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Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
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High Power LED Photo-color-semi Automatic Selector
Shenzhen Chuangxin Instruments Co., Ltd.
Can divide LED in to several groups by chromatic coordinates, correlated color temperature, dominant wavelength or luminous flux.
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Sematech Analysis and SEMI Standards Analysis
Rocky Mountain Laboratories, Inc.
Rocky Mountain Laboratories, Inc. provides SEMI Standards analyses that conform to the following SEMATECH and SEMI Standards for testing of passivated 316L stainless steel components being considered for installation into a high-purity gas distribution system:SEMASPEC #90120401B-STD (SEM Analysis)SEMASPEC #90120402B-STD (EDS Analysis)SEMASPEC #90120403B-STD (XPS Analysis)SEMASPEC #91060573B-STD (Auger (AES) Analysis)SEMI F60-0306 (based on F60-0301) (XPS Analysis)SEMI F72-1102 (Auger (AES) Analysis)
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Host emulator
E84
Precision Development Consulting Inc
A USB controlled and self-powered emulator for functional testing SEMI E84 implementations. (E84-1000) This was developed because there was nothing like it in the marketplace, and it was clearly needed. This product enables a factory automation engineer to perform E84 functional testing anywhere in the world. Weighing less than 5oz, it is neither a burden, nor a power hog. You will never need to look for an additional power receptacle in the fab. The emulator gives the user full control over the sequence so that any test can be performed. Existing products were large and unwieldy, and provided canned tests that could not be modified to meet the requirements that Fab managers impose on their suppliers.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Sapphire 3D Microscope
WDI-2000
The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
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Easy E23 / E84
Objective Solutions' Easy E23/E84 product line is designed to simplify the integration of SEMI E84 and E23 into Process Equipment and Factory Vehicle systems. The models provide a standard E23/E84 infrared interface to AGV/OHV and process equipment, utilizing Hokuyo transceivers. The Easy E23/E84 units have been developed to work as-is with Hokuyo IR transceivers and as an option, with opti-isolation as required by direct-connect applications. They enable simple integration to process equipment or AGV application programs.
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Hydraulic Universal Testing Machines
UH-X/FX Series
Environmentally and operator friendly state-of-the-art universal testing machine The operability and visibility of the computer-controlled hydraulic servo type universal testing machine (UH-X) and the high-performance universal testing machine (UH-FX), equipped with front opening type hydraulic grips, have been greatly improved by the adoption of a large color touch panel. Equipped with a semi autotuning function that automatically adjusts the control parameters, stress control and strain control (ISO 6892 compliant) can be easily carried out without the need for a preliminary test. The UH-Xh and UH-FXh models feature a new hybrid hydraulic oil source that reduces the required quantity of hydraulic oil, thereby achieving a major reduction in electrical power (about 50 %).
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Wafer Probers
Full Automatic Wafer Prober. Semi Automatic Wafer Prober. High Current Probe Block. 6-inch Manual Prober. 8-inch Manual Prober. 12-inch Manual Prober.
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Full Load Testing For Self Priming Pumps With Pneumatic System For Loading & Unloading Of Pumps
Aarohi Embedded Systems Pvt. Ltd
While manufacturing of self priming pumps testing time is very important to avoid bottleneck. Aarohi developed semi automatic performance testing system with pneumatic system for loading & unloading of pumps which helps to enhance productivity & work efficiency.
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Normalised Site Attenuation
NSA
Normalised Site Attenuation (NSA) is measured in accordance with CISPR 16-1-4 and ANSI C63.4 in semi and fully anechoic environment.
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PI/O Optical Transceiver
GCI's sensors are the preferred solution for E84 optical communications. GCI's full line of PI/O transceivers are fully compliant and are compatible with other manufacturers' sensors that conform to the SEMI Standard E84. Leading 300mm FABs, OEMs, and EFEM manufacturers choose the GCI sensor for its superior reliability and stability.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Brake Test Systems
Giant 8000 Series
Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Indoor Multi-Light source of Measurement System for PV Cell
King Design Industrial Co., Ltd.
The multi-light source measurement system is capable of execute I-V measurements by Real-Time One-Sweep Method (RTOSM), which not only removes the capacity effect but also meets the requirements of SEMI PV57-1214. The measurement process is controlled by designed program, thus the measured I-V curve, Pmax/Isc/Voc/… etc, could be exported automatically.This system is applicable to DSSC/OPV/Perovskite measurements.
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Semi- or Fully-Automatic Laser Repair System
LCD 6400
The Korima Model 6400-L offers an exceptional laser cutting system that exceeds the requirements for flat panel display, large photomask, and color filter repair. Fully automatic and remote controlled, the 6400-L comes with single, dual, or triple wavelength to achieve optimum results in the removal of aluminum, chromium, ITO, and polymide on panels before or after assembly.
