Test Management Suite
See Also: Test Management, Test Management Software, Test Management Applications, Test Management Solution, Test Management Tools
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
EV Power Components End of Line Test Platform
Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
ARINC-429 Module
M4K429RTx
Test Module
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Test & Control Suite
TestMaster
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TestMaster is a reliable tool for test systems, test beds, or production facilities in industrial enviroments and a flexible tool in the hands of the engineer, scientist, or plant operator. Like an advanced operating system, its individual modules provide straightforward solutions to diverse measuring and testing tasks. test management, test verification, sequence control, hardware abstraction, process data management proceess data distribution and visualization.
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Product
PSE Conformance Test Suites
2-Pair 802.3bt / 802.3at PSE's
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*Robust 2-Pair 802.3at (Type-1, 2) / 802.3bt (Type-3) PSE Conformance Testing*Fully Automated Port Sequencing and Statistics*Greater than 95% 802.3at PICS Coverage from 23 Fully Automated Tests*Pop-Up Excel Reports Covering 1 to 24 Ports*Widely Used by PSE System and Silicon Manufacturers World Wide
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IFEC Modem Managers
ADMM
Modem Manager
The Astronics CSC Dual-Modem Modem Manager (ADMM) provides high-flying, high-performance IP SATCOM broadband satellite connectivity. ADMM supports two different aeronautical satellite modems thereby eliminating the need for a second Modem Manager (ModMan) and allowing service providers to select the most appropriate modem and satellite network during flight. ADMM supports different modem configurations as ordering options.
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Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Fixturing Kit
10744A
Test Fixture
The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
Automated Test Execution Suite
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Custom templates provide starting points for different projects including 1-up and Multi-up process models. Several operator interfaces that execute National Instruments TestStand sequences out-of-the box. A collection of reusable templates that make creating and managing your test sequences easier.
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Product
Flying Prober Test System
QTOUCH1404C
Test System
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
CATR Benchtop Antenna Test System
ATS800B
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Optimize Throughput And Cost For MmWave 5G Device Functional Test
Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
Test Management Platform
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Comprehensive suite of test management products fosters global project team collaboration, drives down costs, shortens release cycles, and provides real-time visibility into the status and quality of the software projects. Manage all aspects of software quality; integrate with JIRA and various test tools, all within the enterprise. Manage all aspects of software quality; add test management capabilities right inside JIRA.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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OTP-Based Test System
Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Test Data Management
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Web-access to all tester records and analyticsUUT History/Event ReportRaw data support, including waveformsComplete Serial Number History ReportCharacterize and CorrelateStatistical Process Control (SPC)Failure Paretos
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Strategic Test Management
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Large programmes and projects require a strong test management function to oversee the delivery of the testing phases. Where in-house systems and external vendor's elements of delivery meet, communication and a strong test approach are key. Our test management consultants are the best in the business. With our years of experience, we will drive your test process to succeed.
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Product
Power Manager Analyzer Suite for 802.3at, 802.3bt, & Hybrid PSE's
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Tests 802.3 at/bt PSE’s with Any Combination of 2-Pair and 4-Pair PSE ports up to 90W per port. Automatically assess PSE PM Stability and Capacity Management. Tests PSE’s that grant power with Multi-Event, LLDP, or Both Multi-Event and LLDP. Automatically Adapts to PSE maximum assigned class (MAC) and power demotions on 2-Pair and 4-Pair ports. Tests PSE’s with up to 96 PoE Ports. Emulated PD’s are 802.3 specification compliant including built-in support for multi-event classification, power demotion, and 802.3at/802.3bt LLDP. Highly Informative Reports cover dozens of parameters using Colorful Graphics.
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Product
Software Tester & Test Manager
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With their ability to replicate all types of networks (i.e. Wide Area Networks, the Cloud, over Wireless, Radio and Satellite links etc. ) iTrinegy network emulators provide testers with the ability to test application performance in a realistic simulation of the target network environment.
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Primary Test Manager
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The Primary Test Manager™ (PTM) software supports you during diagnostic testing, condition assessment and data management of medium- and high-voltage assets, such as circuit breakers, rotating machines, grounding systems, instrument and power transformers as well as bushings and on-load tap changers (OLTC).
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PHY Performance Test Suite
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The innovative PHY Performance Test Suite provides comprehensive 10/100/1000Base-T Ethernet interface verification with unique plug’n play automation.
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Product
Regenerative Battery Pack Test System
17040
Test System
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
