Total Reflection X-ray Fluorescence
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Total Reflection X-Ray Fluorescence (TXRF) Products
Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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Total Reflection X-ray Fluorescence (TXRF) Services
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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X-ray fluorescence spectrometers
SPECTRO Analytical Instruments GmbH
SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. In recent years, SPECTRO has set standards by further developing X-ray fluorescence technology to create many new fields of operation for ED-XRF spectrometers.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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Energy Dispersive X-ray Fluorescence Spectrometer
EDX-7000/8000/8100
One EDX over all others The EDX-7000/8000/8100 offers a high level af accuracy and speed in analyzing elements contained in various samples.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-6000
HORIBA Scientific, a market leader in sulfur-in-oil analysis, announces the launch of the new SLFA-6100/6800 Energy Dispersive X-ray Fluorescence Analyzer, which measures sulfur in oil ranging from 5 ppm to 9.9999%. This new, compact, and accurate analyzer meets the needs of anyone wishing to conform to ASTM D4294, ISO 8754 or JIS K2541/B7995.
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Reflectance Standards
STAN Series
Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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Reflection Meter
RC-088
This instrument is a special equipment for measuring the reflectivity of rearview mirror (or similar product) of motor vehicle. The product composes intelligent measuring instruments, optical integrating sphere, parallel lamp, standard light source, constant current source etc. It is easy to operate,it can measure the reflectivity quickly and accurately. On instrument structure, it adopts standardized modulation design. It takes latest single chip as its digital central processing element. After the measuring signal is converted by modulus, CPU will do some computation and compensation. The instrument can display the reflectivity of device which is measured in rear time. It operates simply and quickly, the indication is direct and accurate. It’s good for quality examination &control in the production scene as well as laboratories. This product has the convenience &quick demarcation way, can meet requirement of different occasion. It is applicable for measuring light reflection on mirror and not mirror parts.
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X-Ray Fluorescence Analyzer
MESA-50
HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
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X-ray Fluorescence Spectrometer
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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Reflective Condenser
Reflective condensing system and focusing accessory for coupling light sources to monochromators. It uses two mirrors to focus to the entrance slit. The reflective system eliminates chromatic aberration, provides maximum spectral range, and does not require refocusing. Accessories like light choppers and filter wheels can also fit inside next to the slit. Versions with rotatable mirror available for up to four source direction.
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Reflective Memory Analyzer
PEAZ-5565
Abaco Systems' PEAZ-5565 Reflective Memory Analyzer is a powerful analytic tool for the industry-leading 5565 Reflective Memory (RFM) product family. By creating a window into network traffic, the analyzer allows you to deep dive into your application code to start solving problems.
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Total Stations
Zoom50 Series
When you need highest performance on all levels even under most challenging conditions, the GeoMax Zoom50 series is the perfect choice for you. The longer measurement range means a wider operational coverage and significant less time lost with switching setups. The new PowerLock protection mechanism prevents use by unauthorized persons and deters theft.
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X-Ray Fluorescence Analyzer
MESA-50K
In order to meet RoHS/ELV and to analyze hazardous elements, HORIBA has offered the X-ray Fluorescence Analyzer XGT-1000WR series. Since 2002, 1000 units have been used all over the world for these applications to meet the critical needs from our customers to analyze the sample without cutting it. In 2012, an intuitive MESA-50 X-ray Fluorescence Analyser was released. It became every popular in a very short amount of time, and in 2013 a new type of MESA-50 with a big sample chamber has been added to the MESA-50 series. It is equipped with the sophisticated LN2-free detector. As/Sb analysis function and Multilayer Film FPM are available as options.
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Reflective Memory
An innovative solution designed to provide highly deterministic data communications for your real time applications such as distributed simulation.
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Diffuse Reflectance Sphere
DRS100
Mobile displays are used in a variety of ambient lighting environments. The evaluation of mobile displays under diffuse illumination conditions is critical to the understanding of display performance in the real world, as mobile displays are used in a wide range of ambient lighting environments. The DRS100 is purpose-made to completely characterize the diffuse reflectance properties of mobile displays, providing uniform hemispherical illumination.
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Calibrated Diffuse Reflectance Standards
Diffuse reflection calibration standards in synthetic ODM and ODMP material
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Total Stations
Zoom40 Series
The Zoom40 manual total station, with its high resolution color and touch display, gives you the flexibility to run X-PAD, Field Genius, SurvCE, or any custom windows CE software.
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Multi-Channel X-Ray Fluorescence Spectrometer
FACTORY LAB MXF-2400
Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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Desktop Fluorescence Microscope
Nanoimager
The complete package for super-resolution microscopy
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Total Organic Carbon
Teledyne LABS’ brand of Total Organic Carbon (TOC) analyzers provide unparalleled accuracy, precision, throughput and robust construction for water samples varying in quality from semiconductor-grade to municipal wastewater. All our pharmaceutical instruments have available 21 CFR Part 11 software tools for your compliance needs, as well as validation documentation, services and training.
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Hybrid Diffuse Reflectance Spectrometer
Poly602™
Solar Light has developed the fastest performing DRS instruments on the market, keeping product research, formulation and clinical testing in mind. HDRSplus™ software is designed specifically for a clinical testing laboratory environment and simplifies all HDRS calculations.
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Total Reduced Sulfur System
ML670
The ML®670 Total Reduced Sulfur (TRS) system provides an accurate and convenient method of measuring Total Reduced Sulfur required for Emission Monitoring. The TRS system uses our specially designed TRS Dilution Sampling System combined with the T-Series® TRS analyzer to provide reliable TRS measurement. This system can be configured as an Open Architecture Design for ease of maintenance.
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Solar Total Pyranometers
SK08 & SK08-E
The Middleton SK08 is an affordable pyranometer for the measurement of global solar irradiance on a plane surface. It meets the international accepted specifications for a good quality pyranometer. The SK08 incorporates a passive thermoelectric sensor. The SK08-E version has an inbuilt signal amplifier.





