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Emulator
GCI E84
The GCI E84 Emulator is the world's leading tester for development, implementation and qualification of products that must comply with the SEMI E84 Standard. It provides the industry-standard automated test plans that are utilized by virtually every 300mm FAB and equipment manufacturer worldwide. GCI testers are the only solutions that guarantee 300mm factory automation interoperability.
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EasyMatrixCode
Automatic detection of the code in the imageDecodes ECC200, ECC000, ECC050, ECC080, ECC100 and ECC140 codesComputes quality indicators as per ANSI/AIM, ISO/IEC 15415, ISO/IEC TR 29158 and SEMI T10-0701 standardsVery fast operationImpressive robustness to noise, blur and distortionSupport of GS1 Data Matrix codesEfficient reading of codes in grid layoutMultiple codes reading
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300W to 1800W - Single Output
HWS Series
*Limited Lifetime Warranty*UL 508 approved*SEMI F47 Compliant (high line AC)*Universal Input (85 - 265VAC)*High Efficiency*Class 1 Div 2 option (/RY suffix)
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10W to 100W - Single Output
DRL Series
*High Efficiency, up to 90%*Low Profile for Building Automation*Class II Double Insulation*ErP Compliant Design*Low No Load Power Consumption*UL 1310 Class 2 Compliant*SEMI F47 Compliant
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Optical Transceiver
RJ-11
The next generation of optical transceiver has arrived with the introduction of GCI's RJ-11 Optical Transceiver. This fully SEMI compliant and Hokuyo compatible unit is the choice of leading 300mm FABs and equipment manufacturers throughout the world to simplify installation and maintenance of their E84 communications.
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Semi-Automatic Contactless Wafer Detector
NCS-200SA
Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
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Customization & Automation
For production and test bench applications, the operation of the measurement needs to be either semi or fully automated. On top of its turnkey solutions, Oros offers a large number of tools to open the programming access. This can be addressed based on all levels of programming expertise achieved by OROS users themselves, local partners or OROS teams.
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Control & Automation Solutions
Produce a consistently high-quality product with a control system that’s easy to integrate into any process, simple or complex. Probat control systems feature clearly designed user interfaces and the ability to store and export production data as needed. Available as both semi- and fully automatic systems, our control systems enhance the performance of our commercial coffee roasters and grinders to yield superior results.
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Create Topographic Profiles from SPM Images
TopoStitch
topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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Compound Semi | MEMS | HDD Manufacturing
KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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600W to 1056W - Single Output
SWS-L Series
*Low Cost*Active Power Factor Correction*Input Transient Protected IEC61000-4*Universal Input (85 - 265VAC)*SEMI F47 Compliant (208VAC)*Medical Approvals (SWS1000L)
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Flexible Current Sensor Probe
CTA
The CTA current sensors convert ac current to an isolated 0-5A current with available ranges from 100A to 10,000A. Because the current sensors are flexible split core, installation is possible without shutting down the LV electrical supply, avoiding expensive down-time costs. Typical applications are retrospective energy monitoring in factories, offices buildings, process control data logging systems, where power, energy and current monitoring is important. Typical applications are factories, offices buildings, ac/dc VFD drives, welding, power conversion and power distribution. For all CTA current sensor models, a NIST/NPL (UKAS) traceable calibration certificate and certificate of conformance is supplied. All CTA sensors use UL94V0 or CSA approved materials. The CTA flexible current sensors are suited to permanent or semi permanent installation. The coil sensor is durable, lightweight, flexible and will easily clip-around a power cable. The 5A output from the CTA current sensor connects direct to installed metering, rotary metering or current transducers.
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Hand-Held, Battery-Operated Multi-Frequency Eddy Current Instrument
US-454A
United Western Technologies Corp
The US-454A is a portable, hand-held, battery-operated multi-frequency eddy current instrument that can be connected to a laptop, PC and motion controllers for use in semi- or fully automatic data collection applications. Two encoder inputs enable position stamping of data. Pulse-on position input is ideal for motion control applications. Ethernet and USB capabilities allow instrument control along with time- and position-stamped data transfer to the client computer. Built from the rugged US-454 architecture, the US-454A offers single- and multi-frequency inspection, frequency mixing capabilities, enhanced signal-to-noise ratio, USB, Ethernet and data storage capability, and unprecedented digital strip chart data collection.
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Film Frame Test Handler
4170-IH
High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
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Trace Moisture Analyzer
PPM1
Model PPM1 is a trace moisture analyzer designed specifically for monitoring moisture levels in dew point and PPM units. This trace moisture analyzer utilizes an electro-chemical (P205) sensor in combination with a proprietary semi permeable diffusion membrane.
