measurement ports each with 2.92mm connector coaxial interface.
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Product
CRPA Test System
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The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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Product
Battery Pack Test System
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*Easy to see now test progress*Can cycle test*Provide Charge, Discharge, Suspend, FOR, LOOP Mode Select*When Charging, set the stop current to stop charging when fully charged so as to avoid overcharging that will damage the battery. When Discharge, set the stop voltage to stop discharge when discharging to lowest so as to avoid over-discharging that will damage the battery.
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Product
Thermal Control Devices
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Sumitomo Electric Industries, Ltd.
Sumitomo Electric offers heat control devices with excellent heat characteristics by combining its proprietary high-functional material technologies with process technologies (e.g. metallization, joining, sealing) and heat design technologies. These technologies are applied in the heaters for semiconductor fabrication equipment that achieves superior temperature uniformity and rapid heating and cooling characteristics.
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Product
Power Electronic Devices
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REINHARDT System- und Messelectronic GmbH
We also produce the power electronics devices listed below. They can be integrated into all our Test Systems.
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Product
I3070 In-Circuit Test System Software
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Improve your i3070 in-circuit test system's test performance with advanced software that increases test throughput and coverage. Expand your testing capabilities and optimize your manufacturing process with these powerful tools.
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Product
Switch Device for PCI Express
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The Switch Device for PCI Express provides two PCI Express upstream ports and eight downstream ports. You can connect the downstream ports to external devices, such as a Software Defined Radio Reconfigurable Device, to create large multichannel, multiple input, multiple output (MIMO) systems. You can also connect multiple Switch Devices for PCIe to a single PXI Express chassis to create large MIMO systems with a Software Defined Radio Reconfigurable Device.
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Product
High Voltage Battery Test System
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The increasing use of electric drive systems both in the automotive industry and in transportation requires the development of new high-performance energy storage systems. In order to support you in the development and production of these systems, S.E.A. develops individually configurable test systems which are scalable and can be used flexibly for the respective requirements.
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Product
Universal Test System
LS6601A
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LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Product
Device Programming
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At A.T.E. Solutions, we offer a fast and reliable device programming service. With support for a vast number of devices from different suppliers, whatever your device programming needs, we will provide a speedy and cost-effective service.
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Product
IEC60558 Insulation Material Layer Abrasion Resistant Test Device
CX-J16
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Shenzhen Chuangxin Instruments Co., Ltd.
This test is conforms to IEC60558-1 Fig6 and IEC60065 Fig14--16.The test shall be performed by fixing the specimens of thin sheets on a mandrel made of nickel plated steel or brass with smooth surface finish.
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Product
Automatic Hardness Testing System
AMH55
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Maximize your productivity and easily measure impressions on various surface conditions for a wide number of applications with LECO’s new AMH55. The AMH55 introduces LECO’s innovative Cornerstone® brand software to our hardness testing platforms, for increased usability, simplified reporting, and streamlined analysis times. Supporting accurate and efficient microindentation and Macro/Vickers hardness testing in fully automatic, semi-automatic, and lite configurations, the AMH55 is a valuable resource for users needing precise and productive hardness testing while tailoring the data and results to their needs.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
EMC Test Systems
IEC61000
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N4L are the only IEC61000 EMC test system manufacturer in the world* with an on site UKAS ISO17025 calibration laboratory offering accreditation to IEC61000-3-2, IEC61000-3-3, IEC61000-4-7 and IEC61000-4-15. Calibration and trace-ability are a vital aspect of any EMC test solution and the coverage provided through N4L’s UKAS Laboratory is comprehensive. N4L’s IEC61000-4-15 calibration procedure is particularly noteworthy as it covers the entire test protocol detailed in Annex C of IEC61000-4-15. It is commonplace for specific parameters within IEC61000-4-15 (d parameters are frequently omitted from calibration procedures) to remain untested during typical flicker calibration due to the difficulty in providing trace-ability for such measurements. All tests within the test protocol of Annex C are included within the scope of accreditation and calibration procedures at N4L.
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Product
Tire Rolling Resistance Test System
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This system measures the rolling resistance of each tire accurately. In addition to the simultaneous measurement of tire loss resistance and rolling resistance coefficient for each drive by mode operation (JC08, WLTC), coasting test, constant acceleration/deceleration test and transient mode test are able to be performed. Furthermore, measurement of driving noise/ vibration of the tire, effect of the tire loss due to the temperature change can be verified by adding options.Conforming the JIS D 4234: 2009 and ISO 28580: 2009.
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Product
SIP-90-4 Test System Interface Probe
SIP-90-4
ICT/FCT Probe
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Product
Collaboration Devices
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VIA family of True-Collaboration™ solutions: VIA Collage for more complex meeting spaces and VIA Connect PRO for huddle spaces and small to mid-sized meeting rooms.
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Product
Standalone with Drop-In Test Systems
800 Series ATE
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The Circuit Check 800 Series ATE provides the versatility of utilizing the economical drop-in fixturing present in the 600 Series or an integrated dedicated fixture, while simultaneously providing the increased test equipment capacity of the 1000 Series. This combination produces a cost effective full turnkey test solution.
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Product
Digital Interconnect Test System, Reference Solution
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When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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Product
Thruster Test Systems
LS Series
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The LS Series Long Stroke Thruster Test Systems are highly regarded as the industry standard for long stroke transient testing. This equipment is used in the design and production test of automotive airbag sensors by leading suppliers of automotive airbags and associative control modules.
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Product
Optics Test Systems
Lens Test
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Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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Product
Wireless Device Testing
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D.L.S. Electronic Systems, Inc
WI the testing and certification of your Wireless Device will be accomplished with precision and efficiency.





























